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2012 IEEE Statistical Signal Processing Workshop, SSP 2012
Kotula, Paul G.; Van Benthem, Mark V.; Sorensen, Neil R.
Tomographic spectral imaging is a powerful technique for the 3D analysis of materials. The present work describes the application of this technique to the analysis of localized corrosion of a connector pin. Implemented via serial sectioning in a focused ion-beam/scanning electron microscope, electron-excited x-ray spectra were acquired from each voxel in a 3D array. The resultant tomographic spectral image was analyzed in its entirety with Sandia's Automated eXpert Spectral Image Analysis multivariate statistical analysis software. The result of the analysis is a small number of chemical components which describe the 3D phase distribution in the volume of material sampled. © 2012 IEEE.
El Gabaly Marquez, Farid E.; Bartelt, Norman C.; Kotula, Paul G.; Fenton, Kyle R.; Sullivan, John P.
Hattar, Khalid M.; Zimmerman, Jonathan A.; Hale, Lucas M.; Kotula, Paul G.; Weinberger, Christopher R.
Ihlefeld, Jon I.; Kotula, Paul G.; Brennecka, Geoffrey L.; Gough, Dara G.; Spoerke, Erik D.; Lu, Ping L.; McKenzie, Bonnie B.; Rye, Michael J.
Ohlhausen, J.A.; Rye, Michael J.; Kotula, Paul G.; Michael, Joseph R.; Garino, Terry J.
Ihlefeld, Jon I.; Kotula, Paul G.; Brennecka, Geoffrey L.; Gough, Dara G.; Spoerke, Erik D.
Homer, Mark H.; Bartelt, Norman C.; Kotula, Paul G.
Thin Solid Films
Adams, D.P.; Rodriguez, Marko A.; Romero, Juan A.; Kotula, Paul G.; Banks, J.C.
High-purity, erbium hydride thin films have been deposited onto α-Al 2O 3 and oxidized Si by reactive sputtering methods. Rutherford backscattering spectrometry and elastic recoil detection show that films deposited at temperatures of 35, 150 and 275°C have a composition of 3H:1Er. Erbium trihydride films consist of a face-centered cubic erbium sub-lattice with a lattice parameter in the range of 5.11-5.20 Å. The formation of cubic ErH 3 is intriguing, because previous studies demonstrate a single trihydride phase with a hexagonal metal sub-lattice. The formation of a stable, cubic trihydride phase is attributed to a large, in-plane stress resulting from ion beam sputter deposition. © 2012 Elsevier B.V. All rights reserved.
Ihlefeld, Jon I.; Kotula, Paul G.; Gough, Dara G.; Lu, Ping L.; Spoerke, Erik D.; McKenzie, Bonnie B.; Rye, Michael J.; Brennecka, Geoffrey L.
Graham, Joseph G.; Small, Leo J.; Ihlefeld, Jon I.; Brennecka, Geoffrey L.; Kotula, Paul G.
Kotula, Paul G.; Robinson, David R.; Cappillino, Patrick C.
Dodd, Paul E.; Shaneyfelt, Marty R.; Bielejec, Edward S.; Kotula, Paul G.; Mickel, Patrick R.
Marinella, Matthew J.; Stevens, James E.; Akinnikawe, Erin M.; Kotula, Paul G.
Goeke, Ronald S.; Prasad, Somuri V.; Kotula, Paul G.
Energy Technology 2012: Carbon Dioxide Management and Other Technologies
Hattar, Khalid M.; Buchheit, Thomas E.; Kotula, Paul G.; Mcginnis, Alexander; Brewer, Luke
Understanding the effects of extensive radiation damage in structural metals provides necessary insight for predicting the performance of those metals considered for application in the extreme radiation environment. Predicting mechanical performance after long term radiation exposure is of great importance to extending the life of current nuclear reactors and for developing future materials for the next generation of reactors. A combination of finite element modeling, nanoindentation, and TEM characterization were used to rapidly determine the microstructure and mechanical properties influences of ion irradiation on a standard 316L stainless steel sample. The results of this study found that ion irradiation and small scale mechanical property testing can be used to characterize extensive levels of radiation damage structure, only when significant consideration is given to ion irradiation depth, surface roughness and polishing condition, the irradiation temperature, and.many other experimental parameters. © 2012 The Minerals, Metals, & Materials Society. All rights reserved.
Snow, Clark S.; Rodriguez, Marko A.; Wixom, Ryan R.; Schultz, Peter A.; Cowgill, D.F.; Kotula, Paul G.
Ihlefeld, Jon I.; Kotula, Paul G.; Brennecka, Geoffrey L.; McKenzie, Bonnie B.; Rye, Michael J.; Meyer, Kelsey M.
Kotula, Paul G.
Prasad, Somuri V.; Goeke, Ronald S.; Argibay, Nicolas A.; Kotula, Paul G.
Prasad, Somuri V.; Kotula, Paul G.
Hattar, Khalid M.; Boyce, Brad B.; Kotula, Paul G.; Buchheit, Thomas E.; Puskar, J.D.
Hattar, Khalid M.; Buchheit, Thomas E.; Kotula, Paul G.
Kotula, Paul G.; Robinson, David R.; Cappillino, Patrick C.
Kotula, Paul G.; Marinella, Matthew J.
Brennecka, Geoffrey L.; Kotula, Paul G.; Rye, Michael J.; McKenzie, Bonnie B.; Meyer, Kelsey M.
Results 201–225 of 363