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Catalytic water splitting kinetics and optimization

Talin, Albert A.; Chan, Thomas; Chandler, David W.

This project was motivated primarily by the opportunity of turning photocatalysis into a cost efficient hydrogen generation method for domestic energy and chemical production, and by the need to provide detailed mechanisms of photocatalytic reactions of broad scientific and technological interest. Specifically, we focused on the development of a new technique for analysis of (photo)catalytic reaction mechanisms to guide photocatalyst design. Our approach was based on applying velocity map ima

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Utilizing Quantum Cascade Lasers for Ultranarrow Velocity Resolution and Quantum-State Selectivity in Molecular Beam Scattering and Spectroscopy

Journal of Physical Chemistry Letters

Carlson, Olivia K.; Chandler, David W.

We demonstrate the capability of a narrow linewidth quantum cascade laser (QCL) to selectively excite a very narrow velocity range of nitric oxide (σ ≤ 7(3) m/s) with a pure ro-vibrational quantum state. By implementing a counter-propagating geometry, the molecules are selectively excited according to the Doppler shift of the ro-vibrational transition frequency such that the velocity width associated with the excited molecules depends only on the QCL linewidth. We demonstrate a velocity distribution limited by the effective linewidth of our free-running QCL (Γ = 3.2 MHz). Our development provides a cost-effective, flexible approach to resolve quantum-state selective chemical dynamics with excellent velocity resolution in a wide variety of molecules with infrared-active transitions. This technique has been formulated to provide ultrahigh collisional energy resolution in molecular beams to delineate final quantum-state product pairs in studies of molecular collisions.

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Resolving the Electron Plume within a Scanning Electron Microscope

ACS Nano

Alcorn, Francis M.; Perez, Christopher; Bays, Nathan R.; Hoang, Lauren; Nitta, Frederick U.; Mannix, Andrew J.; Talin, Albert A.; Nakakura, Craig Y.; Chandler, David W.; Kumar, Suhas

Scanning electron microscopy (SEM), a century-old technique, is today a ubiquitous method of imaging the surface of nanostructures. However, most SEM detectors simply count the number of secondary electrons from a material of interest, and thereby overlook the rich material information contained within them. Here, by simple modifications to a standard SEM tool, we resolve the momentum and energy information on secondary electrons by directly imaging the electron plume generated by the electron beam of the SEM. Leveraging these spectroscopic imaging capabilities, our technique is able to image lateral electric fields across a prototypical silicon p-n junctions and to distinguish differently doped regions, even when buried beyond depths typically accessible by SEM. Intriguingly, the subsurface sensitivity of this technique reveals unexpectedly strong surface band bending within nominally passivated semiconductor structures, providing useful insights for complex layered component designs, in which interfacial dynamics dictate device operation. These capabilities for noninvasive, multimodal probing of complicated electronic components are crucial in today’s electronic manufacturing but is largely inaccessible even with sophisticated techniques. These results show that seemingly simple SEM can be extended to probe complex and useful material properties.

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Demonstration of Non-linear Optical Spectroscopy Enhancement utilizing Entangled Photons

Chandler, David W.; Steinmetz, Scott A.; Cuozzo, Savannah L.; Kliewer, Christopher J.

Laser-based nonlinear optical spectroscopy approaches have enabled the direct sensing of important chemistry in nearly every fundamental or applied field of science. Yet in many applications, increased detectivity is needed to unravel fundamental mechanisms. One possibility is the use of quantum entanglement to increase detection cross-sections, but it is unproven that enhancement from quantum light extends to practical intensities for chemical sensing. In this report, we investigated the creation and use of entangled photons in nonlinear optical mixing for second harmonic generation and infrared imaging. We observe that the linear scaling of nonlinear mixing from entangled photon sources extends to the mW laser power regime, and enhances direct infrared imaging on Si-based charge coupled device cameras. These results motivate future experimentation on practical uses of entangled photons for nonlinear optical sensing applications.

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Picosecond carrier dynamics in InAs and GaAs revealed by ultrafast electron microscopy

Science Advances

Perez, Christopher; Ellis, Scott R.; Alcorn, Francis M.; Bays, Nathan R.; Fuller, Elliot J.; Leonard, Francois; Chandler, David W.; Talin, Albert A.; Bisht, Ravindra S.; Ramanathan, Shriram; Goodson, Kenneth E.; Kumar, Suhas

Understanding the limits of spatiotemporal carrier dynamics, especially in III-V semiconductors, is key to designing ultrafast and ultrasmall optoelectronic components. However, identifying such limits and the properties controlling them has been elusive. Here, using scanning ultrafast electron microscopy, in bulk n-GaAs and p-InAs, we simultaneously measure picosecond carrier dynamics along with three related quantities: subsurface band bending, above-surface vacuum potentials, and surface trap densities. We make two unexpected observations. First, we uncover a negative-time contrast in secondary electrons resulting from an interplay among these quantities. Second, despite dopant concentrations and surface state densities differing by many orders of magnitude between the two materials, their carrier dynamics, measured by photoexcited band bending and filling of surface states, occur at a seemingly common timescale of about 100 ps. This observation may indicate fundamental kinetic limits tied to a multitude of material and surface properties of optoelectronic III-V semiconductors and highlights the need for techniques that simultaneously measure electrooptical kinetic properties.

