Focused Ion Beam Nano-thermometry Deitz, Julia D.; Hodges, Wyatt L.; Ruggles, Timothy R.; Jauregui, Luis J.; Perry, Daniel L.; Williard, John; Lam, Nhu; Rosenberg, Samantha; Boro, Joseph Abstract not provided. More Details TYPE Conference Presenation YEAR 2023 DOIOSTI
Molten Sodium Batteries: Lewis Acidity of AlCl3/NaI Catholyte Impedes NaSICON Interface Laros, James H.; Percival, Stephen P.; Peretti, Amanda S.; Meserole, Stephen M.; Lee, Rose Y.; Williard, John; Spoerke, Erik D.; Small, Leo J. Abstract not provided. More Details TYPE Conference Presenation YEAR 2023 DOIOSTI
Keep It Lewis-Basic: Stability of NaSICON Separators in AlCl3-NaI Catholytes for Molten Sodium Batteries Maraschky, Adam M.; Laros, James H.; Percival, Stephen P.; Peretti, Amanda S.; Lowry, Daniel R.; Meserole, Stephen M.; Lee, Rose Y.; Williard, John; Spoerke, Erik D.; Small, Leo J. Abstract not provided. More Details TYPE Conference Presenation YEAR 2023 DOIOSTI
Microstructural Characterization of Electron Beam Additively Manufactured (EBAM) and Wire Arc Additively Manufactured (WAAM) Ti-6Al-4V Jauregui, Luis J.; Ruggles, Timothy R.; Boro, Joseph R.; Pegues, Jonathan W.; Sims, Hannah; Williard, John; Craig, Robert L. Abstract not provided. More Details TYPE Conference Poster YEAR 2023 DOIOSTI
Effect of Voltage Bias on SIR Measurements Grosso, Samuel; Fowler, James E.; Kottwitz, Matthew; Williard, John Abstract not provided. More Details TYPE Conference Paper YEAR 2022 OSTI
Effect of Bias Voltage on Surface Insulation Resistance Measurements Grosso, Samuel; Fowler, James E.; Kottwitz, Matthew; Williard, John Abstract not provided. More Details TYPE Conference Presenation YEAR 2022 DOIOSTI