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Publications / Conference Poster

Characterization and Impact of Atomic Imperfections in Si:P Materials and Devices

Schmucker, Scott W.; Anderson, Evan M.; Lucero, Joe A.; Bussmann, Ezra; Lu, Ping; Katzenmeyer, Aaron M.; Luk, Ting S.; Foulk, James W.; Tracy, Lisa A.; Lu, Tzu M.; Grine, Albert; Ward, Daniel R.; Campbell, Deanna M.; Gamache, Phillip; Gunter, Mathew; Misra, Shashank

Abstract not provided.