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Nanoantenna-Enhanced Resonant Detectors for Improved Infrared Detector Performance

Goldflam, Michael; Anderson, Evan M.; Fortune, Torben; Klem, John F.; Hawkins, Samuel D.; Davids, Paul; Campione, Salvatore; Pung, Aaron J.; Webster, Preston; Weiner, Phillip; Finnegan, Patrick S.; Wendt, Joel; Wood, Michael G.; Haines, Chris; Coon, Wesley; Olesberg, Jonathon T.; Shaner, Eric A.; Kadlec, Clark N.; Bays, Nathan R.; Sinclair, Michael B.; Tauke-Pedretti, Anna; Kim, Jin K.; Peters, David

Abstract not provided.

Monolithically fabricated tunable long-wave infrared detectors based on dynamic graphene metasurfaces

Applied Physics Letters

Goldflam, Michael; Ruiz, Isaac; Howell, S.W.; Tauke-Pedretti, Anna; Anderson, Evan M.; Wendt, J.R.; Finnegan, Patrick S.; Hawkins, Samuel D.; Coon, Wesley; Fortune, Torben; Shaner, Eric A.; Kadlec, Clark N.; Olesberg, Jonathon T.; Klem, John F.; Webster, Preston; Sinclair, Michael B.; Kim, Jin K.; Peters, David; Bays, Nathan R.

Here, the design, fabrication, and characterization of an actively tunable long-wave infrared detector, made possible through direct integration of a graphene-enabled metasurface with a conventional type-II superlattice infrared detector, are reported. This structure allows for post-fabrication tuning of the detector spectral response through voltage-induced modification of the carrier density within graphene and, therefore, its plasmonic response. These changes modify the transmittance through the metasurface, which is fabricated monolithically atop the detector, allowing for spectral control of light reaching the detector. Importantly, this structure provides a fabrication-controlled alignment of the metasurface filter to the detector pixel and is entirely solid-state. Using single pixel devices, relative changes in the spectral response exceeding 8% have been realized. These proof-of-concept devices present a path toward solid-state hyperspectral imaging with independent pixel-to-pixel spectral control through a voltage-actuated dynamic response.

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A COLD ATOM INTERFEROMETRY SENSOR PLATFORM BASED ON DIFFRACTIVE OPTICS AND INTEGRATED PHOTONICS

Lee, Jongmin; Mcguinness, Hayden J.E.; Soh, Daniel B.S.; Christensen, Justin; Ding, Roger; Finnegan, Patrick S.; Hoth, Gregory W.; Kindel, William; Little, Bethany J.; Rosenthal, Randy R.; Wendt, Joel R.; Lentine, Anthony L.; Eichenfield, Matt; Gehl, Michael; Kodigala, Ashok; Siddiqui, Aleem; Skogen, Erik J.; Vawter, Gregory A.; Ison, Aaron; Bossert, David; Fuerschbach, Kyle H.; Gillund, Daniel P.; Walker, Charles; De Smet, Dennis; Brashar, Connor L.; Berg, Joseph; Jhaveri, Prabodh M.; Smith, Tony G.; Kemme, Shanalyn A.; Schwindt, Peter; Biedermann, Grant

Abstract not provided.

DEPLOYABLE COLD ATOM INTERFEROMETRY SENSOR PLATFORMS BASED ON DIFFRACTIVE OPTICS AND INTEGRATED PHOTONICS

Lee, Jongmin; Biedermann, Grant; Mcguinness, Hayden J.E.; Soh, Daniel B.S.; Christensen, Justin; Ding, Roger; Finnegan, Patrick S.; Hoth, Gregory A.; Kindel, Will; Little, Bethany J.; Rosenthal, Randy R.; Wendt, Joel R.; Lentine, Anthony L.; Eichenfield, Matt; Gehl, Michael; Kodigala, Ashok; Siddiqui, Aleem; Skogen, Erik J.; Vawter, Gregory A.; Ison, Aaron; Bossert, David; Fuerschbach, Kyle H.; Gillund, Daniel P.; Walker, Charles; De Smet, Dennis; Brashar, Connor L.; Berg, Joseph; Jhaveri, Prabodh M.; Smith, Tony G.; Kemme, Shanalyn A.; Schwindt, Peter

Abstract not provided.

High aspect ratio anisotropic silicon etching for x-ray phase contrast imaging grating fabrication

Materials Science in Semiconductor Processing

Finnegan, Patrick S.; Hollowell, Andrew E.; Arrington, Christian L.; Dagel, Amber L.

Lab based x-ray phase contrast imaging (XPCI) systems have historically focused on medical applications, but there is growing interest in material science applications for non-destructive analysis of low density materials. Extending this imaging technique to higher density materials or larger samples requires higher aspect ratio gratings, to allow the use of a higher energy x-ray source. In this work, we demonstrate the use of anisotropic silicon (Si) etching in potassium hydroxide (KOH), to achieve extremely high aspect ratio gratings. This method has been shown to be effective in fabricating deep, uniform gratings by taking advantage of the etch selectivity of differing crystalline planes of silicon. Our work has demonstrated a method for determining Si crystalline plane directions, specific to (110) Si wafers, enabling high alignment accuracy of the etch mask to these crystalline planes.

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Double sided grating fabrication for high energy X-ray phase contrast imaging

Materials Science in Semiconductor Processing

Hollowell, Andrew E.; Arrington, Christian L.; Resnick, Paul; Volk, Steve; Finnegan, Patrick S.; Musick, Katherine M.; Dagel, Amber L.

State of the art grating fabrication currently limits the maximum source energy that can be used in lab based x-ray phase contrast imaging (XPCI) systems. In order to move to higher source energies, and image high density materials or image through encapsulating barriers, new grating fabrication methods are needed. In this work we have analyzed a new modality for grating fabrication that involves precision alignment of etched gratings on both sides of a substrate, effectively doubling the thickness of the grating. We have achieved a front-to-backside feature alignment accuracy of 0.5 µm demonstrating a methodology that can be applied to any grating fabrication approach extending the attainable aspect ratios allowing higher energy lab based XPCI systems.

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Results 26–50 of 90
Results 26–50 of 90
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