Publications

Long, Joel L.

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Looker, Quinn M.; Porter, John L.; Stahoviak, John W.; Long, Joel L.

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Schollmeier, Marius; Ao, Tommy A.; Field, Ella S.; Galloway, B.R.; Kalita, Patricia K.; Kimmel, Mark W.; Long, Joel L.; Morgan, Dane D.; Rambo, Patrick K.; Schwarz, Jens S.; Seagle, Christopher T.

Existing models for most materials do not describe phase transformations and associated lattice dy- namics (kinetics) under extreme conditions of pressure and temperature. Dynamic x-ray diffraction (DXRD) allows material investigations in situ on an atomic scale due to the correlation between solid-state structures and their associated diffraction patterns. In this LDRD project we have devel- oped a nanosecond laser-compression and picosecond-to-nanosecond x-ray diffraction platform for dynamically-compressed material studies. A new target chamber in the Target Bay in building 983 was commissioned for the ns, kJ Z-Beamlet laser (ZBL) and the 0.1 ns, 250 J Z-Petawatt (ZPW) laser systems, which were used to create 8-16 keV plasma x-ray sources from thin metal foils. The 5 ns, 15 J Chaco laser system was converted to a high-energy laser shock driver to load material samples to GPa stresses. Since laser-to-x-ray energy conversion efficiency above 10 keV is low, we employed polycapillary x-ray lenses for a 100-fold fluence increase compared to a conventional pinhole aperture while simultaneously reducing the background significantly. Polycapillary lenses enabled diffraction measurements up to 16 keV with ZBL as well as diffraction experiments with ZPW. This x-ray diffraction platform supports experiments that are complementary to gas guns and the Z facility due to different strain rates. Ultimately, there is now a foundation to evaluate DXRD techniques and detectors in-house before transferring the technology to Z. This page intentionally left blank.

Kimmel, Mark W.; Colombo, Anthony P.; Long, Joel L.; Looker, Quinn M.; Stahoviak, John W.; Claus, Liam D.; England, Troy D.; Fang, Lu F.; Mitchell, Brandon M.; Montoya, Andrew M.; Robertson, Gideon R.; Sanchez, Marcos O.; Rochau, G.A.; Porter, John L.

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Looker, Quinn M.; Keeler, Gordon A.; Robertson, Gideon R.; Kim, Jin K.; Long, Joel L.; Sanchez, Marcos O.; Trotter, Douglas C.; Porter, John L.; Rochau, G.A.

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Lewis, Sean M.; Geissel, Matthias G.; Kellogg, Jeffrey W.; Kimmel, Mark W.; Long, Joel L.; Shores, Jonathon S.; Smith, Ian C.; Speas, Christopher S.; Riley, Nathan R.; Bengtson, Roger D.; Ditmire, Todd D.; Stahoviak, John W.

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Robertson, Gideon R.; Claus, Liam D.; Kay, Randolph R.; Keeler, Gordon A.; Kim, Jin K.; Looker, Quinn M.; Long, Joel L.; Sanchez, Marcos O.; Trotter, Douglas C.; Porter, John L.; Rochau, G.A.

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Claus, Liam D.; Robertson, Gideon R.; Sanchez, Marcos O.; Fang, Lu F.; Porter, John L.; Kay, Randolph R.; Kimmel, Mark W.; Long, Joel L.; Trotter, Douglas C.

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Hahn, Kelly D.; Schmit, Paul S.; Sefkow, Adam B.; Sinars, Daniel S.; Long, Joel L.; Ruiz, Carlos L.; Chandler, Gordon A.; Jones, Brent M.; Lash, Joel S.; Knapp, Patrick K.; McPherson, Leroy A.; Rochau, G.A.

Abstract not provided.