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Scanning ultrafast electron microscopy reveals photovoltage dynamics at a deeply buried p-Si/Si O2 interface

Physical Review B

Ellis, S.R.; Bartelt, Norman C.; Leonard, Francois; Celio, K.C.; Fuller, Elliot J.; Hughart, David R.; Garland, D.; Marinella, Matthew; Michael, Joseph R.; Chandler, David W.; Liao, B.; Talin, Albert A.

The understanding and control of charge carrier interactions with defects at buried insulator/semiconductor interfaces is essential for achieving optimum performance in modern electronics. Here, we report on the use of scanning ultrafast electron microscopy (SUEM) to remotely probe the dynamics of excited carriers at a Si surface buried below a thick thermal oxide. Our measurements illustrate a previously unidentified SUEM contrast mechanism, whereby optical modulation of the space-charge field in the semiconductor modulates the electric field in the thick oxide, thus affecting its secondary electron yield. By analyzing the SUEM contrast as a function of time and laser fluence we demonstrate the diffusion mediated capture of excited carriers by interfacial traps.

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Ultrafast Electron Microscopy for Spatial-Temporal Mapping of Charge Carriers

Ellis, Scott R.; Chandler, David W.; Michael, Joseph R.; Nakakura, Craig Y.

This LDRD supported efforts to significantly advance the scanning ultrafast electron microscope (SUEM) for spatial-temporal mapping of charge carrier dynamics in semiconductor materials and microelectronic devices. Sandia's SUEM capability in Livermore, CA, was built and demonstrated with previous LDRD funding; however, the stability and usability of the tool limited the throughput for analyzing samples. A new laser alignment strategy improved the stability of the SUEM, and the design and characterization of a new micro-channel plate (MCP)- based detector improved the signal-to-noise of the SUEM signal detection. These enhancements to the SUEM system improved throughput by over two orders of magnitude (before, a single time series of SUEM measurements would take several days to several weeks to acquire; now, the same measurements can be completed in~90 minutes in an automated fashion). The SUEM system can now be routinely used as an analytical instrument and will be a central part of several multi-year projects starting in FY22.

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Development and Use of an Ultra-High Resolution Electron Scattering Apparatus

Frank, Jonathan H.; Bays, Nathan R.; Jana, Irina; Huang, Erxiong; Chandler, David W.

In this LDRD project, we developed a versatile capability for high-resolution measurements of electron scattering processes in gas-phase molecules, such as ionization, dissociation, and electron attachment/detachment. This apparatus is designed to advance fundamental understanding of these processes and to inform predictions of plasmas associated with applications such as plasma-assisted combustion, neutron generation, re-entry vehicles, and arcing that are critical to national security. We use innovative coupling of electron-generation and electron-imaging techniques that leverages Sandia’s expertise in ion/electron imaging methods. Velocity map imaging provides a measure of the kinetic energies of electrons or ion products from electron scattering in an atomic or molecular beam. We designed, constructed, and tested the apparatus. Tests include dissociative electron attachment to O2 and SO2, as well as a new method for studying laser-initiated plasmas. This capability sets the stage for new studies in dynamics of electron scattering processes, including scattering from excited-state atoms and molecules.

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Thermal Infrared Detectors: expanding performance limits using ultrafast electron microscopy

Talin, Albert A.; Ellis, Scott; Bartelt, Norman C.; Leonard, Francois; Perez, Christopher; Celio, Km; Fuller, Elliot J.; Hughart, David R.; Garland, D.; Marinella, Matthew; Michael, Joseph R.; Chandler, David W.; Young, Steve; Smith, Sean; Kumar, Suhas

This project aimed to identify the performance-limiting mechanisms in mid- to far infrared (IR) sensors by probing photogenerated free carrier dynamics in model detector materials using scanning ultrafast electron microscopy (SUEM). SUEM is a recently developed method based on using ultrafast electron pulses in combination with optical excitations in a pump- probe configuration to examine charge dynamics with high spatial and temporal resolution and without the need for microfabrication. Five material systems were examined using SUEM in this project: polycrystalline lead zirconium titanate (a pyroelectric), polycrystalline vanadium dioxide (a bolometric material), GaAs (near IR), InAs (mid IR), and Si/SiO 2 system as a prototypical system for interface charge dynamics. The report provides detailed results for the Si/SiO 2 and the lead zirconium titanate systems.

