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Physics of Plasmas
Nagayama, Taisuke; Bailey, James E.; Loisel, Guillaume P.; Hansen, Stephanie B.; Rochau, G.A.
Physics of Plasmas
Rochau, G.A.
Loisel, Guillaume P.; Bailey, James E.; Ball, Christopher R.; Dunham, G.S.; Hansen, Stephanie B.; Nagayama, Taisuke; Rochau, G.A.
Rochau, G.A.
Harding, Eric H.; Lemke, Raymond W.; Ao, Tommy; Bailey, James E.; Hansen, Stephanie B.; Desjarlais, Michael P.; Geissel, Matthias; Sinars, Daniel; Rochau, G.A.
Hansen, Stephanie B.; Harvey-Thompson, Adam J.; Knapp, P.F.; Rochau, G.A.; Sinars, Daniel; Peterson, K.J.; Awe, Thomas J.; Gomez, Matthew R.; Vesey, Roger A.; Slutz, Stephen A.; Herrmann, Mark H.; Jennings, Christopher A.
Ampleford, David J.; Flanagan, Timothy M.; Webb, Timothy J.; Harper-Slaboszewicz, V.; Cuneo, Michael E.; Rochau, G.A.; Dunham, G.S.; Coverdale, Christine A.; Hansen, Stephanie B.; Jennings, Christopher A.; Jones, Brent M.; Harvey-Thompson, Adam J.
Hansen, Stephanie B.; Jones, Brent M.; Knapp, P.F.; Lamppa, Derek C.; Mcbride, Ryan; Bailey, James E.; Rochau, G.A.; Slutz, Stephen A.; Sinars, Daniel; Gomez, Matthew R.; Peterson, K.J.; Ampleford, David J.; Awe, Thomas J.; Bliss, David E.; Carlson, Alan L.; Cuneo, Michael E.; Jennings, Christopher A.; Harvey-Thompson, Adam J.
Proceedings of the APS-SCCM&AIRAPT-24 Joint Conference 2013
Ao, Tommy; Geissel, Matthias; Reneker, Joseph; Kernaghan, Matthew D.; Harding, Eric H.; Bailey, James E.; Desjarlais, Michael P.; Hansen, Stephanie B.; Lemke, Raymond W.; Rochau, G.A.; Sinars, Daniel; Smith, Ian C.
Nagayama, Taisuke; Bailey, James E.; Rochau, G.A.; Hansen, Stephanie B.
Physics of Plasmas
Ampleford, David J.; Hansen, Stephanie B.; Jennings, Christopher A.; Jones, Brent M.; Coverdale, Christine A.; Harvey-Thompson, Adam J.; Rochau, G.A.; Dunham, G.S.; Cuneo, Michael E.
Ao, Tommy; Geissel, Matthias; Harding, Eric H.; Bailey, James E.; Desjarlais, Michael P.; Hansen, Stephanie B.; Lemke, Raymond W.; Sinars, Daniel; Rochau, G.A.
Stygar, William A.; Fowler, William E.; Gomez, Matthew R.; Harmon, Roger; Herrmann, Mark H.; Huber, Dale L.; Hutsel, Brian T.; Bailey, James E.; Jones, Michael; Jones, Peter; Leckbee, Joshua; Lee, James R.; Lewis, Scot A.; Long, Finis W.; Lopez, Mike R.; Lucero, Diego; Matzen, M.K.; Mazarakis, Michael G.; Mcbride, Ryan; Mckee, G.R.; Nakhleh, Charles; Owen, Albert C.; Rochau, G.A.; Savage, Mark E.; Schwarz, Jens; Sefkow, Adam B.; Sinars, Daniel; Stoltzfus, Brian; Vesey, Roger A.; Wakeland, Peter E.; Cuneo, Michael E.; Flicker, Dawn; Focia, Ronald J.
Awe, Thomas J.; Carlson, Alan L.; Dolan, Daniel H.; Falcon, Ross E.; Gomez, Matthew R.; Rochau, G.A.
Cuneo, Michael E.; Sinars, Daniel; Rochau, G.A.; Knudson, Marcus D.; Jones, Brent M.; Herrmann, Mark H.; Nakhleh, Charles
Loisel, Guillaume P.; Bailey, James E.; Ball, Christopher R.; Dunham, G.S.; Hansen, Stephanie B.; Nagayama, Taisuke; Rochau, G.A.
Jones, Brent M.; Hansen, Stephanie B.; Jennings, Christopher A.; Ampleford, David J.; Cuneo, Michael E.; Rochau, G.A.; Bailey, James E.; Dunham, G.S.; Coverdale, Christine A.; Lamppa, Derek C.; Strizic, Thomas S.; Johnson, Drew; Jones, Michael; Mckenney, John
Nagayama, Taisuke; Bailey, James E.; Rochau, G.A.; Hansen, Stephanie B.; Loisel, Guillaume P.
Loisel, Guillaume P.; Bailey, James E.; Rochau, G.A.; Hansen, Stephanie B.; Ball, Christopher R.; Dunham, G.S.; Nagayama, Taisuke
Bailey, James E.; Loisel, Guillaume P.; Rochau, G.A.; Hansen, Stephanie B.; Ball, Christopher R.; Dunham, G.S.; Nagayama, Taisuke
Nagayama, Taisuke; Bailey, James E.; Rochau, G.A.; Hansen, Stephanie B.; Loisel, Guillaume P.
Rochau, G.A.; Bailey, James E.; Carlson, Alan L.; Gomez, Matthew R.
Nagayama, Taisuke; Bailey, James E.; Rochau, G.A.; Hansen, Stephanie B.; Loisel, Guillaume P.
Review of Scientific Instruments
Gomez, Matthew R.; Rochau, G.A.; Bailey, James E.; Dunham, G.S.; Kernaghan, Matthew D.; Gard, P.; Robertson, G.K.; Owen, A.C.; Argo, Jeffrey W.; Nielsen, D.S.; Lake, Patrick
The pinned optically aligned diagnostic dock (PODD) is a multi-configuration diagnostic platform designed to measure x-ray emission on the Z facility. The PODD houses two plasma emission acquisition (PEA) systems, which are aligned with a set of precision machined pins. The PEA systems are modular, allowing a single diagnostic housing to support several different diagnostics. The PEA configurations fielded to date include both time-resolved and time-integrated, 1D spatially resolving, elliptical crystal spectrometers, and time-integrated, 1D spatially resolving, convex crystal spectrometers. Additional proposed configurations include time-resolved, monochromatic mirrored pinhole imagers and arrays of filtered x-ray diodes, diamond photo-conducting diode detectors, and bolometers. The versatility of the PODD system will allow the diagnostic configuration of the Z facility to be changed without significantly adding to the turn-around time of the machine. Additionally, the PODD has been designed to allow instrument setup to be completed entirely off-line, leaving only a refined alignment process to be performed just prior to a shot, which is a significant improvement over the instrument the PODD replaces. Example data collected with the PODD are presented. © 2012 American Institute of Physics.
Cuneo, Michael E.; Jones, Michael; Edens, Aaron; Lopez, Mike R.; Mcbride, Ryan; Rochau, G.A.; Jones, Brent M.; Ampleford, David J.; Sinars, Daniel; Bailey, James E.; Stygar, William A.; Savage, Mark E.
Results 176–200 of 264