Publications

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A system is presented that is capable of measuring subnanosecond reverse recovery times of diodes in wide-bandgap materials over a wide range of forward biases (0 - 1 A) and reverse voltages (0 - 10 kV). The system utilizes the step recovery technique and comprises a cable pulser based on a silicon (Si) Photoconductive Semiconductor Switch (PCSS) triggered with an Ultrashort Pulse Laser, a pulse charging circuit, a diode biasing circuit, and resistive and capacitive voltage monitors. The PCSS-based cable pulser transmits a 130 ps rise time pulse down a transmission line to a capacitively coupled diode, which acts as the terminating element of the transmission line. The temporal nature of the pulse reflected by the diode provides the reverse recovery characteristics of the diode, measured with a high bandwidth capacitive probe integrated into the cable pulser. This system was used to measure the reverse recovery times (including the creation and charging of the depletion region) for two Avogy gallium nitride diodes; the initial reverse recovery time was found to be 4 ns and varied minimally over reverse biases of 50-100 V and forward current of 1-100 mA.

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This report describes the development of ultra-short pulse laser (USPL) induced terahertz (THz) radiation to image electronic plasmas during electrical breakdown. The technique uses three pulses from two USPLs to (1) trigger the breakdown, (2) create a 2 picosecond (ps, 10 -12 s), THz pulse to illuminate the breakdown, and (3) record the THz image of the breakdown. During this three year internal research program, sub-picosecond jitter timing for the lasers, THz generation, high bandwidth (BW) diagnostics, and THz image acquisition was demonstrated. High intensity THz radiation was optically-induced in a pulse-charged gallium arsenide photoconductive switch. The radiation was collected, transported, concentrated, and co-propagated through an electro-optic crystal with an 800 nm USPL pulse whose polarization was rotated due to the spatially varying electric field of the THz image. The polarization modulated USPL pulse was then passed through a polarizer and the resulting spatially varying intensity was detected in a high resolution digital camera. Single shot images had a signal to noise of %7E3:1. Signal to noise was improved to %7E30:1 with several experimental techniques and by averaging the THz images from %7E4000 laser pulses internally and externally with the camera and the acquisition system (40 pulses per readout). THz shadows of metallic films and objects were also recorded with this system to demonstrate free-carrier absorption of the THz radiation and improve image contrast and resolution. These 2 ps THz pulses were created and resolved with 100 femtosecond (fs, 10 -15 s) long USPL pulses. Thus this technology has the capability to time-resolve extremely fast repetitive or single shot phenomena, such as those that occur during the initiation of electrical breakdown. The goal of imaging electrical breakdown was not reached during this three year project. However, plans to achieve this goal as part of a follow-on project are described in this document. Further modifications to improve the THz image contrast and resolution are proposed, and after they are made, images of photo-induced carriers in gallium arsenide and silicon will be acquired to evaluate image sensitivity versus carrier density. Finally electrical breakdown will be induced with the first USPL pulse, illuminated with THz radiation produced with the second USPL pulse and recorded with the third USPL pulse.

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This report describes measurements of the time delay between the onset of corona and complete electrical breakdown between a point and a plane in dry air near atmospheric pressure as a function of the distance between the point and the plane. The large variation in these time delays is representative of the stochastic nature of electrical breakdown and the many possible phenomena that occur between the initiation and completion of electrical breakdown, including initiation without complete electrical breakdown. The purpose of this work is to provide data which will be accurately modeled when a model contains the appropriate mechanisms with the proper priorities to describe this fundamental electrical breakdown configuration. The acquisition of these measurements completes a level three milestone for the WSEAT program which sponsors this research. Also included in this report is a description of our plans to “automate” the experimental procedure, protect the high sensitivity fast-gated camera, and add diagnostics and new experimental techniques to the test facility. This will provide measurements of the time delay distributions with improved statistics and additional experimental information about the processes that occur during electrical breakdown.

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In a submerged environment, power cables may experience accelerated insulation degradation due to water-related aging mechanisms. Direct contact with water or moisture intrusion in the cable insulation system has been identified in the literature as a significant aging stressor that can affect performance and lifetime of electric cables. Progressive reduction of the dielectric strength is commonly a result of water treeing which involves the development of permanent hydrophilic structures in the insulation coinciding with the absorption of water into the cable. Water treeing is a phenomenon in which dendritic microvoids are formed in electric cable insulation due to electrochemical reactions, electromechanical forces, and diffusion of contaminants over time. These reactions are caused by the combined effects of water presence and high electrical stresses in the material. Water tree growth follows a tree-like branching pattern, increasing in volume and length over time. Although these cables can be “dried out,” water tree degradation, specifically the growth of hydrophilic regions, is believed to be permanent and typically worsens over time. Based on established research, water treeing or water induced damage can occur in a variety of electric cables including XLPE, TR-XLPE and other insulating materials, such as EPR and butyl rubber. Once water trees or water induced damage form, the dielectric strength of an insulation material will decrease gradually with time as the water trees grow in length, which could eventually result in failure of the insulating material. Under wet conditions or in submerged environments, several environmental and operational parameters can influence water tree initiation and affect water tree growth. These parameters include voltage cycling, field frequency, temperature, ion concentration and chemistry, type of insulation material, and the characteristics of its defects. In this effort, a review of academic and industrial literature was performed to identify: 1) findings regarding the degradation mechanisms of submerged cabling and 2) condition monitoring methods that may prove useful in predicting the remaining lifetime of submerged medium voltage power cables. The research was conducted by a multi-disciplinary team, and sources included official NRC reports, national laboratory reports, IEEE standards, conference and journal proceedings, magazine articles, PhD dissertations, and discussions with experts. The purpose of this work was to establish the current state-of-the-art in material degradation modeling and cable condition monitoring techniques and to identify research gaps. Subsequently, future areas of focus are recommended to address these research gaps and thus strengthen the efficacy of the NRC’s developing cable condition monitoring program. Results of this literature review and details of the testing recommendations are presented in this report.

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