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Aluminum nitride piezoelectric microphones as zero-power passive acoustic filters

TRANSDUCERS 2017 - 19th International Conference on Solid-State Sensors, Actuators and Microsystems

Reger, Robert W.; Clews, Peggy J.; Bryan, Gwendolyn M.; Keane, Casey A.; Henry, David; Griffin, Benjamin

With the advent of the internet-of-things, sensors that are constantly alert yet consuming near-zero power are desired. Remote sensing applications where sensor replacement is costly or hazardous would also benefit. Piezoelectric micro-electro-mechanical systems (MEMS) convert mechanical or acoustic energy into electrical signals while consuming zero power. When coupled with low-power complementary metal-oxide-semiconductor (CMOS) circuits, a near-zero power sensing system is formed. This work describes piezoelectric MEMS microphones based on aluminum nitride (AlN). The microphones operate as passive acoustic filters by placing their resonant response within bandwidths of interest. Devices are demonstrated with operational frequencies from 430 Hz to greater than 10 kHz with quality factors as large as 3,000 and open-circuit voltages exceeding 600 mV/Pa.

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Degradation of Superconducting Nb/NbN Films by Atmospheric Oxidation

IEEE Transactions on Applied Superconductivity

Henry, David; Wolfley, Steven; Young, Travis R.; Monson, Todd; Pearce, Charles J.; Lewis, Rupert M.; Clark, Blythe C.; Brunke, Lyle B.; Missert, Nancy

Niobium and niobium nitride thin films are transitioning from fundamental research toward wafer scale manufacturing with technology drivers that include superconducting circuits and electronics, optical single photon detectors, logic, and memory. Successful microfabrication requires precise control over the properties of sputtered superconducting films, including oxidation. Previous work has demonstrated the mechanism in oxidation of Nb and how film structure could have deleterious effects upon the superconducting properties. This study provides an examination of atmospheric oxidation of NbN films. By examination of the room temperature sheet resistance of NbN bulk oxidation was identified and confirmed by secondary ion mass spectrometry. Meissner magnetic measurements confirmed the bulk oxidation not observed with simple cryogenic resistivity measurements.

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Vacuum gap microstrip microwave resonators for 2.5-D integration in quantum computing

IEEE Transactions on Applied Superconductivity

Lewis, Rupert M.; Henry, David; Schroeder, Katlin M.

Vacuum gap λ/2 microwave resonators are demonstrated as a route toward higher integration in superconducting qubit circuits. The resonators are fabricated from pieces on two silicon chips bonded together with an In-Sb bond. Measurements of the devices yield resonant frequencies in good agreement with simulations. Creating low loss circuits in this geometry is also discussed.

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Materials Study of NbN and TaxN Thin Films for SNS Josephson Junctions

IEEE Transactions on Applied Superconductivity

Missert, Nancy; Brunke, Lyle B.; Henry, David; Wolfley, Steven; Howell, Stephen W.; Mudrick, John P.; Lewis, Rupert M.

Properties of NbN and TaxN thin films grown at ambient temperatures on SiO2/Si substrates by reactive-pulsed laser deposition and reactive magnetron sputtering (MS) as a function of N2 gas flow were investigated. Both techniques produced films with smooth surfaces, where the surface roughness did not depend on the N2 gas flow during growth. High crystalline quality, (111) oriented NbN films with Tc up to 11 K were produced by both techniques for N contents near 50%. The low temperature transport properties of the TaxN films depended upon both the N2 partial pressure used during growth and the film thickness. The root mean square surface roughness of TaxN films grown by MS increased as the film thickness decreased down to 10 nm.

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Pyroelectric response in crystalline hafnium zirconium oxide (Hf1-xZrxO2) thin films

Applied Physics Letters

Smith, Sean; Kitahara, A.R.; Rodriguez, Mark A.; Henry, David; Brumbach, Michael T.; Ihlefeld, Jon F.

Pyroelectric coefficients were measured for 20 nm thick crystalline hafnium zirconium oxide (Hf1-xZrxO2) thin films across a composition range of 0 ≤ x ≤ 1. Pyroelectric currents were collected near room temperature under zero applied bias and a sinusoidal oscillating temperature profile to separate the influence of non-pyroelectric currents. The pyroelectric coefficient was observed to correlate with zirconium content, increased orthorhombic/tetragonal phase content, and maximum polarization response. The largest measured absolute value was 48 μCm−2 K−1 for a composition with x = 0.64, while no pyroelectric response was measured for compositions which displayed no remanent polarization (x = 0, 0.91, and 1).

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Isotropic plasma etching of Ge Si and SiNx films

Journal of Vacuum Science and Technology. B, Nanotechnology and Microelectronics

Henry, David; Douglas, Erica A.

This study reports on selective isotropic dry etching of chemically vapor deposited (CVD) Ge thin film, release layers using a Shibaura chemical downstream etcher (CDE) with NF3 and Ar based plasma chemistry. Relative etch rates between Ge, Si and SiNx are described with etch rate reductions achieved by adjusting plasma chemistry with O2. Formation of oxides reducing etch rates were measured for both Ge and Si, but nitrides or oxy-nitrides created using direct injection of NO into the process chamber were measured to increase Si and SiNx etch rates while retarding Ge etching.

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Inductive coupling for increased bandwidth of aluminum nitride contour-mode microresonator filters

IEEE MTT-S International Microwave Symposium Digest

Nordquist, Christopher D.; Henry, David; Nguyen, Janet H.; Clews, Peggy; Lepkowski, Stefan; Grine, Alejandro J.; Dyck, Christopher; Olsson, Roy H.

Inductive coupling and matching networks are used to increase the bandwidth of filters realized with aluminum nitride contour-mode resonators. Filter bandwidth has been doubled using a wirebonded combination of a wafer-level-packaged resonator chip and a high-Q integrated inductor chip. The three-pole filters have a center frequency near 500 MHz, an area of 9 mm × 9 mm, insertion loss of < 5 dB for a bandwidth of 0.4%, and a resonator unloaded Q of 1600.

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Oblique patterned etching of vertical silicon sidewalls

Applied Physics Letters

Burckel, David B.; Finnegan, Patrick S.; Henry, David; Resnick, Paul; Jarecki, Robert

A method for patterning on vertical silicon surfaces in high aspect ratio silicon topography is presented. A Faraday cage is used to direct energetic reactive ions obliquely through a patterned suspended membrane positioned over the topography. The technique is capable of forming high-fidelity pattern (100 nm) features, adding an additional fabrication capability to standard top-down fabrication approaches.

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Micron-scale three-dimensional subtractive manufacturing

ADVANCED MATERIALS

Burckel, David B.; Finnegan, Patrick S.; Resnick, Paul; Henry, David; Jarecki, Robert

Emerging nano-photonic and nano-opto-mechanical applications benefit from fabrication of complex three-dimensional structures. Creation of micrometer scale and sub-micrometer scale structures can be performed either additively, or subtractively. Additive techniques, where material is deposited, such as direct laser write, interferometric lithography, nano-origami and colloidal self-assembly have been used to create a wide array of complex sub-micrometer structures. Example of subtractive fabrication of three-dimensional structures, where material is removed, are less common.

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Results 76–100 of 112
Results 76–100 of 112
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