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Wafer-Scale TaOx Device Variability and Implications for Neuromorphic Computing Applications

IEEE International Reliability Physics Symposium Proceedings

Bennett, Christopher; Garland, Diana; Jacobs-Gedrim, Robin B.; Agarwal, Sapan; Marinella, Matthew

Scaling arrays of non-volatile memory devices from academic demonstrations to reliable, manufacturable systems requires a better understanding of variability at array and wafer-scale levels. CrossSim models the accuracy of neural networks implemented on an analog resistive memory accelerator using the cycle-to-cycle variability of a single device. In this work, we extend this modeling tool to account for device-to-device variation in a realistic way, and evaluate the impact of this reliability issue in the context of neuromorphic online learning tasks.

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Wafer-Scale TaOx Device Variability and Implications for Neuromorphic Computing Applications

IEEE International Reliability Physics Symposium Proceedings

Bennett, Christopher; Garland, Diana; Jacobs-Gedrim, Robin B.; Agarwal, Sapan; Marinella, Matthew

Scaling arrays of non-volatile memory devices from academic demonstrations to reliable, manufacturable systems requires a better understanding of variability at array and wafer-scale levels. CrossSim models the accuracy of neural networks implemented on an analog resistive memory accelerator using the cycle-to-cycle variability of a single device. In this work, we extend this modeling tool to account for device-to-device variation in a realistic way, and evaluate the impact of this reliability issue in the context of neuromorphic online learning tasks.

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Designing and modeling analog neural network training accelerators

2019 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2019

Agarwal, Sapan; Jacobs-Gedrim, Robin B.; Bennett, Christopher; Hsia, Alexander W.; Adee, Shane M.; Hughart, David R.; Fuller, Elliot J.; Li, Yiyang; Talin, Albert A.; Marinella, Matthew

Analog crossbars have the potential to reduce the energy and latency required to train a neural network by three orders of magnitude when compared to an optimized digital ASIC. The crossbar simulator, CrossSim, can be used to model device nonidealities and determine what device properties are needed to create an accurate neural network accelerator. Experimentally measured device statistics are used to simulate neural network training accuracy and compare different classes of devices including TaOx ReRAM, Lir-Co-Oz devices, and conventional floating gate SONOS memories. A technique called 'Periodic Carry' can overcomes device nonidealities by using a positional number system while maintaining the benefit of parallel analog matrix operations.

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Sparse Data Acquisition on Emerging Memory Architectures

IEEE Access

Quach, Tu T.; Agarwal, Sapan; James, Conrad D.; Marinella, Matthew; Aimone, James B.

Emerging memory devices, such as resistive crossbars, have the capacity to store large amounts of data in a single array. Acquiring the data stored in large-capacity crossbars in a sequential fashion can become a bottleneck. We present practical methods, based on sparse sampling, to quickly acquire sparse data stored on emerging memory devices that support the basic summation kernel, reducing the acquisition time from linear to sub-linear. The experimental results show that at least an order of magnitude improvement in acquisition time can be achieved when the data are sparse. In addition, we show that the energy cost associated with our approach is competitive to that of the sequential method.

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Contrasting Advantages of Learning With Random Weights and Backpropagation in Non-Volatile Memory Neural Networks

IEEE Access

Bennett, Christopher; Parmar, Vivek; Calvet, Laurie E.; Klein, Jacques O.; Suri, Manan; Marinella, Matthew; Querlioz, Damien

Recently, a Cambrian explosion of a novel, non-volatile memory (NVM) devices known as memristive devices have inspired effort in building hardware neural networks that learn like the brain. Early experimental prototypes built simple perceptrons from nanosynapses, and recently, fully-connected multi-layer perceptron (MLP) learning systems have been realized. However, while backpropagating learning systems pair well with high-precision computer memories and achieve state-of-the-art performances, this typically comes with a massive energy budget. For future Internet of Things/peripheral use cases, system energy footprint will be a major constraint, and emerging NVM devices may fill the gap by sacrificing high bit precision for lower energy. In this paper, we contrast the well-known MLP approach with the extreme learning machine (ELM) or NoProp approach, which uses a large layer of random weights to improve the separability of high-dimensional tasks, and is usually considered inferior in a software context. However, we find that when taking the device non-linearity into account, NoProp manages to equal hardware MLP system in terms of accuracy. While also using a sign-based adaptation of the delta rule for energy-savings, we find that NoProp can learn effectively with four to six 'bits' of device analog capacity, while MLP requires eight-bit capacity with the same rule. This may allow the requirements for memristive devices to be relaxed in the context of online learning. By comparing the energy footprint of these systems for several candidate nanosynapses and realistic peripherals, we confirm that memristive NoProp systems save energy compared with MLP systems. Lastly, we show that ELM/NoProp systems can achieve better generalization abilities than nanosynaptic MLP systems when paired with pre-processing layers (which do not require backpropagated error). Collectively, these advantages make such systems worthy of consideration in future accelerators or embedded hardware.

