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Atomistic modeling of nanowires, small-scale fatigue damage in cast magnesium, and materials for MEMS

Zimmerman, Jonathan A.

Lightweight and miniaturized weapon systems are driving the use of new materials in design such as microscale materials and ultra low-density metallic materials. Reliable design of future weapon components and systems demands a thorough understanding of the deformation modes in these materials that comprise the components and a robust methodology to predict their performance during service or storage. Traditional continuum models of material deformation and failure are not easily extended to these new materials unless microstructural characteristics are included in the formulation. For example, in LIGA Ni and Al-Si thin films, the physical size is on the order of microns, a scale approaching key microstructural features. For a new potential structural material, cast Mg offers a high stiffness-to-weight ratio, but the microstructural heterogeneity at various scales requires a structure-property continuum model. Processes occurring at the nanoscale and microscale develop certain structures that drive material behavior. The objective of the work presented in this report was to understand material characteristics in relation to mechanical properties at the nanoscale and microscale in these promising new material systems. Research was conducted primarily at the University of Colorado at Boulder to employ tightly coupled experimentation and simulation to study damage at various material size scales under monotonic and cyclic loading conditions. Experimental characterization of nano/micro damage will be accomplished by novel techniques such as in-situ environmental scanning electron microscopy (ESEM), 1 MeV transmission electron microscopy (TEM), and atomic force microscopy (AFM). New simulations to support experimental efforts will include modified embedded atom method (MEAM) atomistic simulations at the nanoscale and single crystal micromechanical finite element simulations. This report summarizes the major research and development accomplishments for the LDRD project titled 'Atomistic Modeling of Nanowires, Small-scale Fatigue Damage in Cast Magnesium, and Materials for MEMS'. This project supported a strategic partnership between Sandia National Laboratories and the University of Colorado at Boulder by providing funding for the lead author, Ken Gall, and his students, while he was a member of the University of Colorado faculty.

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TYPE SAND Report YEAR 2006
DOIOSTI

Advanced engineering environment pilot project

Schwegel, Jill S.; Pomplun, Alan R.

The Advanced Engineering Environment (AEE) is a concurrent engineering concept that enables real-time process tooling design and analysis, collaborative process flow development, automated document creation, and full process traceability throughout a product's life cycle. The AEE will enable NNSA's Design and Production Agencies to collaborate through a singular integrated process. Sandia National Laboratories and Parametric Technology Corporation (PTC) are working together on a prototype AEE pilot project to evaluate PTC's product collaboration tools relative to the needs of the NWC. The primary deliverable for the project is a set of validated criteria for defining a complete commercial off-the-shelf (COTS) solution to deploy the AEE across the NWC.

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TYPE SAND Report YEAR 2006
DOIOSTI

Solution-verified reliability analysis and design of bistable MEMS using error estimation and adaptivity

Adams, Brian M.; Wittwer, Jonathan W.; Bichon, Barron J.; Carnes, Brian C.; Copps, Kevin D.; Eldred, Michael S.; Hopkins, Matthew M.; Neckels, David C.; Notz, Patrick N.; Subia, Samuel R.

This report documents the results for an FY06 ASC Algorithms Level 2 milestone combining error estimation and adaptivity, uncertainty quantification, and probabilistic design capabilities applied to the analysis and design of bistable MEMS. Through the use of error estimation and adaptive mesh refinement, solution verification can be performed in an automated and parameter-adaptive manner. The resulting uncertainty analysis and probabilistic design studies are shown to be more accurate, efficient, reliable, and convenient.

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TYPE SAND Report YEAR 2006
DOIOSTI

DAKOTA, a multilevel parellel object-oriented framework for design optimization, parameter estimation, uncertainty quantification, and sensitivity analysis:version 4.0 uers's manual

Swiler, Laura P.; Giunta, Anthony A.; Hart, William E.; Watson, Jean-Paul W.; Eddy, John P.; Griffin, Joshua G.; Hough, Patricia D.; Kolda, Tamara G.; Martinez-Canales, Monica L.; Williams, Pamela J.; Eldred, Michael S.; Brown, Shannon L.; Adams, Brian M.; Dunlavy, Daniel D.; Gay, David M.

The DAKOTA (Design Analysis Kit for Optimization and Terascale Applications) toolkit provides a flexible and extensible interface between simulation codes and iterative analysis methods. DAKOTA contains algorithms for optimization with gradient and nongradient-based methods; uncertainty quantification with sampling, reliability, and stochastic finite element methods; parameter estimation with nonlinear least squares methods; and sensitivity/variance analysis with design of experiments and parameter study methods. These capabilities may be used on their own or as components within advanced strategies such as surrogate-based optimization, mixed integer nonlinear programming, or optimization under uncertainty. By employing object-oriented design to implement abstractions of the key components required for iterative systems analyses, the DAKOTA toolkit provides a flexible and extensible problem-solving environment for design and performance analysis of computational models on high performance computers. This report serves as a user's manual for the DAKOTA software and provides capability overviews and procedures for software execution, as well as a variety of example studies.

