Compound Semiconductor Integrated Photonics for Avionics
Abstract not provided.
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Jump to search filtersIntegrating III-V compound semiconductors with silicon for advanced multijunction solar cells
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Differential imaging microscope system acquisition software reference
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Differential Imaging Microscopy of Physicallyand Chemically Complex Surfaces Relevant to Materials Surveillance
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Differential imaging microscopy of physically complex surfaces undergoing atmospheric corrosion
NACE - International Corrosion Conference Series
Frequently, optical observation of component materials is the only viable technique to evaluate degradation processes in-situ. Unfortunately, due to the visually complex nature of many surfaces (e.g., scratches, occlusions, etc.), the degradation process, particularly at early stages, is difficult or impossible to resolve. As a result, studies are limited to evaluating degradation well after initiation has taken place. Thus, there is a need for a technique that could be implemented utilizing image processing that allows the de-convolution of changes due to the degradation process of interest from the background "noise". An automated differential imaging system was constructed for in-situ studies of both aqueous and atmospheric environments to fulfill this need. The basic functionality of the Differential imaging system was demonstrated on gold plated copper and gold /nickel plated copper coupons exposed to a sulfide containing atmosphere. © 2011 by NACE International.
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