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Parallel programming of an ionic floating-gate memory array for scalable neuromorphic computing

Science

Fuller, Elliot J.; Keene, Scott T.; Melianas, Armantas; Wang, Zhongrui; Asapu, Shiva; Agarwal, Sapan; Li, Yiyang; Tuchman, Yaakov; James, Conrad D.; Marinella, Matthew; Yang, J.J.; Salleo, Alberto; Talin, Albert A.

Neuromorphic computers could overcome efficiency bottlenecks inherent to conventional computing through parallel programming and readout of artificial neural network weights in a crossbar memory array. However, selective and linear weight updates and <10-nanoampere read currents are required for learning that surpasses conventional computing efficiency. We introduce an ionic floating-gate memory array based on a polymer redox transistor connected to a conductive-bridge memory (CBM). Selective and linear programming of a redox transistor array is executed in parallel by overcoming the bridging threshold voltage of the CBMs. Synaptic weight readout with currents <10 nanoamperes is achieved by diluting the conductive polymer with an insulator to decrease the conductance. The redox transistors endure >1 billion write-read operations and support >1-megahertz write-read frequencies.

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Semi-supervised learning and inference in domain-wall magnetic tunnel junction (DW-MTJ) neural networks

Proceedings of SPIE - The International Society for Optical Engineering

Bennett, Christopher; Hassan, Naimul; Hu, Xuan; Incornvia, Jean A.C.; Friedman, Joseph S.; Marinella, Matthew

Advances in machine intelligence have sparked interest in hardware accelerators to implement these algorithms, yet embedded electronics have stringent power, area budgets, and speed requirements that may limit non- volatile memory (NVM) integration. In this context, the development of fast nanomagnetic neural networks using minimal training data is attractive. Here, we extend an inference-only proposal using the intrinsic physics of domain-wall MTJ (DW-MTJ) neurons for online learning to implement fully unsupervised pattern recognition operation, using winner-take-all networks that contain either random or plastic synapses (weights). Meanwhile, a read-out layer trains in a supervised fashion. We find our proposed design can approach state-of-the-art success on the task relative to competing memristive neural network proposals, while eliminating much of the area and energy overhead that would typically be required to build the neuronal layers with CMOS devices.

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Failure Thresholds in CBRAM Due to Total Ionizing Dose and Displacement Damage Effects

IEEE Transactions on Nuclear Science

Taggart, J.L.; Jacobs-Gedrim, Robin B.; Mclain, Michael; Barnaby, H.J.; Bielejec, Edward S.; Hardy, W.; Marinella, Matthew; Kozicki, M.N.; Holbert, K.

With the growing interest to explore Jupiter's moons, technologies with +10 Mrad(Si) tolerance are now needed, to survive the Jovian environment. Conductive-bridging random access memory (CBRAM) is a nonvolatile memory that has shown a high tolerance to total ionizing dose (TID). However, it is not well understood how CBRAM behaves in an energetic ion environment where displacement damage (DD) effects may also be an issue. In this paper, the response of CBRAM to 100-keV Li, 1-MeV Ta, and 200-keV Si ion irradiations is examined. Ion bombardment was performed with increasing fluence steps until the CBRAM devices failed to hold their programed state. The TID and DD dose (DDD) at the fluence of failure were calculated and compared against tested ion species. Results indicate that failures are more highly correlated with TID than DDD. DC cycling tests were performed during 100-keV Li irradiations and evidence was found that the mobile Ag ion supply diminished with increasing fluence. The cycling results, in addition to prior 14-MeV neutron work, suggest that DD may play a role in the eventual failure of a CBRAM device in a combined radiation environment.

