Publications

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Members of the Nuclear Criticality Safety (NCS) Program at Sandia National Laboratories (SNL) have updated the suite of benchmark problems developed to validate MCNP6 Version 2.0 for use in NCS applications. The updated NCS benchmark suite adds approximately 600 new benchmarks and includes peer review of all input files by two different NCS engineers (or one NCS engineer and one candidate NCS engineer). As with the originally released benchmark suite, the updated suite covers a broad range of fissile material types, material forms, moderators, reflectors, and neutron energy spectra. The benchmark suite provides a basis to establish a bias and bias uncertainty for use in NCS analyses at SNL.

Using a newly developed coupling of the ElectroMagnetic Plasma In Realistic Environments (EMPIRE) code with the Integrated Tiger Series (ITS) code, radiation environment calculations have been performed. The effort was completed as part of the Saturn Recapitalization (Recap) program that represents activities to upgrade and modernize the Saturn accelerator facility. The radiation environment calculations performed provide baseline results with current or planned hardware in the facility. As facility design changes are proposed and implemented as part of Saturn Recap, calculations of the radiation environment will be performed to understand how the changes impact the output of the Saturn accelerator.

The Saturn accelerator has historically lacked the capability to measure time-resolved spectra for its 3-ring bremsstrahlung x-ray source. This project aimed to create a spectrometer called AXIOM to provide this capability. The project had three major development pillars: hardware, simulation, and unfold code. The hardware consists of a ring of 24 detectors around an existing x-ray pinhole camera. The diagnostic was fielded on two shots at Saturn and over 100 shots at the TriMeV accelerator at Idaho Accelerator Center. A new Saturn x-ray environment simulation was created using measured data to validate. This simulation allows for timeresolved spectra computation to compare the experimental results. The AXIOM-Unfold code is a new parametric unfold code using modern global optimizers and uncertainty quantification. The code was written in Python, uses Gitlab version control and issue tracking, and has been developed with long term code support and maintenance in mind.

To understand the environment where a time-resolved hard x-ray spectrometer (AXIOM) might be fielded, experiments and simulations were performed to analyze the radiation dose environment underneath the Saturn vacuum dome. Knowledge of this environment is critical to the design and placement of the spectrometer. Experiments demonstrated that the machine performance, at least in terms of on-axis dose, has not significantly changed over the decades. Simulations of the off-axis dose were performed to identify possible spectrometer locations of interest. The effects from the source and dome hardware as well as source distributions and angles of incidence on the radiation environment were also investigated. Finally, a unified radiation transport model was developed for two widely used radiation transport codes to investigate the off-axis dose profiles and the time-dependent x-ray energy spectrum. The demonstrated equivalence of the unified radiation transport model between the radiation transport codes allows the team to tie future time-dependent x-ray environment calculations to previous integral simulations for the Saturn facility.

We present the technology-aided computer design (TCAD) device simulation and modeling of a silicon p-i-n diode for detecting time-dependent X-ray radiation. We show that the simulated forward and reverse breakdown current-voltage characteristics agree well with the measured data under nonradiation environment by only calibrating carrier lifetimes for the forward bias case and avalanche model critical fields for the reverse bias condition. Using the calibrated parameters and other nominal material properties, we simulated the radiation responses of the p-i-n diode and compared with experimental data when the diode was exposed to X-ray radiation at Sandia's Saturn facility and the Idaho State University (ISU) TriMeV facility. For Saturn's Gaussian dose-rate pulses, we show three findings from TCAD simulations. First, the simulated photocurrents are in excellent agreement with the measured data for two dose-rate pulses with peak values of 1.16 times 10 -{10} and 1.88 times 10 -{10} rad(Si)/s. Second, the simulation results of high dose-rate pulses predict increased delayed photocurrents with longer time tails in the diode electrical responses due to excess carrier generation. Third, simulated peak values of diode radiation responses versus peak dose rates at different bias conditions provide useful guidance to determine the dose-rate range that the p-i-n diode can reliably detect in experiment. For TriMeV's non-Gaussian dose-rate pulse, our simulated diode response is in decent agreement with the measured data without further calibration. We also studied the effects of device geometry, recombination process, and dose-rate enhancement via TCAD simulations to understand the higher measured response in the time after the peak dose-rate radiation for the p-i-n diode exposed to TriMeV irradiation.

