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Vacuum gap microstrip microwave resonators for 2.5-D integration in quantum computing

IEEE Transactions on Applied Superconductivity

Lewis, Rupert; Henry, Michael D.; Schroeder, Katlin S.

Vacuum gap λ/2 microwave resonators are demonstrated as a route toward higher integration in superconducting qubit circuits. The resonators are fabricated from pieces on two silicon chips bonded together with an In-Sb bond. Measurements of the devices yield resonant frequencies in good agreement with simulations. Creating low loss circuits in this geometry is also discussed.

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Materials Study of NbN and TaxN Thin Films for SNS Josephson Junctions

IEEE Transactions on Applied Superconductivity

Missert, Nancy A.; Brunke, Lyle B.; Henry, Michael D.; Wolfley, Steven L.; Howell, Stephen W.; Mudrick, John M.; Lewis, Rupert

Properties of NbN and TaxN thin films grown at ambient temperatures on SiO2/Si substrates by reactive-pulsed laser deposition and reactive magnetron sputtering (MS) as a function of N2 gas flow were investigated. Both techniques produced films with smooth surfaces, where the surface roughness did not depend on the N2 gas flow during growth. High crystalline quality, (111) oriented NbN films with Tc up to 11 K were produced by both techniques for N contents near 50%. The low temperature transport properties of the TaxN films depended upon both the N2 partial pressure used during growth and the film thickness. The root mean square surface roughness of TaxN films grown by MS increased as the film thickness decreased down to 10 nm.

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Pyroelectric response in crystalline hafnium zirconium oxide (Hf1-xZrxO2) thin films

Applied Physics Letters

Smith, Sean S.; Kitahara, A.R.; Rodriguez, Mark A.; Henry, Michael D.; Brumbach, Michael T.; Ihlefeld, Jon I.

Pyroelectric coefficients were measured for 20 nm thick crystalline hafnium zirconium oxide (Hf1-xZrxO2) thin films across a composition range of 0 ≤ x ≤ 1. Pyroelectric currents were collected near room temperature under zero applied bias and a sinusoidal oscillating temperature profile to separate the influence of non-pyroelectric currents. The pyroelectric coefficient was observed to correlate with zirconium content, increased orthorhombic/tetragonal phase content, and maximum polarization response. The largest measured absolute value was 48 μCm−2 K−1 for a composition with x = 0.64, while no pyroelectric response was measured for compositions which displayed no remanent polarization (x = 0, 0.91, and 1).

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Isotropic plasma etching of Ge Si and SiNx films

Journal of Vacuum Science and Technology. B, Nanotechnology and Microelectronics

Henry, Michael D.; Douglas, Erica A.

This study reports on selective isotropic dry etching of chemically vapor deposited (CVD) Ge thin film, release layers using a Shibaura chemical downstream etcher (CDE) with NF3 and Ar based plasma chemistry. Relative etch rates between Ge, Si and SiNx are described with etch rate reductions achieved by adjusting plasma chemistry with O2. Formation of oxides reducing etch rates were measured for both Ge and Si, but nitrides or oxy-nitrides created using direct injection of NO into the process chamber were measured to increase Si and SiNx etch rates while retarding Ge etching.

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Inductive coupling for increased bandwidth of aluminum nitride contour-mode microresonator filters

IEEE MTT-S International Microwave Symposium Digest

Nordquist, Christopher N.; Henry, Michael D.; Nguyen, Janet H.; Clews, Peggy; Lepkowski, Stefan M.; Grine, Alejandro J.; Dyck, Christopher D.; Olsson, Roy H.

Inductive coupling and matching networks are used to increase the bandwidth of filters realized with aluminum nitride contour-mode resonators. Filter bandwidth has been doubled using a wirebonded combination of a wafer-level-packaged resonator chip and a high-Q integrated inductor chip. The three-pole filters have a center frequency near 500 MHz, an area of 9 mm × 9 mm, insertion loss of < 5 dB for a bandwidth of 0.4%, and a resonator unloaded Q of 1600.

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Oblique patterned etching of vertical silicon sidewalls

Applied Physics Letters

Burckel, David B.; Finnegan, Patrick S.; Henry, Michael D.; Resnick, Paul J.; Jarecki, Robert L.

A method for patterning on vertical silicon surfaces in high aspect ratio silicon topography is presented. A Faraday cage is used to direct energetic reactive ions obliquely through a patterned suspended membrane positioned over the topography. The technique is capable of forming high-fidelity pattern (100 nm) features, adding an additional fabrication capability to standard top-down fabrication approaches.

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Micron-scale three-dimensional subtractive manufacturing

ADVANCED MATERIALS

Burckel, David B.; Finnegan, Patrick S.; Resnick, Paul J.; Henry, Michael D.; Jarecki, Robert L.

Emerging nano-photonic and nano-opto-mechanical applications benefit from fabrication of complex three-dimensional structures. Creation of micrometer scale and sub-micrometer scale structures can be performed either additively, or subtractively. Additive techniques, where material is deposited, such as direct laser write, interferometric lithography, nano-origami and colloidal self-assembly have been used to create a wide array of complex sub-micrometer structures. Example of subtractive fabrication of three-dimensional structures, where material is removed, are less common.

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Decoupling Superconducting Qubits from the Quantum Bus/Readout Resonator to Enable Scaling

Lewis, Rupert; Henry, Michael D.

Superconducting qubits have made great strides in coherence time, gating, and algorithms. However, to achieve real scalability, more is required. We propose to study the problem of coupling and decoupling a transmon, a popular type of superconducting qubit, from its host resonator, which serves the dual role of a bus connecting qubits together and a readout channel. The transmon couples to its host resonator via its electric-dipole moment. We plan to use a trick of quantum mechanics to null the dipole moment and decouple the transmon. In doing so, we hope to study a variety of physics associated with multi-qubit operation, control, and readout.

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Wafer-level packaging of aluminum nitride RF MEMS filters

Proceedings - Electronic Components and Technology Conference

Henry, Michael D.; Young, Travis R.; Hollowell, Andrew E.; Eichenfield, Matthew S.; Olsson, Roy H.

Aluminum nitride (AlN) radio frequency (RF) MEMS filters utilize piezoelectric coupling for high-performance electrical filters with frequency diversity in a small form factor. Furthermore, the compatibility of AlN with CMOS fabrication makes AlN extremely attractive from a commercial standpoint. A technological hurdle has been the ability to package these suspended resonator devices at a wafer level with high yield. In this work, we describe wafer-level packaging (WLP) of AlN MEMS RF filters in an all silicon package with solder balls on nickel vanadium / gold (NiV/Au) bond pads that are subsequently ready for flip chip bonding. For this integration scheme, we utilize a 150 mm device wafer, fabricated in a CMOS foundry, and bond at the wafer level to a cavity silicon wafer, which hermetically encapsulates each device. The cavity wafer is then uniformly plasma etched back using a deep reactive ion etcher resulting in a 100 μm thick hermetic silicon lid encapsulating each die, balled with 250 μm 90/10 Pb/Sn solder balls and finally diced into individually packaged dies. Each die can be frequency-trimmed to an exact frequency by rapid temperature annealing the stress of the metallization layers of each resonator. The resulting technology yields a completely packaged wafer of 900 encapsulated die (14 mm2 by 800 μm thick) with multiple resonators and filters at various frequencies in each package.

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Results 76–100 of 108
Results 76–100 of 108