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Post Moore's Law Report

DeBenedictis, Erik; Lentine, Anthony L.; Marinella, Matthew J.; Williams, R.S.; Conte, Thomas M.; Gargini, Paolo

Moore's law is driving an information revolution, worldwide economic growth, and is a tool for national security. This report explains how dire proclamations that "Moore's law is ending" are due to a natural redefinition of the phrase, but computing remains positioned to both drive economic growth and support national security. The computer industry used to be led by the semiconductor companies that made ever faster microprocessors with larger memories. However, control is shifting to new ways of designing computers, notably based on 3D chips and new analog and digital architectures. While artificial intelligence and quantum computing research have become mainstream pursuits, these latter two areas seem destined split off from Moore's law rather than become a part of it. We include a discussion of recent developments and opportunities in optical communications and computing.

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Unified computational model of transport in metal-insulating oxide-metal systems

Applied Physics A: Materials Science and Processing

Tierney, Brian D.; Hjalmarson, Harold P.; Jacobs-Gedrim, Robin B.; Agarwal, Sapan A.; James, Conrad D.; Marinella, Matthew J.

A unified physics-based model of electron transport in metal-insulator-metal (MIM) systems is presented. In this model, transport through metal-oxide interfaces occurs by electron tunneling between the metal electrodes and oxide defect states. Transport in the oxide bulk is dominated by hopping, modeled as a series of tunneling events that alter the electron occupancy of defect states. Electron transport in the oxide conduction band is treated by the drift–diffusion formalism and defect chemistry reactions link all the various transport mechanisms. It is shown that the current-limiting effect of the interface band offsets is a function of the defect vacancy concentration. These results provide insight into the underlying physical mechanisms of leakage currents in oxide-based capacitors and steady-state electron transport in resistive random access memory (ReRAM) MIM devices. Finally, an explanation of ReRAM bipolar switching behavior based on these results is proposed.

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DOE Big Idea Summit III: Solving the Information Technology Challenge Beyond Moore's Law: A New Path to Scaling

McCormick, Frederick B.; Shalf, John; Mitchell, Alan M.; Lentine, Anthony L.; Marinella, Matthew J.

This report captures the initial conclusions of the DOE seven National Lab team collaborating on the “Solving the Information Technology Energy Challenge Beyond Moore’s Law” initiative from the DOE Big Idea Summit III held in April of 2016. The seven Labs held a workshop in Albuquerque, NM in late July 2016 and gathered 40 researchers into 5 working groups: 4 groups spanning the levels of the co-design framework shown below, and a 5th working group focused on extending and advancing manufacturing approaches and coupling their constraints to all of the framework levels. These working groups have identified unique capabilities within the Labs to support the key challenges of this Beyond Moore’s Law Computing (BMC) vision, as well as example first steps and potential roadmaps for technology development.

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Solving the Information Technology Challenge Beyond Moore's Law (DOE Big Idea National Lab Meeting Report)

McCormick, Frederick B.; Marinella, Matthew J.; Mitchell, Alan M.; Hein, Olle; James, Conrad D.; Mamaluy, Denis M.; Taylor, Toni; Gokhale, Maya; Shalf, John; Culhane, Candace

This report provides an overview of a workshop held on July 27-28, 2016 at Sandia National Laboratories in Albuquerque to itemize the DOE laboratory capabilties and provide a high level organization of those capabilties into a full evaluation framework for new computing paradigms that spans from fundamental breakthroughs in materials and devices to full system architectures and software environments.

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Piecewise empirical model (PEM) of resistive memory for pulsed analog and neuromorphic applications

Journal of Computational Electronics

Marinella, Matthew J.; Niroula, John N.; Agarwal, Sapan A.; Jacobs-Gedrim, Robin B.; Hughart, David R.; Hsia, Alexander W.; James, Conrad D.

With the end of Dennard scaling and the ever-increasing need for more efficient, faster computation, resistive switching devices (ReRAM), often referred to as memristors, are a promising candidate for next generation computer hardware. These devices show particular promise for use in an analog neuromorphic computing accelerator as they can be tuned to multiple states and be updated like the weights in neuromorphic algorithms. Modeling a ReRAM-based neuromorphic computing accelerator requires a compact model capable of correctly simulating the small weight update behavior associated with neuromorphic training. These small updates have a nonlinear dependence on the initial state, which has a significant impact on neural network training. Consequently, we propose the piecewise empirical model (PEM), an empirically derived general purpose compact model that can accurately capture the nonlinearity of an arbitrary two-terminal device to match pulse measurements important for neuromorphic computing applications. By defining the state of the device to be proportional to its current, the model parameters can be extracted from a series of voltages pulses that mimic the behavior of a device in an analog neuromorphic computing accelerator. This allows for a general, accurate, and intuitive compact circuit model that is applicable to different resistance-switching device technologies. In this work, we explain the details of the model, implement the model in the circuit simulator Xyce, and give an example of its usage to model a specific Ta / TaO x device.

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Impact of linearity and write noise of analog resistive memory devices in a neural algorithm accelerator

2017 IEEE International Conference on Rebooting Computing, ICRC 2017 - Proceedings

Jacobs-Gedrim, Robin B.; Agarwal, Sapan A.; Knisely, Kathrine E.; Stevens, Jim E.; Van Heukelom, Michael V.; Hughart, David R.; James, Conrad D.; Marinella, Matthew J.

