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Bussmann, Ezra ; Ohta, Taisuke ; Scrymgeour, David A. ; Brumbach, Michael T. ; Smith, Sean ; Hjalmarson, Harold P. ; Schultz, Peter A. ; Clem, Paul ; Hopkins, Matthew M. ; Moore, Christopher H.
Sarma, Raktim ; Campione, Salvatore ; Goldflam, Michael ; Shank, Josh ; Smith, Sean ; Noh, Jinhyun; Ye, Peide; Sinclair, Michael B. ; Brener, Igal
Henry, David ; Smith, Sean ; Lewis, Rupert M. ; Ihlefeld, Jon
Bussmann, Ezra ; Smith, Sean ; Scrymgeour, David A. ; Ohta, Taisuke ; Hjalmarson, Harold P. ; Schultz, Peter A. ; Clem, Paul ; Hopkins, Matthew M. ; Moore, Christopher H.
Bussmann, Ezra ; Berg, Morgann ; Scrymgeour, David A. ; Brumbach, Michael T. ; Ohta, Taisuke ; Smith, Sean ; Hjalmarson, Harold P. ; Schultz, Peter A. ; Clem, Paul ; Hopkins, Matthew M. ; Moore, Christopher H.
Schultz, Peter A. ; Hjalmarson, Harold P. ; Bussmann, Ezra ; Hopkins, Matthew M. ; Smith, Sean ; Clem, Paul ; Scrymgeour, David A. ; Berg, Morgann ; Ohta, Taisuke ; Moore, Christopher H.
Moore, Christopher H. ; Berg, Morgann ; Bussmann, Ezra ; Ohta, Taisuke ; Scrymgeour, David A. ; Smith, Sean ; Schultz, Peter A. ; Hjalmarson, Harold P. ; Clem, Paul ; Hopkins, Matthew M.
Moore, Christopher H. ; Berg, Morgann ; Brumbach, Michael T. ; Bussmann, Ezra ; Clem, Paul ; Hjalmarson, Harold P. ; Hopkins, Matthew M. ; Schultz, Peter A. ; Scrymgeour, David A. ; Smith, Sean
Berg, Morgann ; Hjalmarson, Harold P. ; Scrymgeour, David A. ; Brumbach, Michael T. ; Schultz, Peter A. ; Clem, Paul ; Hopkins, Matthew M. ; Moore, Christopher H. ; Ohta, Taisuke ; Smith, Sean ; Bussmann, Ezra
Bussmann, Ezra ; Smith, Sean ; Scrymgeour, David A. ; Ohta, Taisuke ; Hjalmarson, Harold P. ; Schultz, Peter A. ; Clem, Paul ; Hopkins, Matthew M. ; Moore, Christopher H.
Henry, David ; Smith, Sean ; Lewis, Rupert M. ; Ihlefeld, Jon
Shank, Josh ; Smith, Sean ; Sarma, Raktim ; Ihlefeld, Jon; Davids, Paul ; Sinclair, Michael B. ; Peters, David
Smith, Sean ; Shank, Josh ; Sarma, Raktim ; Ihlefeld, Jon F.; Wilke, Rudeger H.T. ; Davids, Paul ; Sinclair, Michael B. ; Peters, David
Smith, Sean ; Henry, David ; Dickerson, Jeramy ; Brumbach, Michael T. ; Ihlefeld, Jon
Henry, David ; Griffin, Benjamin ; Nordquist, Christopher D. ; Smith, Sean ; Davids, Paul
Smith, Sean ; Henry, David ; Dickerson, Jeramy ; Brumbach, Michael T. ; Ihlefeld, Jon F.
Ohta, Taisuke ; Bays, Nathan R. ; Smith, Sean ; Berg, Morgann ; Chan, Calvin ; Liu, Fangze; Mohite, Aditya D.; Copeland, Robert
Ruiz, Isaac ; Howell, Stephen W. ; Bays, Nathan R. ; Davids, Paul ; Smith, Sean ; Peters, David ; Goldflam, Michael
Brumbach, Michael T. ; Smith, Sean ; Dickerson, Jeramy ; Henry, David ; Ihlefeld, Jon
Sharma, Peter A. ; Douglas, Erica A. ; Henry, David ; Lewis, Rupert M. ; Harris, Charles T. ; Wiwi, Michael R. ; Smith, Sean ; Lima-Sharma, Ana L. ; Brumbach, Michael T. ; Sugar, Joshua D.
Smith, Sean ; Rodriguez, Mark A. ; Henry, David ; Brumbach, Michael T. ; Ihlefeld, Jon F.
Smith, Sean ; Kitahara, Andrew; Henry, David ; Brumbach, Michael T. ; Rodriguez, Mark A. ; Ihlefeld, Jon F.
Hopkins, Matthew M. ; Bussmann, Ezra ; Smith, Sean ; Scrymgeour, David A. ; Brumbach, Michael T. ; Hjalmarson, Harold P. ; Schultz, Peter A. ; Clem, Paul ; Moore, Christopher H.
Applied Physics Letters
Smith, Sean ; Kitahara, A.R.; Rodriguez, Mark A. ; Henry, David ; Brumbach, Michael T. ; Ihlefeld, Jon F.
Pyroelectric coefficients were measured for 20 nm thick crystalline hafnium zirconium oxide (Hf1-xZrxO2) thin films across a composition range of 0 ≤ x ≤ 1. Pyroelectric currents were collected near room temperature under zero applied bias and a sinusoidal oscillating temperature profile to separate the influence of non-pyroelectric currents. The pyroelectric coefficient was observed to correlate with zirconium content, increased orthorhombic/tetragonal phase content, and maximum polarization response. The largest measured absolute value was 48 μCm−2 K−1 for a composition with x = 0.64, while no pyroelectric response was measured for compositions which displayed no remanent polarization (x = 0, 0.91, and 1).
Smith, Sean ; Kitahara, Andrew; Henry, David ; Brumbach, Michael T. ; Rodriguez, Mark A. ; Ihlefeld, Jon F.
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