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Vector-Matrix Multiplication Engine for Neuromorphic Computation with a CBRAM Crossbar Array [Slides]

Tolleson, Blayne; Marinella, Matthew; Bennett, Christopher H.; Barnaby, Hugh; Wilson, Donald; Short, Jesse C.

The core function of many neural network algorithms is the dot product, or vector matrix multiply (VMM) operation. Crossbar arrays utilizing resistive memory elements can reduce computational energy in neural algorithms by up to five orders of magnitude compared to conventional CPUs. Moving data between a processor, SRAM, and DRAM dominates energy consumption. By utilizing analog operations to reduce data movement, resistive memory crossbars can enable processing of large amounts of data at lower energy than conventional memory architectures.

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Purely Spintronic Leaky Integrate-and-Fire Neurons

Proceedings - IEEE International Symposium on Circuits and Systems

Brigner, Wesley H.; Hassan, Naimul; Hu, Xuan; Bennett, Christopher H.; Garcia-Sanchez, Felipe; Marinella, Matthew; Incorvia, Jean A.C.; Friedman, Joseph S.

Neuromorphic computing promises revolutionary improvements over conventional systems for applications that process unstructured information. To fully realize this potential, neuromorphic systems should exploit the biomimetic behavior of emerging nanodevices. In particular, exceptional opportunities are provided by the non-volatility and analog capabilities of spintronic devices. While spintronic devices that emulate neurons have been previously proposed, they require complementary metal-oxide semiconductor (CMOS) technology to function. In turn, this significantly increases the power consumption, fabrication complexity, and device area of a single neuron. This work reviews three previously proposed CMOS-free spintronic neurons designed to resolve this issue.

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Analog Neural Network Inference Accuracy in One-Selector One-Resistor Memory Arrays

Proceedings - 2022 IEEE International Conference on Rebooting Computing, ICRC 2022

Xiao, T.P.; Bennett, Christopher H.; Wilson, Donald E.; Feinberg, Benjamin M.; Agarwal, Sapan; Marinella, Matthew

Non-volatile memory arrays require select devices to ensure accurate programming. The one-selector one-resistor (1S1R) array where a two-terminal nonlinear select device is placed in series with a resistive memory element is attractive due to its high-density data storage; however, the effect of the nonlinear select device on the accuracy of analog in-memory computing has not been explored. This work evaluates the impact of select and memory device properties on the results of analog matrix-vector multiplications. We integrate nonlinear circuit simulations into CrossSim and perform end-to-end neural network inference simulations to study how the select device affects the accuracy of neural network inference. We propose an adjustment to the input voltage that can effectively compensate for the electrical load of the select device. Our results show that for deep residual networks trained on CIFAR-10, a compensation that is uniform across all devices in the system can mitigate these effects over a wide range of values for the select device I-V steepness and memory device On/Off ratio. A realistic I-V curve steepness of 60 mV/dec can yield an accuracy on CIFAR-10 that is within 0.44% of the floating-point accuracy.

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Analysis and mitigation of parasitic resistance effects for analog in-memory neural network acceleration

Semiconductor Science and Technology

Xiao, T.P.; Feinberg, Benjamin M.; Rohan, Jacob N.; Bennett, Christopher H.; Agarwal, Sapan; Marinella, Matthew

To support the increasing demands for efficient deep neural network processing, accelerators based on analog in-memory computation of matrix multiplication have recently gained significant attention for reducing the energy of neural network inference. However, analog processing within memory arrays must contend with the issue of parasitic voltage drops across the metal interconnects, which distort the results of the computation and limit the array size. This work analyzes how parasitic resistance affects the end-to-end inference accuracy of state-of-the-art convolutional neural networks, and comprehensively studies how various design decisions at the device, circuit, architecture, and algorithm levels affect the system's sensitivity to parasitic resistance effects. A set of guidelines are provided for how to design analog accelerator hardware that is intrinsically robust to parasitic resistance, without any explicit compensation or re-training of the network parameters.

