Nitride Memristors
Abstract not provided.
Publications
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Jump to search filtersPhase and texture evolution in solution deposited PZT thin films: formation and role of the Pt3Pb intermetallic phase
Journal of Applied Physics
Abstract not provided.
Friction-Induced Recrystallization and Grain Growth in Single Crystal FCC Metals
Abstract not provided.
Wear resistant electrically conductive gold matrix nanocomposites
Abstract not provided.
Investigation of d-ZrH1.66/a-Zr interface in Zr-based cladding materials with aberration-corrected scanning transmission microscopy
Abstract not provided.
State-of-the-art Microanalysis at the nm-scale and Smaller: Going from Pretty Pictures to Quantitative Analysis of Hyperspectral Data
Abstract not provided.
Silicon-Based Low-Dimensional Electronic Devices: Fabrication Characterization and their Physical Behavior in the Quantum Regime
Abstract not provided.
The Roles of Solution Chemistry Substrate and Pyrolysis Temperature on the Chemical Heterogeneity in PZT Films
Abstract not provided.
A study of initial hydrogen uptake in Zr-based cladding alloys
Transactions of the American Nuclear Society
Abstract not provided.
Silicon-Based Low-Dimensional Electronic Devices: Fabrication Characterization and their Physical Behavior in the Quantum Regime
Abstract not provided.
Nanosecond Pulsed Laser Irradiation of Stainless Steel 304L: Oxide Growth and Effects on Underlying Metal
Proposed for publication in Surface & Coatings Technology.
Abstract not provided.
Silicon-Based Low-Dimensional Electronic Devices: Fabrication Characterization and their Physical Behavior in the Quantum Regime
Abstract not provided.
Application of FIB/SEM/EDXS tomographic spectral imaging and multivariate statistical analysis to the analysis of localized corrosion
2012 IEEE Statistical Signal Processing Workshop, SSP 2012
Tomographic spectral imaging is a powerful technique for the 3D analysis of materials. The present work describes the application of this technique to the analysis of localized corrosion of a connector pin. Implemented via serial sectioning in a focused ion-beam/scanning electron microscope, electron-excited x-ray spectra were acquired from each voxel in a 3D array. The resultant tomographic spectral image was analyzed in its entirety with Sandia's Automated eXpert Spectral Image Analysis multivariate statistical analysis software. The result of the analysis is a small number of chemical components which describe the 3D phase distribution in the volume of material sampled. © 2012 IEEE.
High Resolution Lithium Mapping Using Fe State of Charge in Energy-Filtered TEM
Abstract not provided.
PPM Task 1 Direction
Abstract not provided.
Chemically Homogeneous Complex Oxide Thin Films via Improved Substrate Metallization
Abstract not provided.
Method for crosssectional analysis using FIB, ToFSIMS and multivariate analysis
Abstract not provided.
The roles of solution chemistry substrate and pyrolysis temperature on the chemical heterogeneity in PZT films
Abstract not provided.
Time-Resolved Chemical Mapping of Phase Transformations in Li-ion Battery Electrodes
Abstract not provided.
Chemically Homogeneous Complex Oxide Thin Films via Improved Substrate Metallization
Abstract not provided.
The Role of Adhesion Layer Material on Ferroelectric Response in PZT Thin Films
Abstract not provided.
Quantitative EDS Analysis of Nanometer-Scale Core/Shell Pd/Rh Structures
Abstract not provided.
Radiation Effects in TaOx Memristors
Abstract not provided.
Resistive Switching in Aluminum Nitride
Abstract not provided.
Synthesis of MoS2-Au nanocomposite films by sputter deposition
Abstract not provided.
Results 201–225 of 376