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Training a Neural Network on Analog TaOx ReRAM Devices Irradiated With Heavy Ions: Effects on Classification Accuracy Demonstrated With CrossSim

IEEE Transactions on Nuclear Science

Jacobs-Gedrim, Robin B.; Hughart, David R.; Agarwal, Sapan; Vizkelethy, Gyorgy; Bielejec, Edward S.; Vaandrager, Bastiaan L.; Swanson, Scot E.; Knisely, Katherine; Taggart, Jennifer L.; Barnaby, Hugh L.; Marinella, Matthew

The image classification accuracy of a TaOx ReRAM-based neuromorphic computing accelerator is evaluated after intentionally inducing a displacement damage up to a fluence of 1014 2.5-MeV Si ions/cm2 on the analog devices that are used to store weights. Results are consistent with a radiation-induced oxygen vacancy production mechanism. When the device is in the high-resistance state during heavy ion radiation, the device resistance, linearity, and accuracy after training are only affected by high fluence levels. Here, the findings in this paper are in accordance with the results of previous studies on TaOx-based digital resistive random access memory. When the device is in the low-resistance state during irradiation, no resistance change was detected, but devices with a 4-kΩ inline resistor did show a reduction in accuracy after training at 1014 2.5-MeV Si ions/cm2. This indicates that changes in resistance can only be somewhat correlated with changes to devices’ analog properties. This paper demonstrates that TaOx devices are radiation tolerant not only for high radiation environment digital memory applications but also when operated in an analog mode suitable for neuromorphic computation and training on new data sets.

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Sparse Data Acquisition on Emerging Memory Architectures

IEEE Access

Quach, Tu T.; Agarwal, Sapan; James, Conrad D.; Marinella, Matthew; Aimone, James B.

Emerging memory devices, such as resistive crossbars, have the capacity to store large amounts of data in a single array. Acquiring the data stored in large-capacity crossbars in a sequential fashion can become a bottleneck. We present practical methods, based on sparse sampling, to quickly acquire sparse data stored on emerging memory devices that support the basic summation kernel, reducing the acquisition time from linear to sub-linear. The experimental results show that at least an order of magnitude improvement in acquisition time can be achieved when the data are sparse. Finally, in addition, we show that the energy cost associated with our approach is competitive to that of the sequential method.

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Electroforming-Free TaOx Memristors using Focused Ion Beam Irradiations

Applied Physics. A, Materials Science and Processing

Bielejec, Edward S.; Pacheco, Jose L.; Perry, Daniel L.; Marinella, Matthew; Hughart, David R.

In this study, we demonstrate creation of electroforming-free TaOx memristive devices using focused ion beam irradiations to locally define conductive filaments in TaOx films. Electrical characterization shows that these irradiations directly create fully functional memristors without the need for electroforming. Finally, ion beam forming of conductive filaments combined with state-of-the-art nano-patterning presents a CMOS compatible approach to wafer level fabrication of fully formed and operational memristors.

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Post Moore's Law Report

Debenedictis, Erik; Lentine, Anthony L.; Marinella, Matthew; Williams, R.S.; Conte, Thomas M.; Gargini, Paolo

Moore's law is driving an information revolution, worldwide economic growth, and is a tool for national security. This report explains how dire proclamations that "Moore's law is ending" are due to a natural redefinition of the phrase, but computing remains positioned to both drive economic growth and support national security. The computer industry used to be led by the semiconductor companies that made ever faster microprocessors with larger memories. However, control is shifting to new ways of designing computers, notably based on 3D chips and new analog and digital architectures. While artificial intelligence and quantum computing research have become mainstream pursuits, these latter two areas seem destined split off from Moore's law rather than become a part of it. We include a discussion of recent developments and opportunities in optical communications and computing.