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A domain wall-magnetic tunnel junction artificial synapse with notched geometry for accurate and efficient training of deep neural networks

Applied Physics Letters

Liu, Samuel; Xiao, T.P.; Cui, Can; Incorvia, Jean A.C.; Bennett, Christopher H.; Marinella, Matthew

Inspired by the parallelism and efficiency of the brain, several candidates for artificial synapse devices have been developed for neuromorphic computing, yet a nonlinear and asymmetric synaptic response curve precludes their use for backpropagation, the foundation of modern supervised learning. Spintronic devices - which benefit from high endurance, low power consumption, low latency, and CMOS compatibility - are a promising technology for memory, and domain-wall magnetic tunnel junction (DW-MTJ) devices have been shown to implement synaptic functions such as long-term potentiation and spike-timing dependent plasticity. In this work, we propose a notched DW-MTJ synapse as a candidate for supervised learning. Using micromagnetic simulations at room temperature, we show that notched synapses ensure the non-volatility of the synaptic weight and allow for highly linear, symmetric, and reproducible weight updates using either spin transfer torque (STT) or spin-orbit torque (SOT) mechanisms of DW propagation. We use lookup tables constructed from micromagnetics simulations to model the training of neural networks built with DW-MTJ synapses on both the MNIST and Fashion-MNIST image classification tasks. Accounting for thermal noise and realistic process variations, the DW-MTJ devices achieve classification accuracy close to ideal floating-point updates using both STT and SOT devices at room temperature and at 400 K. Our work establishes the basis for a magnetic artificial synapse that can eventually lead to hardware neural networks with fully spintronic matrix operations implementing machine learning.

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Heavy-Ion-Induced Displacement Damage Effects in Magnetic Tunnel Junctions with Perpendicular Anisotropy

IEEE Transactions on Nuclear Science

Xiao, T.P.; Bennett, Christopher H.; Mancoff, Frederick B.; Manuel, Jack; Hughart, David R.; Jacobs-Gedrim, Robin B.; Bielejec, Edward S.; Vizkelethy, Gyorgy; Sun, Jijun; Aggarwal, Sanjeev; Arghavani, Reza; Marinella, Matthew

We evaluate the resilience of CoFeB/MgO/CoFeB magnetic tunnel junctions (MTJs) with perpendicular magnetic anisotropy (PMA) to displacement damage induced by heavy-ion irradiation. MTJs were exposed to 3-MeV Ta2+ ions at different levels of ion beam fluence spanning five orders of magnitude. The devices remained insensitive to beam fluences up to $10^{11}$ ions/cm2, beyond which a gradual degradation in the device magnetoresistance, coercive magnetic field, and spin-transfer-torque (STT) switching voltage were observed, ending with a complete loss of magnetoresistance at very high levels of displacement damage (>0.035 displacements per atom). The loss of magnetoresistance is attributed to structural damage at the MgO interfaces, which allows electrons to scatter among the propagating modes within the tunnel barrier and reduces the net spin polarization. Ion-induced damage to the interface also reduces the PMA. This study clarifies the displacement damage thresholds that lead to significant irreversible changes in the characteristics of STT magnetic random access memory (STT-MRAM) and elucidates the physical mechanisms underlying the deterioration in device properties.

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Ionizing Radiation Effects in SONOS-Based Neuromorphic Inference Accelerators

IEEE Transactions on Nuclear Science

Xiao, T.P.; Bennett, Christopher H.; Agarwal, Sapan; Hughart, David R.; Barnaby, Hugh J.; Puchner, Helmut; Prabhakar, Venkatraman; Talin, Albert A.; Marinella, Matthew

We evaluate the sensitivity of neuromorphic inference accelerators based on silicon-oxide-nitride-oxide-silicon (SONOS) charge trap memory arrays to total ionizing dose (TID) effects. Data retention statistics were collected for 16 Mbit of 40-nm SONOS digital memory exposed to ionizing radiation from a Co-60 source, showing good retention of the bits up to the maximum dose of 500 krad(Si). Using this data, we formulate a rate-equation-based model for the TID response of trapped charge carriers in the ONO stack and predict the effect of TID on intermediate device states between 'program' and 'erase.' This model is then used to simulate arrays of low-power, analog SONOS devices that store 8-bit neural network weights and support in situ matrix-vector multiplication. We evaluate the accuracy of the irradiated SONOS-based inference accelerator on two image recognition tasks - CIFAR-10 and the challenging ImageNet data set - using state-of-the-art convolutional neural networks, such as ResNet-50. We find that across the data sets and neural networks evaluated, the accelerator tolerates a maximum TID between 10 and 100 krad(Si), with deeper networks being more susceptible to accuracy losses due to TID.

