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Tunable stochastic memristors for energy-efficient encryption and computing

Nature Communications

Kumar, Suhas K.; Woo, Kyung S.; Han, Janguk; Yi, Su I.; Thomas, Luke; Park, Hyungjun; Hwang, Cheol S.

Information security and computing, two critical technological challenges for post-digital computation, pose opposing requirements – security (encryption) requires a source of unpredictability, while computing generally requires predictability. Each of these contrasting requirements presently necessitates distinct conventional Si-based hardware units with power-hungry overheads. This work demonstrates Cu0.3Te0.7/HfO2 (‘CuTeHO’) ion-migration-driven memristors that satisfy the contrasting requirements. Under specific operating biases, CuTeHO memristors generate truly random and physically unclonable functions, while under other biases, they perform universal Boolean logic. Using these computing primitives, this work experimentally demonstrates a single system that performs cryptographic key generation, universal Boolean logic operations, and encryption/decryption. Circuit-based calculations reveal the energy and latency advantages of the CuTeHO memristors in these operations. This work illustrates the functional flexibility of memristors in implementing operations with varying component-level requirements.

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Electro-Thermal Characterization of Dynamical VO2 Memristors via Local Activity Modeling

Advanced Materials

Brown, Timothy D.; Bohaichuk, Stephanie M.; Islam, Mahnaz; Kumar, Suhas K.; Pop, Eric; Williams, R.S.

Translating the surging interest in neuromorphic electronic components, such as those based on nonlinearities near Mott transitions, into large-scale commercial deployment faces steep challenges in the current lack of means to identify and design key material parameters. These issues are exemplified by the difficulties in connecting measurable material properties to device behavior via circuit element models. Here, the principle of local activity is used to build a model of VO2/SiN Mott threshold switches by sequentially accounting for constraints from a minimal set of quasistatic and dynamic electrical and high-spatial-resolution thermal data obtained via in situ thermoreflectance mapping. By combining independent data sets for devices with varying dimensions, the model is distilled to measurable material properties, and device scaling laws are established. The model can accurately predict electrical and thermal conductivities and capacitances and locally active dynamics (especially persistent spiking self-oscillations). The systematic procedure by which this model is developed has been a missing link in predictively connecting neuromorphic device behavior with their underlying material properties, and should enable rapid screening of material candidates before employing expensive manufacturing processes and testing procedures.

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Intrinsic and Extrinsic Factors Influencing the Dynamics of VO2 Mott Oscillators

Physical Review Applied

Kumar, Suhas K.; Bohaichuk, Stephanie M.

Oscillatory devices have gained significant interest recently as key components of computing systems based on biomimetic neuronal spiking. An understanding of the time scales underlying the spiking is essential for engineering fast, controllable, low energy devices. However, we find that the intrinsic dynamics of these devices are difficult to properly characterize, as they can be heavily influenced by the external circuitry used to measure them. Here we demonstrate these challenges using a VO2 Mott oscillator with a sub-100 nm effective size, achieved using a nanogap cut in a metallic carbon nanotube electrode. Given the nanoscale thermal volume of this device, it would be expected to exhibit rapid oscillations. However, due to external parasitics present within commonly used current sources, we see orders of magnitude slower dynamics. Here, we outline methods for determining when measurements are dominated by extrinsic factors and discuss the operating conditions under which intrinsic oscillation frequencies may be observed.

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Dominant Energy Carrier Transitions and Thermal Anisotropy in Epitaxial Iridium Thin Films

Advanced Functional Materials

Perez, Christopher P.; Jog, Atharv; Kwon, Heungdong; Gall, Daniel; Asheghi, Mehdi; Kumar, Suhas K.; Park, Woosung; Goodson, Kenneth E.

High aspect ratio metal nanostructures are commonly found in a broad range of applications such as electronic compute structures and sensing. The self-heating and elevated temperatures in these structures, however, pose a significant bottleneck to both the reliability and clock frequencies of modern electronic devices. Any notable progress in energy efficiency and speed requires fundamental and tunable thermal transport mechanisms in nanostructured metals. In this work, time-domain thermoreflectance is used to expose cross-plane quasi-ballistic transport in epitaxially grown metallic Ir(001) interposed between Al and MgO(001). Thermal conductivities ranges from roughly 65 (96 in-plane) to 119 (122 in-plane) W m−1 K−1 for 25.5–133.0 nm films, respectively. Further, low defects afforded by epitaxial growth are suspected to allow the observation of electron–phonon coupling effects in sub-20 nm metals with traditionally electron-mediated thermal transport. Via combined electro-thermal measurements and phenomenological modeling, the transition is revealed between three modes of cross-plane heat conduction across different thicknesses and an interplay among them: electron dominant, phonon dominant, and electron–phonon energy conversion dominant. The results substantiate unexplored modes of heat transport in nanostructured metals, the insights of which can be used to develop electro-thermal solutions for a host of modern microelectronic devices and sensing structures.

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Thermal Infrared Detectors: expanding performance limits using ultrafast electron microscopy

Talin, A.A.; Ellis, Scott; Bartelt, Norman C.; Leonard, Francois L.; Perez, Christopher P.; Celio, Km; Fuller, Elliot J.; Hughart, David R.; Garland, Diana; Marinella, Matthew J.; Michael, Joseph R.; Chandler, D.W.; Young, Steve M.; Smith, Sean M.; Kumar, Suhas K.

This project aimed to identify the performance-limiting mechanisms in mid- to far infrared (IR) sensors by probing photogenerated free carrier dynamics in model detector materials using scanning ultrafast electron microscopy (SUEM). SUEM is a recently developed method based on using ultrafast electron pulses in combination with optical excitations in a pump- probe configuration to examine charge dynamics with high spatial and temporal resolution and without the need for microfabrication. Five material systems were examined using SUEM in this project: polycrystalline lead zirconium titanate (a pyroelectric), polycrystalline vanadium dioxide (a bolometric material), GaAs (near IR), InAs (mid IR), and Si/SiO 2 system as a prototypical system for interface charge dynamics. The report provides detailed results for the Si/SiO 2 and the lead zirconium titanate systems.

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Energy Efficient Computing R&D Roadmap Outline for Automated Vehicles

Aitken, Rob; Nakahira, Yorie; Strachan, John P.; Bresniker, Kirk; Young, Ian; Li, Zhiyong L.; Klebanoff, Leonard E.; Burchard, Carrie L.; Kumar, Suhas K.; Marinella, Matthew J.; Severa, William M.; Talin, A.A.; Vineyard, Craig M.; Mailhiot, Christian M.; Dick, Robert; Lu, Wei; Mogill, Jace

Automated vehicles (AV) hold great promise for improving safety, as well as reducing congestion and emissions. In order to make automated vehicles commercially viable, a reliable and highperformance vehicle-based computing platform that meets ever-increasing computational demands will be key. Given the state of existing digital computing technology, designers will face significant challenges in meeting the needs of highly automated vehicles without exceeding thermal constraints or consuming a large portion of the energy available on vehicles, thus reducing range between charges or refills. The accompanying increases in energy for AV use will place increased demand on energy production and distribution infrastructure, which also motivates increasing computational energy efficiency.

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7 Results
7 Results