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Development of New Experimental Methods for Correlated Operando Surface/Gas Characterization

Kliewer, Christopher J.; El Gabaly, Farid; Bays, Nathan R.; Chandler, David W.; Bartelt, Norman C.; Cauduro, Andre L.F.

The predictive understanding of catalytic surface reactions requires accurate microkinetic models, and while decades of work has been devoted to the elucidation of the reaction steps in these models, many open questions remain. One key issue is a lack of approaches enabling the local spatially resolved assessment of catalytic activity over a surface. In this report, we detail efforts to develop a new diagnostic approach to solve this problem. The approach is based upon laser resonance enhanced multiphoton ionization of reaction products emitted into the gas phase followed by spatially resolved imaging of the resultant ions or electrons. Ion imaging is pursued with a velocity-selected spatially resolved ion imaging microscope, while electron imaging was attempted in a low energy electron microscope. Successful demonstration of the ion imaging microscope coupled with the development of transport simulations shows promise for a revolutionary new tool to assess local catalytic activity

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Alignment and dissociation of electronically excited molecular hydrogen with intense laser fields

Molecular Physics

Fournier, Martin; Casey, Tiernan A.; Chandler, David W.; Lopez, Gary V.; Spiliotis, Alexandros K.; Rakitzis, T.P.

The dissociation of aligned, electronically excited H2 (E,F (Formula presented.)), followed by the ionisation of the produced H atom, is analysed via the velocity mapped imaging technique. The dissociation and ionisation processes are accomplished, respectively, by a two- and a one-photon absorption from a single 532-nm laser pulse, while the alignment is induced by a separate 1064-nm laser pulse. The velocity of the produced H+ photofragments shows a weak perpendicular alignment at low alignment laser field values, evolving to strongly parallel for larger fields. We modelled this alignment behaviour with a simple two-state model involving the Stark mixing of the initially-prepared J = 0 with the J = 2 rotational state. This model is able to reproduce all of the observed angular distribution and permits us to extract from the fit the polarisability anisotropy of H2 (E,F) electronic state. We determine this value to be (3.7 ± 1.2) × 103 a.u. As this value is extremely large in comparison to what one would expect from the pure H2 (E,F) electronic state, we hypothesise that this value comes from the 1064-nm laser beam mixing nearby electronic states with the initially laser prepared (E,F) state generating a mixed state (EF**) with an extremely large polarisability anisotropy.

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Perspective: Advanced particle imaging

Journal of Chemical Physics

Chandler, David W.

Since the first ion imaging experiment [D. W. Chandler and P. L. Houston, J. Chem. Phys. 87, 1445-1447 (1987)], demonstrating the capability of collecting an image of the photofragments from a unimolecular dissociation event and analyzing that image to obtain the three-dimensional velocity distribution of the fragments, the efficacy and breadth of application of the ion imaging technique have continued to improve and grow. With the addition of velocity mapping, ion/electron centroiding, and slice imaging techniques, the versatility and velocity resolution have been unmatched. Recent improvements in molecular beam, laser, sensor, and computer technology are allowing even more advanced particle imaging experiments, and eventually we can expect multi-mass imaging with co-variance and full coincidence capability on a single shot basis with repetition rates in the kilohertz range. This progress should further enable “complete” experiments - the holy grail of molecular dynamics - where all quantum numbers of reactants and products of a bimolecular scattering event are fully determined and even under our control.

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Alignment of the hydrogen molecule under intense laser fields

Journal of Chemical Physics

Chandler, David W.; Fournier, Martin; Lopez, Gary V.

Alignment of the electronically excited E,F state of the H2 molecule is studied using the velocity mapping imaging technique. Photofragment images of H+ due to the dissociation mechanism that follows the 2-photon excitation into the (E,F; ν = 0, J = 0) electronic state show a strong dependence on laser intensity, which is attributed to the high polarizability anisotropy of the H2 (E,F) state. We observe a marked structure in the angular distribution, which we explain as the interference between the prepared J = 0 and Stark-mixed J = 2 rovibrational states of H2, as the laser intensity increases. Quantification of these effects allows us to extract the polarizability anisotropy of the H2 (E,F J = 0) state yielding a value of 312 ± 82 a.u. (46 Å3). By comparison, CS2 has 10 Å3, I2 has 7 Å3, and hydrochlorothiazide (C7H8ClN3O4S2) has about 25 Å3 meaning that we have created the most easily aligned molecule ever measured, by creating a mixed superposition state that is highly anisotropic in its polarizability.

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Results 1–25 of 49
Results 1–25 of 49
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