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BeyondFingerprinting: AI-guided discovery of robust materials & processes

Boyce, Brad L.; Dingreville, Remi P.M.; Adams, David P.; Martinez, Carianne; Fowler, James E.; Pillars, Jamin R.; Wixom, Ryan R.; Moffat, Harry K.; Davis, Warren L.; Ackerman, Sarah; Speed, Ann E.; Garland, Anthony; Roberts, Scott A.; Coleman, Jonathan J.; Delrio, Frank W.; Cillessen, Dale E.; Carroll, J.D.; Najm, Habib N.; Curry, John F.; Johnson, Kyle L.; Dudley, Sarah K.; Addamane, Sadhvikas J.; Henriksen, Amelia; Custer, Joyce O.; Bays, Nathan R.; Desai, Saaketh; Bassett, Kimberly L.; Shilt, Troy; Walker, Elise; Kalaswad, Matias; Shrivastava, Ankit; Babuska, Tomas F.; Kottwitz, Matthew; Fitzgerald, Kaitlynn; Actor, Jonas A.; Das, Niladri; Bianco, Nathan R.; Watkins, Tylan; Dorman, Kyle R.; Jones, Reese E.; Khalil, Mohammad

BeyondFingerprinting was a 2021-2024 Sandia Grand Challenge LDRD exploring the potential to develop new resilient materials and manufacturing processes by taking an artificial-intelligence (AI)-guided approach that integrates human-subject-matter expertise with algorithms enriched with physics-based constraints to unearth process-structure-property correlations. Such algorithms, trained on high-throughput experiments and simulations, are shown to serve as surrogate models that efficiently detect key “fingerprints” in materials data, prognose material performance, and guide effective process improvements. To accelerate broader adoption across mission areas, this AI-guided approach was demonstrated with three complex process-centric exemplars: electroplating, physical vapor deposition, and laser powder bed fusion. Together, these exemplars impact nearly every hardware component relevant to DOE and NNSA national security missions.

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Trade-offs in the latent representation of microstructure evolution

Acta Materialia

Dingreville, Remi P.M.; Desai, Saaketh; Shrivastava, Ankit; Najm, Habib N.; D'Elia, Marta

Characterizing and quantifying microstructure evolution is critical to forming quantitative relationships between material processing conditions, resulting microstructure, and observed properties. Machine-learning methods are increasingly accelerating the development of these relationships by treating microstructure evolution as a pattern recognition problem, discovering relationships explicitly or implicitly. These methods often rely on identifying low-dimensional microstructural fingerprints as latent variables. However, using inappropriate latent variables can lead to challenges in learning meaningful relationships. In this work, we survey and discuss the ability of various linear and nonlinear dimensionality reduction methods including principal component analysis, autoencoders, and diffusion maps to quantify and characterize the learned latent space microstructural representations and their time evolution. We characterize latent spaces by their ability to represent high-dimensional microstructural data in terms of compression achieved as a function of the number of latent dimensions required to represent the data accurately, their accuracy based on their reconstruction performance, and the smoothness of the microstructural trajectories in latent dimension. We quantify these metrics for common microstructure evolution problems in material science including spinodal decomposition of a binary metallic alloy, thin film deposition of a binary metallic alloy, dendritic growth, and grain growth in a polycrystal. This study provides considerations and guidelines for choosing dimensionality reduction methods when considering materials problems that involve high dimensional data and a variety of features over a range of lengths and time scales.

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Identifying process-structure-property correlations related to the development of stress in metal thin films by high-throughput characterization and simulation-based methods

Kalaswad, Matias; Shrivastava, Ankit; Desai, Saaketh; Custer, Joyce O.; Khan, Ryan M.; Addamane, Sadhvikas J.; Monti, Joseph M.; Fowler, James E.; Rodriguez, Mark A.; Delrio, Frank W.; Kotula, Paul G.; D'Elia, Marta; Najm, Habib N.; Dingreville, Remi P.M.; Boyce, Brad L.; Adams, David P.

8 Results
8 Results
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