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Unified computational model of transport in metal-insulating oxide-metal systems

Applied Physics A: Materials Science and Processing

Tierney, Brian D.; Hjalmarson, Harold P.; Jacobs-Gedrim, Robin B.; Agarwal, Sapan; James, Conrad D.; Marinella, Matthew

A unified physics-based model of electron transport in metal-insulator-metal (MIM) systems is presented. In this model, transport through metal-oxide interfaces occurs by electron tunneling between the metal electrodes and oxide defect states. Transport in the oxide bulk is dominated by hopping, modeled as a series of tunneling events that alter the electron occupancy of defect states. Electron transport in the oxide conduction band is treated by the drift–diffusion formalism and defect chemistry reactions link all the various transport mechanisms. It is shown that the current-limiting effect of the interface band offsets is a function of the defect vacancy concentration. These results provide insight into the underlying physical mechanisms of leakage currents in oxide-based capacitors and steady-state electron transport in resistive random access memory (ReRAM) MIM devices. Finally, an explanation of ReRAM bipolar switching behavior based on these results is proposed.

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DOE Big Idea Summit III: Solving the Information Technology Challenge Beyond Moore's Law: A New Path to Scaling

Mccormick, Frederick B.; Shalf, John; Mitchell, Alan; Lentine, Anthony L.; Marinella, Matthew

This report captures the initial conclusions of the DOE seven National Lab team collaborating on the “Solving the Information Technology Energy Challenge Beyond Moore’s Law” initiative from the DOE Big Idea Summit III held in April of 2016. The seven Labs held a workshop in Albuquerque, NM in late July 2016 and gathered 40 researchers into 5 working groups: 4 groups spanning the levels of the co-design framework shown below, and a 5th working group focused on extending and advancing manufacturing approaches and coupling their constraints to all of the framework levels. These working groups have identified unique capabilities within the Labs to support the key challenges of this Beyond Moore’s Law Computing (BMC) vision, as well as example first steps and potential roadmaps for technology development.

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Solving the Information Technology Challenge Beyond Moore's Law (DOE Big Idea National Lab Meeting Report)

Mccormick, Frederick B.; Marinella, Matthew; Mitchell, Alan; Hein, Olle; James, Conrad D.; Mamaluy, Denis; Taylor, Toni; Gokhale, Maya; Shalf, John; Culhane, Candace

This report provides an overview of a workshop held on July 27-28, 2016 at Sandia National Laboratories in Albuquerque to itemize the DOE laboratory capabilties and provide a high level organization of those capabilties into a full evaluation framework for new computing paradigms that spans from fundamental breakthroughs in materials and devices to full system architectures and software environments.

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Piecewise empirical model (PEM) of resistive memory for pulsed analog and neuromorphic applications

Journal of Computational Electronics

Marinella, Matthew; Niroula, John; Agarwal, Sapan; Jacobs-Gedrim, Robin B.; Hughart, David R.; Hsia, Alexander W.; James, Conrad D.

With the end of Dennard scaling and the ever-increasing need for more efficient, faster computation, resistive switching devices (ReRAM), often referred to as memristors, are a promising candidate for next generation computer hardware. These devices show particular promise for use in an analog neuromorphic computing accelerator as they can be tuned to multiple states and be updated like the weights in neuromorphic algorithms. Modeling a ReRAM-based neuromorphic computing accelerator requires a compact model capable of correctly simulating the small weight update behavior associated with neuromorphic training. These small updates have a nonlinear dependence on the initial state, which has a significant impact on neural network training. Consequently, we propose the piecewise empirical model (PEM), an empirically derived general purpose compact model that can accurately capture the nonlinearity of an arbitrary two-terminal device to match pulse measurements important for neuromorphic computing applications. By defining the state of the device to be proportional to its current, the model parameters can be extracted from a series of voltages pulses that mimic the behavior of a device in an analog neuromorphic computing accelerator. This allows for a general, accurate, and intuitive compact circuit model that is applicable to different resistance-switching device technologies. In this work, we explain the details of the model, implement the model in the circuit simulator Xyce, and give an example of its usage to model a specific Ta / TaO x device.