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In situ Parallel Training of Analog Neural Network Using Electrochemical Random-Access Memory

Frontiers in Neuroscience (Online)

Talin, Albert A.; Li, Yiyang; Fuller, Elliot J.; Bennett, Christopher H.; Xiao, T.P.; Salleo, Alberto; Melianas, Armantas; Isele, Erik; Marinella, Matthew; Tao, Hanbo

In-memory computing based on non-volatile resistive memory can significantly improve the energy efficiency of artificial neural networks. However, accurate in situ training has been challenging due to the nonlinear and stochastic switching of the resistive memory elements. One promising analog memory is the electrochemical random-access memory (ECRAM), also known as the redox transistor. Its low write currents and linear switching properties across hundreds of analog states enable accurate and massively parallel updates of a full crossbar array, which yield rapid and energy-efficient training. While simulations predict that ECRAM based neural networks achieve high training accuracy at significantly higher energy efficiency than digital implementations, these predictions have not been experimentally achieved. In this work, we train a 3 × 3 array of ECRAM devices that learns to discriminate several elementary logic gates (AND, OR, NAND). We record the evolution of the network’s synaptic weights during parallel in situ (on-line) training, with outer product updates. Due to linear and reproducible device switching characteristics, our crossbar simulations not only accurately simulate the epochs to convergence, but also quantitatively capture the evolution of weights in individual devices. The implementation of the first in situ parallel training together with strong agreement with simulation results provides a significant advance toward developing ECRAM into larger crossbar arrays for artificial neural network accelerators, which could enable orders of magnitude improvements in energy efficiency of deep neural networks.

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Controllable Reset Behavior in Domain Wall-Magnetic Tunnel Junction Artificial Neurons for Task-Adaptable Computation

IEEE Magnetics Letters

Liu, Samuel; Bennett, Christopher H.; Friedman, Joseph; Marinella, Matthew; Paydarfar, David; Incorvia, Jean A.

Neuromorphic computing with spintronic devices has been of interest due to the limitations of CMOS-driven von Neumann computing. Domain wall-magnetic tunnel junction (DW-MTJ) devices have been shown to be able to intrinsically capture biological neuron behavior. Edgy-relaxed behavior, where a frequently firing neuron experiences a lower action potential threshold, may provide additional artificial neuronal functionality when executing repeated tasks. In this letter, we demonstrate that this behavior can be implemented in DW-MTJ artificial neurons via three alternative mechanisms: shape anisotropy, magnetic field, and current-driven soft reset. Using micromagnetics and analytical device modeling to classify the Optdigits handwritten digit dataset, we show that edgy-relaxed behavior improves both classification accuracy and classification rate for ordered datasets while sacrificing little to no accuracy for a randomized dataset. This letter establishes methods by which artificial spintronic neurons can be flexibly adapted to datasets.

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Filament-Free Bulk Resistive Memory Enables Deterministic Analogue Switching

Advanced Materials

Talin, Albert A.; Fuller, Elliot J.; Li, Yiyang; Marinella, Matthew; Sugar, Joshua D.; Bennett, Christopher H.; Bartsch, Michael S.; Horton, Robert D.; Yoo, Sangmin; Ashby, David S.; Lu, Edwin

Digital computing is nearing its physical limits as computing needs and energy consumption rapidly increase. Analogue-memory-based neuromorphic computing can be orders of magnitude more energy efficient at data-intensive tasks like deep neural networks, but has been limited by the inaccurate and unpredictable switching of analogue resistive memory. Filamentary resistive random access memory (RRAM) suffers from stochastic switching due to the random kinetic motion of discrete defects in the nanometer-sized filament. In this work, this stochasticity is overcome by incorporating a solid electrolyte interlayer, in this case, yttria-stabilized zirconia (YSZ), toward eliminating filaments. Filament-free, bulk-RRAM cells instead store analogue states using the bulk point defect concentration, yielding predictable switching because the statistical ensemble behavior of oxygen vacancy defects is deterministic even when individual defects are stochastic. Both experiments and modeling show bulk-RRAM devices using TiO2-X switching layers and YSZ electrolytes yield deterministic and linear analogue switching for efficient inference and training. Bulk-RRAM solves many outstanding issues with memristor unpredictability that have inhibited commercialization, and can, therefore, enable unprecedented new applications for energy-efficient neuromorphic computing. Beyond RRAM, this work shows how harnessing bulk point defects in ionic materials can be used to engineer deterministic nanoelectronic materials and devices.

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Results 26–50 of 95
Results 26–50 of 95
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