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TYPE SAND Report YEAR 2006
DOIOSTI

Noncontact surface thermometry for microsystems: LDRD final report

Serrano, Justin R.; Phinney, Leslie M.

We describe a Laboratory Directed Research and Development (LDRD) effort to develop and apply laser-based thermometry diagnostics for obtaining spatially resolved temperature maps on working microelectromechanical systems (MEMS). The goal of the effort was to cultivate diagnostic approaches that could adequately resolve the extremely fine MEMS device features, required no modifications to MEMS device design, and which did not perturb the delicate operation of these extremely small devices. Two optical diagnostics were used in this study: microscale Raman spectroscopy and microscale thermoreflectance. Both methods use a low-energy, nonperturbing probe laser beam, whose arbitrary wavelength can be selected for a diffraction-limited focus that meets the need for micron-scale spatial resolution. Raman is exploited most frequently, as this technique provides a simple and unambiguous measure of the absolute device temperature for most any MEMS semiconductor or insulator material under steady state operation. Temperatures are obtained from the spectral position and width of readily isolated peaks in the measured Raman spectra with a maximum uncertainty near {+-}10 K and a spatial resolution of about 1 micron. Application of the Raman technique is demonstrated for V-shaped and flexure-style polycrystalline silicon electrothermal actuators, and for a GaN high-electron-mobility transistor. The potential of the Raman technique for simultaneous measurement of temperature and in-plane stress in silicon MEMS is also demonstrated and future Raman-variant diagnostics for ultra spatio-temporal resolution probing are discussed. Microscale thermoreflectance has been developed as a complement for the primary Raman diagnostic. Thermoreflectance exploits the small-but-measurable temperature dependence of surface optical reflectivity for diagnostic purposes. The temperature-dependent reflectance behavior of bulk silicon, SUMMiT-V polycrystalline silicon films and metal surfaces is presented. The results for bulk silicon are applied to silicon-on-insulator (SOI) fabricated actuators, where measured temperatures with a maximum uncertainty near {+-}9 K, and 0.75-micron inplane spatial resolution, are achieved for the reflectance-based measurements. Reflectance-based temperatures are found to be in good agreement with Raman-measured temperatures from the same device.

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TYPE SAND Report YEAR 2006
DOIOSTI

Critical infrastructure systems of systems assessment methodology

Depoy, Jennifer M.; Phelan, James M.; Sholander, Peter E.; Varnado, G.B.; Wyss, Gregory D.; Darby, John; Walter, Andrew W.

Assessing the risk of malevolent attacks against large-scale critical infrastructures requires modifications to existing methodologies that separately consider physical security and cyber security. This research has developed a risk assessment methodology that explicitly accounts for both physical and cyber security, while preserving the traditional security paradigm of detect, delay, and respond. This methodology also accounts for the condition that a facility may be able to recover from or mitigate the impact of a successful attack before serious consequences occur. The methodology uses evidence-based techniques (which are a generalization of probability theory) to evaluate the security posture of the cyber protection systems. Cyber threats are compared against cyber security posture using a category-based approach nested within a path-based analysis to determine the most vulnerable cyber attack path. The methodology summarizes the impact of a blended cyber/physical adversary attack in a conditional risk estimate where the consequence term is scaled by a ''willingness to pay'' avoidance approach.

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TYPE SAND Report YEAR 2006
DOIOSTI

Stable local oscillator microcircuit

Brocato, Robert W.

This report gives a description of the development of a Stable Local Oscillator (StaLO) Microcircuit. The StaLO accepts a 100MHz input signal and produces output signals at 1.2, 3.3, and 3.6 GHz. The circuit is built as a multi-chip module (MCM), since it makes use of integrated circuit technologies in silicon and lithium niobate as well as discrete passive components. The StaLO uses a comb generator followed by surface acoustic wave (SAW) filters. The comb generator creates a set of harmonic components of the 100MHz input signal. The SAW filters are narrow bandpass filters that are used to select the desired component and reject all others. The resulting circuit has very low sideband power levels and low phase noise (both less than -40dBc) that is limited primarily by the phase noise level of the input signal.

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TYPE SAND Report YEAR 2006
DOIOSTI
Results 81701–81800 of 96,771
Results 81701–81800 of 96,771