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Impact of linearity and write noise of analog resistive memory devices in a neural algorithm accelerator

2017 IEEE International Conference on Rebooting Computing, ICRC 2017 - Proceedings

Jacobs-Gedrim, Robin B.; Agarwal, Sapan; Knisely, Katherine; Stevens, Jim E.; Van Heukelom, Michael; Hughart, David R.; James, Conrad D.; Marinella, Matthew

Resistive memory (ReRAM) shows promise for use as an analog synapse element in energy-efficient neural network algorithm accelerators. A particularly important application is the training of neural networks, as this is the most computationally-intensive procedure in using a neural algorithm. However, training a network with analog ReRAM synapses can significantly reduce the accuracy at the algorithm level. In order to assess this degradation, analog properties of ReRAM devices were measured and hand-written digit recognition accuracy was modeled for the training using backpropagation. Bipolar filamentary devices utilizing three material systems were measured and compared: one oxygen vacancy system, Ta-TaOx, and two conducting metallization systems, Cu-SiO2, and Ag/chalcogenide. Analog properties and conductance ranges of the devices are optimized by measuring the response to varying voltage pulse characteristics. Key analog device properties which degrade the accuracy are update linearity and write noise. Write noise may improve as a function of device manufacturing maturity, but write nonlinearity appears relatively consistent among the different device material systems and is found to be the most significant factor affecting accuracy. This suggests that new materials and/or fundamentally different resistive switching mechanisms may be required to improve device linearity and achieve higher algorithm training accuracy.

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Evaluation of a 'Field Cage' for Electric Field Control in GaN-Based HEMTs That Extends the Scalability of Breakdown into the kV Regime

IEEE Transactions on Electron Devices

Tierney, Brian D.; Dickerson, Jeramy; Reza, Shahed; Kaplar, Robert; Baca, Albert G.; Marinella, Matthew

A distributed impedance 'field cage' structure is proposed and evaluated for electric field control in GaN-based, lateral high electron mobility transistors operating as kilovolt-range power devices. In this structure, a resistive voltage divider is used to control the electric field throughout the active region. The structure complements earlier proposals utilizing floating field plates that did not employ resistively connected elements. Transient results, not previously reported for field plate schemes using either floating or resistively connected field plates, are presented for ramps of dVds/dt = 100 V/ns. For both dc and transient results, the voltage between the gate and drain is laterally distributed, ensuring that the electric field profile between the gate and drain remains below the critical breakdown field as the source-to-drain voltage is increased. Our scheme indicates promise for achieving the breakdown voltage scalability to a few kilovolts.

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Achieving ideal accuracies in analog neuromorphic computing using periodic carry

Digest of Technical Papers - Symposium on VLSI Technology

Agarwal, Sapan; Jacobs-Gedrim, Robin B.; Hsia, Alexander W.; Hughart, David R.; Fuller, Elliot J.; Talin, Albert A.; James, Conrad D.; Plimpton, Steven J.; Marinella, Matthew

Analog resistive memories promise to reduce the energy of neural networks by orders of magnitude. However, the write variability and write nonlinearity of current devices prevent neural networks from training to high accuracy. We present a novel periodic carry method that uses a positional number system to overcome this while maintaining the benefit of parallel analog matrix operations. We demonstrate how noisy, nonlinear TaOx devices that could only train to 80% accuracy on MNIST, can now reach 97% accuracy, only 1% away from an ideal numeric accuracy of 98%. On a file type dataset, the TaOx devices achieve ideal numeric accuracy. In addition, low noise, linear Li1-xCoO2 devices train to ideal numeric accuracies using periodic carry on both datasets.

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Achieving ideal accuracies in analog neuromorphic computing using periodic carry

Digest of Technical Papers - Symposium on VLSI Technology

Agarwal, Sapan; Jacobs-Gedrim, Robin B.; Hsia, Alexander W.; Hughart, David R.; Fuller, Elliot J.; Talin, Albert A.; James, Conrad D.; Plimpton, Steven J.; Marinella, Matthew

Analog resistive memories promise to reduce the energy of neural networks by orders of magnitude. However, the write variability and write nonlinearity of current devices prevent neural networks from training to high accuracy. We present a novel periodic carry method that uses a positional number system to overcome this while maintaining the benefit of parallel analog matrix operations. We demonstrate how noisy, nonlinear TaOx devices that could only train to 80% accuracy on MNIST, can now reach 97% accuracy, only 1% away from an ideal numeric accuracy of 98%. On a file type dataset, the TaOx devices achieve ideal numeric accuracy. In addition, low noise, linear Li1-xCoO2 devices train to ideal numeric accuracies using periodic carry on both datasets.

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Results 101–150 of 376
Results 101–150 of 376