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Physics of Plasmas
Nagayama, Taisuke N.; Bailey, James E.; Loisel, Guillaume P.; Hansen, Stephanie B.; Rochau, G.A.
Physics of Plasmas
Rochau, G.A.
Loisel, Guillaume P.; Bailey, James E.; Ball, Christopher R.; Dunham, Gregory S.; Hansen, Stephanie B.; Nagayama, Taisuke N.; Rochau, G.A.
Rochau, G.A.
Harding, Eric H.; Lemke, Raymond W.; Ao, Tommy A.; Bailey, James E.; Hansen, Stephanie B.; Desjarlais, Michael P.; Geissel, Matthias G.; Sinars, Daniel S.; Rochau, G.A.
Hansen, Stephanie B.; Harvey-Thompson, Adam J.; Knapp, Patrick K.; Rochau, G.A.; Sinars, Daniel S.; Peterson, Kyle J.; Awe, Thomas J.; Gomez, Matthew R.; Vesey, Roger A.; Slutz, Stephen A.; Herrmann, Mark H.; Jennings, Christopher A.
Ampleford, David A.; Flanagan, Timothy M.; Webb, Timothy J.; Harper-Slaboszewicz, V.H.; Cuneo, M.E.; Rochau, G.A.; Dunham, Gregory S.; Coverdale, Christine A.; Hansen, Stephanie B.; Jennings, Christopher A.; Jones, Brent M.; Harvey-Thompson, Adam J.
Hansen, Stephanie B.; Jones, Brent M.; Knapp, Patrick K.; Lamppa, Derek C.; McBride, Ryan D.; Bailey, James E.; Rochau, G.A.; Slutz, Stephen A.; Sinars, Daniel S.; Gomez, Matthew R.; Peterson, Kyle J.; Ampleford, David A.; Awe, Thomas J.; Bliss, David E.; Carlson, Alan L.; Cuneo, M.E.; Jennings, Christopher A.; Harvey-Thompson, Adam J.
Proceedings of the APS-SCCM&AIRAPT-24 Joint Conference 2013
Ao, Tommy A.; Geissel, Matthias G.; Reneker, Joseph R.; Kernaghan, M.D.; Harding, Eric H.; Bailey, James E.; Desjarlais, Michael P.; Hansen, Stephanie B.; Lemke, Raymond W.; Rochau, G.A.; Sinars, Daniel S.; Smith, Ian C.
Nagayama, Taisuke N.; Bailey, James E.; Rochau, G.A.; Hansen, Stephanie B.
Physics of Plasmas
Ampleford, David A.; Hansen, Stephanie B.; Jennings, Christopher A.; Jones, Brent M.; Coverdale, Christine A.; Harvey-Thompson, Adam J.; Rochau, G.A.; Dunham, Gregory S.; Cuneo, M.E.
Ao, Tommy A.; Geissel, Matthias G.; Harding, Eric H.; Bailey, James E.; Desjarlais, Michael P.; Hansen, Stephanie B.; Lemke, Raymond W.; Sinars, Daniel S.; Rochau, G.A.
Stygar, William A.; Fowler, William E.; Gomez, Matthew R.; Harmon, Roger L.; Herrmann, Mark H.; Huber, Dale L.; Hutsel, Brian T.; Bailey, James E.; Jones, Michael J.; Jones, Peter A.; Leckbee, Joshua L.; Lee, James R.; Lewis, Scot A.; Long, Finis W.; Lopez, Mike R.; Lucero, Diego J.; Matzen, M.K.; Mazarakis, Michael G.; McBride, Ryan D.; McKee, George R.; Nakhleh, Charles N.; Owen, Albert C.; Rochau, G.A.; Savage, Mark E.; Schwarz, Jens S.; Sefkow, Adam B.; Sinars, Daniel S.; Stoltzfus, Brian S.; Vesey, Roger A.; Wakeland, P.; Cuneo, M.E.; Flicker, Dawn G.; Focia, Ronald J.
Awe, Thomas J.; Carlson, Alan L.; Dolan, Daniel H.; Falcon, Ross E.; Gomez, Matthew R.; Rochau, G.A.
Cuneo, M.E.; Sinars, Daniel S.; Rochau, G.A.; Knudson, Marcus D.; Jones, Brent M.; Herrmann, Mark H.; Nakhleh, Charles N.
Loisel, Guillaume P.; Bailey, James E.; Ball, Christopher R.; Dunham, Gregory S.; Hansen, Stephanie B.; Nagayama, Taisuke N.; Rochau, G.A.
Jones, Brent M.; Hansen, Stephanie B.; Jennings, Christopher A.; Ampleford, David A.; Cuneo, M.E.; Rochau, G.A.; Bailey, James E.; Dunham, Gregory S.; Coverdale, Christine A.; Lamppa, Derek C.; Strizic, Thomas S.; Johnson, Drew J.; Jones, Michael J.; Mckenney, John M.
Loisel, Guillaume P.; Bailey, James E.; Rochau, G.A.; Hansen, Stephanie B.; Ball, Christopher R.; Dunham, Gregory S.; Nagayama, Taisuke N.
Nagayama, Taisuke N.; Bailey, James E.; Rochau, G.A.; Hansen, Stephanie B.; Loisel, Guillaume P.
Ao, Tommy A.; Smith, Ian C.; Geissel, Matthias G.; Harding, Eric H.; Bailey, James E.; Hansen, Stephanie B.; Sefkow, Adam B.; Desjarlais, Michael P.; Lemke, Raymond W.; Sinars, Daniel S.; Rochau, G.A.
Bailey, James E.; Loisel, Guillaume P.; Rochau, G.A.; Hansen, Stephanie B.; Ball, Christopher R.; Dunham, Gregory S.; Nagayama, Taisuke N.
Nagayama, Taisuke N.; Bailey, James E.; Rochau, G.A.; Hansen, Stephanie B.; Loisel, Guillaume P.
Rochau, G.A.; Bailey, James E.; Carlson, Alan L.; Gomez, Matthew R.
Nagayama, Taisuke N.; Bailey, James E.; Rochau, G.A.; Hansen, Stephanie B.; Loisel, Guillaume P.
Review of Scientific Instruments
Gomez, Matthew R.; Rochau, G.A.; Bailey, James E.; Dunham, Gregory S.; Kernaghan, M.D.; Gard, P.; Robertson, Grafton K.; Owen, A.C.; Argo, J.W.; Nielsen, D.S.; Lake, Patrick W.
The pinned optically aligned diagnostic dock (PODD) is a multi-configuration diagnostic platform designed to measure x-ray emission on the Z facility. The PODD houses two plasma emission acquisition (PEA) systems, which are aligned with a set of precision machined pins. The PEA systems are modular, allowing a single diagnostic housing to support several different diagnostics. The PEA configurations fielded to date include both time-resolved and time-integrated, 1D spatially resolving, elliptical crystal spectrometers, and time-integrated, 1D spatially resolving, convex crystal spectrometers. Additional proposed configurations include time-resolved, monochromatic mirrored pinhole imagers and arrays of filtered x-ray diodes, diamond photo-conducting diode detectors, and bolometers. The versatility of the PODD system will allow the diagnostic configuration of the Z facility to be changed without significantly adding to the turn-around time of the machine. Additionally, the PODD has been designed to allow instrument setup to be completed entirely off-line, leaving only a refined alignment process to be performed just prior to a shot, which is a significant improvement over the instrument the PODD replaces. Example data collected with the PODD are presented. © 2012 American Institute of Physics.
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