Characterization and Impact of Atomic Imperfections in Si:P Materials and Devices Schmucker, Scott W.; Anderson, Evan M.; Lucero, Joe A.; Bussmann, Ezra; Lu, Ping; Katzenmeyer, Aaron M.; Luk, Ting S.; Foulk, James W.; Tracy, Lisa A.; Lu, Tzu M.; Grine, Albert; Ward, Daniel R.; Campbell, Deanna M.; Gamache, Phillip; Gunter, Mathew; Misra, Shashank Abstract not provided. More Details TYPE Conference Poster YEAR 2019 OSTI