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Corrosion Monitors for Embedded Evaluation

Robinson, Alex L.; Pfeifer, Kent B.; Casias, Adrian L.; Howell, Stephen W.; Sorensen, Neil R.; Missert, Nancy A.

We have developed and characterized novel in-situ corrosion sensors to monitor and quantify the corrosive potential and history of localized environments. Embedded corrosion sensors can provide information to aid health assessments of internal electrical components including connectors, microelectronics, wires, and other susceptible parts. When combined with other data (e.g. temperature and humidity), theory, and computational simulation, the reliability of monitored systems can be predicted with higher fidelity.

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TYPE SAND Report YEAR 2017
OSTIDOI

Characterization of fire hazards of aged photovoltaic balance-of-systems connectors

2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015

Schindelholz, Eric J.; Yang, Benjamin B.; Armijo, Kenneth M.; McKenzie, Bonnie B.; Taylor, Jason M.; Sorensen, Neil R.; Lavrova, Olga A.

Three balance of systems (BOS) connector designs common to industry were investigated as a means of assessing reliability from the perspective of arc fault risk. These connectors were aged in field and laboratory environments and performance data captured for future development of a reliability model. Comparison of connector resistance measured during damp heat, mixed flowing gas and field exposure in a light industrial environment indicated disparities in performance across the three designs. Performance was, in part, linked to materials of construction. A procedure was developed to evaluate new and aged connectors for arc fault risk and tested for one of the designs. Those connectors exposed to mixed flowing gas corrosion exhibited considerable Joule heating that may enhance arcing behavior, suggesting temperature monitoring as a potential method for arc fault prognostics. These findings, together with further characterization of connector aging, can provide operators of photovoltaic installations the information necessary to develop a data-driven approach to BOS connector maintenance as well as opportunities for arc fault prognostics.

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TYPE Conference Poster YEAR 2015
ScopusOSTI

PV Systems Reliability Final Technical Report

Lavrova, Olga A.; Flicker, Jack D.; Johnson, Jay; Armijo, Kenneth M.; Gonzalez, Sigifredo G.; Schindelholz, Eric J.; Sorensen, Neil R.; Yang, Ben Y.

The continued exponential growth of photovoltaic technologies paves a path to a solar-powered world, but requires continued progress toward low-cost, high-reliability, high-performance photovoltaic (PV) systems. High reliability is an essential element in achieving low-cost solar electricity by reducing operation and maintenance (O&M) costs and extending system lifetime and availability, but these attributes are difficult to verify at the time of installation. Utilities, financiers, homeowners, and planners are demanding this information in order to evaluate their financial risk as a prerequisite to large investments. Reliability research and development (R&D) is needed to build market confidence by improving product reliability and by improving predictions of system availability, O&M cost, and lifetime. This project is focused on understanding, predicting, and improving the reliability of PV systems. The two areas being pursued include PV arc-fault and ground fault issues, and inverter reliability.

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TYPE Other Report YEAR 2015
OSTIDOI

Arc fault risk assessment and degradation model development for photovoltaic connectors

2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014

Yang, Benjamin B.; Armijo, Kenneth M.; Harrison, Richard K.; Thomas, Kara E.; Johnson, Jay; Taylor, Jason M.; Sorensen, Neil R.

This work investigates balance of systems (BOS) connector reliability from the perspective of arc fault risk. Accelerated tests were performed on connectors for future development of a reliability model. Thousands of hours of damp heat and atmospheric corrosion tests found BOS connectors to be resilient to corrosion-related degradation. A procedure was also developed to evaluate new and aged connectors for arc fault risk. The measurements show that arc fault risk is dependent on a combination of materials composition as well as design geometry. Thermal measurements as well as optical emission spectroscopy were also performed to further characterize the arc plasma. Together, the degradation model, arc fault risk assessment technique, and characterization methods can provide operators of photovoltaic installations information necessary to develop a data-driven plan for BOS connector maintenance as well as identify opportunities for arc fault prognostics.

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TYPE Conference YEAR 2014
ScopusOSTIDOI
Results 1–25 of 63
Results 1–25 of 63