Resistive memory (ReRAM) shows promise for use as an analog synapse element in energy-efficient neural network algorithm accelerators. A particularly important application is the training of neural networks, as this is the most computationally-intensive procedure in using a neural algorithm. However, training a network with analog ReRAM synapses can significantly reduce the accuracy at the algorithm level. In order to assess this degradation, analog properties of ReRAM devices were measured and hand-written digit recognition accuracy was modeled for the training using backpropagation. Bipolar filamentary devices utilizing three material systems were measured and compared: one oxygen vacancy system, Ta-TaOx, and two conducting metallization systems, Cu-SiO2, and Ag/chalcogenide. Analog properties and conductance ranges of the devices are optimized by measuring the response to varying voltage pulse characteristics. Key analog device properties which degrade the accuracy are update linearity and write noise. Write noise may improve as a function of device manufacturing maturity, but write nonlinearity appears relatively consistent among the different device material systems and is found to be the most significant factor affecting accuracy. This suggests that new materials and/or fundamentally different resistive switching mechanisms may be required to improve device linearity and achieve higher algorithm training accuracy.

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Evaluation of a 'Field Cage' for Electric Field Control in GaN-Based HEMTs That Extends the Scalability of Breakdown into the kV Regime

IEEE Transactions on Electron Devices

Tierney, Brian D.; Dickerson, Jeramy R.; Reza, Shahed R.; Kaplar, Robert K.; Baca, A.G.; Marinella, Matthew J.

A distributed impedance 'field cage' structure is proposed and evaluated for electric field control in GaN-based, lateral high electron mobility transistors operating as kilovolt-range power devices. In this structure, a resistive voltage divider is used to control the electric field throughout the active region. The structure complements earlier proposals utilizing floating field plates that did not employ resistively connected elements. Transient results, not previously reported for field plate schemes using either floating or resistively connected field plates, are presented for ramps of dVds/dt = 100 V/ns. For both dc and transient results, the voltage between the gate and drain is laterally distributed, ensuring that the electric field profile between the gate and drain remains below the critical breakdown field as the source-to-drain voltage is increased. Our scheme indicates promise for achieving the breakdown voltage scalability to a few kilovolts.

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Achieving ideal accuracies in analog neuromorphic computing using periodic carry

Digest of Technical Papers - Symposium on VLSI Technology

Agarwal, Sapan A.; Jacobs-Gedrim, Robin B.; Hsia, Alexander W.; Hughart, David R.; Fuller, Elliot J.; Talin, A.A.; James, Conrad D.; Plimpton, Steven J.; Marinella, Matthew J.

Analog resistive memories promise to reduce the energy of neural networks by orders of magnitude. However, the write variability and write nonlinearity of current devices prevent neural networks from training to high accuracy. We present a novel periodic carry method that uses a positional number system to overcome this while maintaining the benefit of parallel analog matrix operations. We demonstrate how noisy, nonlinear TaOx devices that could only train to 80% accuracy on MNIST, can now reach 97% accuracy, only 1% away from an ideal numeric accuracy of 98%. On a file type dataset, the TaOx devices achieve ideal numeric accuracy. In addition, low noise, linear Li1-xCoO2 devices train to ideal numeric accuracies using periodic carry on both datasets.

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Non-metallic dopant modulation of conductivity in substoichiometric tantalum pentoxide: A first-principles study

Journal of Applied Physics

Bondi, Robert J.; Fox, Brian P.; Marinella, Matthew J.

We apply density-functional theory calculations to predict dopant modulation of electrical conductivity (σo) for seven dopants (C, Si, Ge, H, F, N, and B) sampled at 18 quantum molecular dynamics configurations of five independent insertion sites into two (high/low) baseline references of σo in amorphous Ta2O5, where each reference contains a single, neutral O vacancy center (VO0). From this statistical population (n = 1260), we analyze defect levels, physical structure, and valence charge distributions to characterize nanoscale modification of the atomistic structure in local dopant neighborhoods. C is the most effective dopant at lowering Ta2Ox σo, while also exhibiting an amphoteric doping behavior by either donating or accepting charge depending on the host oxide matrix. Both B and F robustly increase Ta2Ox σo, although F does so through elimination of Ta high charge outliers, while B insertion conversely creates high charge O outliers through favorable BO3 group formation, especially in the low σo reference. While N applications to dope and passivate oxides are prevalent, we found that N exacerbates the stochasticity of σo we sought to mitigate; sensitivity to the N insertion site and some propensity to form N-O bond chemistries appear responsible. We use direct first-principles predictions of σo to explore feasible Ta2O5 dopants to engineer improved oxides with lower variance and greater repeatability to advance the manufacturability of resistive memory technologies.

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Compensating for parasitic voltage drops in resistive memory arrays

2017 IEEE 9th International Memory Workshop, IMW 2017

Agarwal, Sapan A.; Schiek, Richard S.; Marinella, Matthew J.

Parasitic resistances cause devices in a resistive memory array to experience different read/write voltages depending on the device location, resulting in uneven writes and larger leakage currents. We present a new method to compensate for this by adding extra series resistance to the drivers to equalize the parasitic resistance seen by all the devices. This allows for uniform writes, enabling multi-level cells with greater numbers of distinguishable levels, and reduced write power, enabling larger arrays.

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Results 126–150 of 374
Results 126–150 of 374