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Review of Scientific Instruments
Gomez, Matthew R.; Rochau, G.A.; Bailey, James E.; Dunham, Gregory S.; Kernaghan, M.D.; Gard, P.; Robertson, Grafton K.; Owen, A.C.; Argo, J.W.; Nielsen, D.S.; Lake, Patrick W.
The pinned optically aligned diagnostic dock (PODD) is a multi-configuration diagnostic platform designed to measure x-ray emission on the Z facility. The PODD houses two plasma emission acquisition (PEA) systems, which are aligned with a set of precision machined pins. The PEA systems are modular, allowing a single diagnostic housing to support several different diagnostics. The PEA configurations fielded to date include both time-resolved and time-integrated, 1D spatially resolving, elliptical crystal spectrometers, and time-integrated, 1D spatially resolving, convex crystal spectrometers. Additional proposed configurations include time-resolved, monochromatic mirrored pinhole imagers and arrays of filtered x-ray diodes, diamond photo-conducting diode detectors, and bolometers. The versatility of the PODD system will allow the diagnostic configuration of the Z facility to be changed without significantly adding to the turn-around time of the machine. Additionally, the PODD has been designed to allow instrument setup to be completed entirely off-line, leaving only a refined alignment process to be performed just prior to a shot, which is a significant improvement over the instrument the PODD replaces. Example data collected with the PODD are presented. © 2012 American Institute of Physics.
Cuneo, M.E.; Jones, Michael J.; Edens, Aaron E.; Lopez, Mike R.; McBride, Ryan D.; Rochau, G.A.; Jones, Brent M.; Ampleford, David A.; Sinars, Daniel S.; Bailey, James E.; Stygar, William A.; Savage, Mark E.
Ampleford, David A.; Hansen, Stephanie B.; Jennings, Christopher A.; Jones, Brent M.; Rochau, G.A.; Bailey, James E.; Laspe, Amy R.; Savage, Mark E.; Cuneo, M.E.
Ao, Tommy A.; Bailey, James E.; Hansen, Stephanie B.; Desjarlais, Michael P.; Geissel, Matthias G.; Smith, Ian C.; Sinars, Daniel S.; Lemke, Raymond W.
Bailey, James E.; Ao, Tommy A.; Harding, Eric H.; Hansen, Stephanie B.; Desjarlais, Michael P.; Lemke, Raymond W.; Rochau, G.A.; Reneker, Joseph R.; Romero, Dustin H.
Loisel, Guillaume P.; Rochau, Gary E.; Bailey, James E.; Hansen, Stephanie B.; Ball, Christopher R.; Dunham, Gregory S.; Nagayama, Taisuke N.
Bailey, James E.
Z-Pinch Plasmas: 5th Special Issue of the iEEE Transactions on Plasma Science
Coverdale, Christine A.; Bailey, James E.; Rochau, G.A.; Jones, Brent M.; Savage, Mark E.
Ao, Tommy A.; Harding, Eric H.; Bailey, James E.; Sinars, Daniel S.; Hansen, Stephanie B.; Desjarlais, Michael P.; Lemke, Raymond W.; Geissel, Matthias G.; Smith, Ian C.
Gomez, Matthew R.; Lake, Patrick W.; Rochau, G.A.; Bailey, James E.; Dunham, Gregory S.; Kernaghan, M.D.; Robertson, Grafton K.; Owen, Albert C.; Argo, J.W.; Nielsen, D.S.
Rochau, G.A.; Bailey, James E.; Ao, Tommy A.; Harding, Eric H.
Ao, Tommy A.; Bailey, James E.; Hansen, Stephanie B.; Desjarlais, Michael P.; Sinars, Daniel S.; Smith, Ian C.
Proposed for publication in 5th Special Issue of the IEEE Transactions on Plasma Science Z-Pinch Plasmas.
Cuneo, M.E.; Mazarakis, Michael G.; Lamppa, Derek C.; Kaye, Ronald J.; Nakhleh, Charles N.; Bailey, James E.; Hansen, Stephanie B.; McBride, Ryan D.; Herrmann, Mark H.; Lopez, A.; Peterson, Kyle J.; Ampleford, David A.; Jones, Michael J.; Savage, Mark E.; Jennings, Christopher A.; Martin, Matthew; Slutz, Stephen A.; Lemke, Raymond W.; Christenson, Peggy J.; Sweeney, Mary A.; Jones, Brent M.; Yu, Edmund Y.; McPherson, Leroy A.; Harding, Eric H.; Knapp, Patrick K.; Gomez, Matthew R.; Awe, Thomas J.; Stygar, William A.; Leeper, Ramon J.; Ruiz, Carlos L.; Chandler, Gordon A.; Mckenney, John M.; Owen, Albert C.; McKee, George R.; Matzen, M.K.; Leifeste, Gordon T.; Atherton, B.W.; Vesey, Roger A.; Smith, Ian C.; Geissel, Matthias G.; Rambo, Patrick K.; Sinars, Daniel S.; Sefkow, Adam B.; Rovang, Dean C.; Rochau, G.A.
Bailey, James E.
Bailey, James E.; Loisel, Guillaume P.; Rochau, G.A.; Dunham, Gregory S.; Ball, Christopher R.
Ao, Tommy A.; Harding, Eric H.; Bailey, James E.; Sinars, Daniel S.; Desjarlais, Michael P.; Hansen, Stephanie B.; Lemke, Raymond W.; Smith, Ian C.
Bailey, James E.
Cuneo, M.E.; Jones, Michael J.; Edens, Aaron E.; Lopez, Mike R.; McBride, Ryan D.; Rochau, G.A.; Jones, Brent M.; Ampleford, David A.; Sinars, Daniel S.; Bailey, James E.; Stygar, William A.; Savage, Mark E.
Ao, Tommy A.; Bailey, James E.; Hansen, Stephanie B.; Desjarlais, Michael P.; Mix, L.P.; Smith, Ian C.; Sinars, Daniel S.
Bailey, James E.
Cuneo, M.E.; Savage, Mark E.; Jones, Michael J.; Edens, Aaron E.; Lopez, Mike R.; Gomez, Matthew R.; McBride, Ryan D.; Rochau, G.A.; Jones, Brent M.; Ampleford, David A.; Sinars, Daniel S.; Bailey, James E.; Stygar, William A.
Cuneo, M.E.; Jones, Michael J.; Edens, Aaron E.; Lopez, Mike R.; McBride, Ryan D.; Rochau, G.A.; Jones, Brent M.; Ampleford, David A.; Sinars, Daniel S.; Bailey, James E.; Stygar, William A.; Savage, Mark E.
Ao, Tommy A.; Wenger, D.F.; Bailey, James E.; Desjarlais, Michael P.; Hansen, Stephanie B.; Knudson, Marcus D.; Lemke, Raymond W.; Mix, L.P.; Sinars, Daniel S.; Smith, Ian C.
Rochau, G.A.; Coverdale, Christine A.; Hansen, Stephanie B.; Yu, Edmund Y.; Ampleford, David A.; Lake, Patrick W.; Dunham, Gregory S.; Cuneo, M.E.; Jones, Brent M.; Jennings, Christopher A.; Bailey, James E.
Hansen, Stephanie B.; Desjarlais, Michael P.; Bailey, James E.; Harding, Eric H.; Ao, Tommy A.
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