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Hollowell, Andrew E. ; Arrington, Christian L. ; Coleman, Jonathan J. ; Finnegan, Patrick S. ; Rowen, Adam M. ; Dagel, Amber L.
Jimenez, Edward S. ; Dagel, Amber L.
Maunz, Peter L. ; Hollowell, Andrew E. ; Lobser, Daniel L. ; Nordquist, Christopher N. ; Benito, Francisco M. ; Clark, Craig R. ; Clark, Susan M. ; Colombo, Anthony P. ; Fortier, Kevin M. ; Haltli, Raymond A. ; Heller, Edwin J. ; Resnick, Paul J. ; Rembetski, John F. ; Sterk, Jonathan D. ; Stick, Daniel L. ; Tabakov, Boyan T. ; Tigges, Chris P. ; Van Der Wall, Jay W. ; Dagel, Amber L. ; Blain, Matthew G. ; Scrymgeour, David S.
Hollowell, Andrew E. ; Arrington, Christian L. ; Coleman, Jonathan J. ; Finnegan, Patrick S. ; Rowen, Adam M. ; Dagel, Amber L.
Maunz, Peter L. ; Benito, Francisco M. ; Berry, Christopher W. ; Blain, Matthew G. ; Haltli, Raymond A. ; Clark, Craig R. ; Clark, Susan M. ; Heller, Edwin J. ; Hollowell, Andrew E. ; Mizrahi, Jonathan; Nordquist, Christopher N. ; Resnick, Paul J. ; Rembetski, John F. ; Scrymgeour, David S. ; Sterk, Jonathan D. ; Tabakov, Boyan T. ; Tigges, Chris P. ; Van Der Wall, Jay W. ; Dagel, Amber L.
Smith, Collin S. ; Birch, Gabriel C. ; Dagel, Amber L.
Schwindt, Peter S. ; Colombo, Anthony P. ; Jau, Yuan-Yu J. ; Carter, T.R. ; Dagel, Amber L. ; Berry, Christopher W. ; Weisend, Michael; Mckay, Jim
Proceedings of SPIE - The International Society for Optical Engineering
Jimenez, Edward S. ; Dagel, Amber L.
This position paper describes a potential implementation of a large-scale grating-based X-ray Phase Contrast Imaging System (XPCI) simulation tool along with the associated challenges in its implementation. This work proposes an implementation based off of an implementation by Peterzol et. al. where each grating is treated as an object imaged in the field-of-view. Two main challenges exist; the first, is the required sampling and information management in object space due to the micron-scale periods of each grating propagating over significant distances. The second is maintaining algorithmic numerical stability for imaging systems relevant to industrial applications. We present preliminary results for a numerical stability study using a simplified algorithm that performs Talbot imaging in a big-data context.
Colombo, Anthony P. ; Schwindt, Peter S. ; Jau, Yuan-Yu J. ; Johnson, Cort; Dagel, Amber L. ; Mckay, Jim; Weisend, Michael
Schwindt, Peter S. ; Colombo, Anthony P. ; Jau, Yuan-Yu J. ; Carter, T.R. ; Dagel, Amber L. ; Weisend, Michael; Mckay, James
Schwindt, Peter S. ; Colombo, Anthony P. ; Jau, Yuan-Yu J. ; Carter, T.R. ; Dagel, Amber L. ; Weisend, Michael; Mckay, James
Maunz, Peter L. ; Blain, Matthew G. ; Dagel, Amber L. ; Tigges, Chris P. ; Stick, Daniel L.
Maunz, Peter L. ; Heller, Edwin J. ; Hollowell, Andrew E. ; Kemme, S.A. ; Loviza, Becky G. ; Mizrahi, Jonathan A. ; Ortega, Anathea C. ; Scrymgeour, David S. ; Sterk, Jonathan D. ; Tigges, Chris P. ; Dagel, Amber L. ; Clark, Craig R. ; Stick, Daniel L. ; Blain, Matthew G. ; Clark, Susan M. ; Resnick, Paul J. ; Arrington, Christian L. ; Benito, Francisco M. ; Boye, Robert B. ; Ellis, A.R. ; Haltli, Raymond A.
Ellis, A.R. ; Dagel, Amber L. ; Scrymgeour, David S. ; Wendt, J.R. ; Carter, T.R. ; Samora, S. ; Kemme, S.A.
Dagel, Amber L. ; Kemme, S.A. ; Wendt, J.R. ; Carter, T.R. ; Samora, S.
Kemme, S.A. ; Dagel, Amber L. ; Ellis, A.R. ; Wendt, J.R. ; Carter, T.R. ; Samora, S.
Dagel, Amber L. ; Kemme, S.A. ; Ellis, A.R. ; Wendt, J.R. ; Carter, T.R. ; Samora, S.
Parazzoli, Lambert P. ; Schwindt, Peter S. ; Biedermann, Grant B. ; Landahl, Andrew J. ; Chou, Chin-wen C. ; Jau, Yuan-Yu J. ; Hankin, Aaron M. ; Burns, George B. ; Johnson, Cort N. ; Kemme, S.A. ; Dagel, Amber L. ; Mangan, Michael M.
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