At the request of staff members from the Radiation Metrology Laboratory (RML), a series of Monte Carlo radiation transport calculations were performed using two different models of the detector geometry of the RMLs sulfur counting system. The fraction of electrons from each β-decay of ³²P in the sulfur pellet that enter the window of the sulfur counting system was calculated with both MCNP and ITS. In addition, the differential energy distributions of the electrons entering the counting system window were computed. There was significant agreement between the integral and differential quantities calculated by the two transport codes. Summary tables are for the integral efficiency values are found in the body of the report.

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ASTM Committee E10 on Nuclear Technology and Applications develops and maintains many standards that are relevant to the radiation metrology activities in Sandia National Laboratories' Radiation and Electrical Sciences Center. This is particularly true for the reactor facilities and Subcommittee E10.07 on Radiation Dosimetry for Radiation Effects on Materials and Devices. In the past decade, Subcommittee E10.07 has been making substantive changes to the standard widely used to assess radiation hardness to neutron effects in electronics, E722 – Standard Practice for Characterking Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics. ASTM Standard E722 describes the method that defines the 1-MeV silicon and the 1-MeV gallium arsenide equivalent fluence radiation damage metrics. An evaluation of the impact of changes to the shape of the 1-MeV silicon equivalent fluence radiation damage metric from the 1985 version (E722-85) to the most recent version (E722-19) is performed.

As a follow-up to results presented at the 16th International Symposium on Reactor Dosimetry, a new set of low energy photon filter box designs were evaluated for potential testing at the Gamma Irradiation Facility in Sandia National Laboratories' Technical Area V. The goal of this filter box design study is to produce the highest fidelity gamma ray test environment for electronic parts. Using Monte Carlo coupled photon/electron transport, approximately a dozen different designs were evaluated for the effectiveness in reducing the dose enhancement in a silicon sensor. The completion of this study provides the Radiation Metrology Laboratory staff with a starting point for experimental test plans that could lead to improvement in the gamma ray test environment at the Gamma Irradiation Facility.

A set of coupled electron/photon radiation transport calculations were performed on optimized Ta / C converters due to questions about previous work at Sandia National Laboratories by Halbleib and Sanford. Generally, the results of the previous calculations were confirmed. However, new relationships between the incident electron beam energy and the average energy of a bremsstrahlung x-ray spectrum for the converters have been defined for the incident electron energy range of 50 keV to 15 MeV as well as for the narrower range of 50 keV to 1 MeV. The relationships were developed by bracketing the results of radiation transport calculations rather than by a rigorous mathematical fit to the data. Additional data such as the total x-ray or the energy spectra of the x-ray fluence exiting the Ta / C converters are available upon request.

The measurement of photon dose in pure gamma-ray and mixed (neutron/ gamma) field environments relies heavily on calibration of thermoluminescent dosimeters (TLDs) in cobalt-60 (Co-60) gamma irradiation environments. One of the principal means of reducing the gamma dose measurement uncertainty in Sandia National Laboratories' reactor environments is careful calibration of the CaF2:Mn TLDs used in the test environment. One issue that arises is that Co-60 gamma fields used for calibration universally have a low energy photon component. The scattered photons that make up the low energy photon component are a principal source of measurement error for the TLD calibration. ASTM E1249, Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources, describes a method that utilizes photon spectrum filter boxes to enclose devices under test that can reduce the measurement error during TLD calibration as well as during normal radiation testing of electronic components in the gamma field. Using a silicon sensor representative of a CMOS-7 technology, a series of calculations was performed for single-layer, two-layer, and three-layer filters to identify a filter box that improves the silicon dose-to-kerma ratio (that is, the filter reduces the low energy photon component in the Co-60 radiation field) in the sensor over the current filter box design. The results of the parameter study in this paper will be used to plan experimental studies in the Co-60 gamma fields used for calibration.

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Unsuccessful attempts by members of the radiation effects community to independently derive the Norgett-Robinson-Torrens (NRT) damage energy factors for silicon in ASTM standard E722-14 led to an investigation of the software coding and data that produced those damage energy factors. The ad hoc collaboration to discover the reason for lack of agreement revealed a coding error and resulted in a report documenting the methodology to produce the response function for the standard. The recommended changes in the NRT damage energy factors for silicon are shown to have significant impact for a narrow energy region of the 1-MeV(Si) equivalent fluence response function. However, when evaluating integral metrics over all neutrons energies in various spectra important to the SNL electronics testing community, the change in the response results in a small decrease in the total 1- MeV(Si) equivalent fluence of ~0.6% compared to the E722-14 response. Response functions based on the newly recommended NRT damage energy factors have been produced and are available for users of both the NuGET and MCNP codes.

The Annular Core Research Reactor (ACRR) at Sandia National Laboratories (SNL) is an epithermal pool-type research reactor licensed up to a thermal power of 2.4 MW. The ACRR facility has a neutron radiography facility that is used for imaging a wide range of items including reactor fuel and neutron generators. The ACRR neutron radiography system has four apertures (65:1, 125:1, 250:1, and 500:1) available to experimenters. The neutron flux and spectrum as well as the gamma dose rate were characterized at the imaging plane for the ACRR's neutron radiography system for the 65:1, 125:1 and 250:1 apertures.

The Nuclear Criticality Safety Program at Sandia National Laboratories has developed a suite of benchmark problems to be utilized for validation of MCNP6 Version 1.0 with ENDF/B-VII Release 1 cross sections. The benchmark suite covers a broad range of fissile material types, material forms, moderators, reflectors, and neutron energy spectra. It is anticipated that this benchmark suite will cover the vast majority of critical safety applications at SNL. The benchmark suite establishes a Bias and Bias Uncertainty for use in criticality safety analyses. In addition, the Bias and Bias Uncertainty value derived from the benchmark suite using the traditional SNL NCS methodology is demonstrated to be equivalent to the more robust statistical techniques used at many DOE sites.

A code for generating MCNP material cards (MatMCNP) has been written and verified for naturally occurring, stable isotopes. The program allows for material specification as either atomic or weight percent (fractions). MatMCNP also permits the specification of enriched lithium, boron, and/or uranium. In addition to producing the material cards for MCNP, the code calculates the atomic (or number) density in atoms/barn-cm as well as the multiplier that should be used to convert neutron and gamma fluences into dose in the material specified.

The impact of recent changes to the ASTM Standard E722 is investigated. The methodological changes in the production of the displacement kerma factors for silicon has significant impact for some energy regions of the 1-MeV(Si) equivalent fluence response function. When evaluating the integral over all neutrons energies in various spectra important to the SNL electronics testing community, the change in the response results in an increase in the total 1-MeV(Si) equivalent fluence of 2 7%. Response functions have been produced and are available for users of both the NuGET and MCNP codes.

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Sandia National Laboratories (SNL) has embarked on a program to develop a methodology to use damage relations techniques (alternative experimental facilities, modeling, and simulation) to understand the time-dependent effects in transistors (and integrated circuits) caused by neutron irradiations in the Sandia Pulse Reactor-III (SPR-III) facility. The development of these damage equivalence techniques is necessary since SPR-III was shutdown in late 2006. As part of this effort, the late time {gamma}-ray sensitivity of a single diffusion lot of 2N2222A transistors has been characterized using one of the {sup 60}Co irradiation cells at the SNL Gamma Irradiation Facility (GIF). This report summarizes the results of the experiments performed at the GIF.

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