Overview and status of EMI Measurement and Characterization on the Z-Machine Ritter, Brian; Fein, Jeffrey R.; Dunham, G.S.; Jones, Michael; Macphee, Andrew; Frick, Shannon; Miller, Toby; Palmer, Nathan Abstract not provided. More Details TYPE Conference Presentation YEAR 2022 DOIOSTI
Overview and status of X-Ray Streak Camera design and implementation on the Z-Machine Miller, Toby; Baker, Jacob; Ball, Chris; Carpenter, Arthur; Dunham, G.S.; Frick, Shannon; Fein, Jeffrey R.; Gard, Paul D.; Grim, Gary; Hansen, Aaron; Jones, Michael; Lechien, Keith; Larkin, Glen; Macphee, Andrew G.; Palmer, Nathan; Ritter, Brian; Spencer, Decker; Wu, Ming Abstract not provided. More Details TYPE Conference Poster YEAR 2022 DOIOSTI
Overview and status of EMI Measurement and Characterization on the Z-Machine Ritter, Brian; Fein, Jeffrey R.; Dunham, G.S.; Jones, Michael; Mcphee, Andrew; Frick, Shannon; Miller, Toby; Palmer, Nathan Abstract not provided. More Details TYPE Conference Poster YEAR 2022 OSTI
Overview and status of EMI Measurement and Characterization on the Z-Machine Ritter, Brian; Fein, Jeffrey R.; Dunham, G.S.; Jones, Michael; Macphee, Andrew; Miller, Toby; Palmer, Nathan Abstract not provided. More Details TYPE Conference Presentation YEAR 2022 OSTI
High-resolution imaging of warm x-ray sources with a Wolter optic on the Z Machine Fein, Jeffrey R.; Ampleford, David J.; Vogel, J.K.; Kozioziemski, B.; Walton, C.C.; Wu, Ming; Ayers, J.; Ball, Christopher R.; Romaine, S.; Bell, Perry; Bourdon, Christopher; Bradley, Dalton A.; Bruni, R.; Gard, Paul D.; Highstrete, Clark; Kilaru, K.; Lake, Patrick; Maurer, Andrew J.; Pickworth, L.A.; Pivovaroff, M.; Ramsey, B.; Ritter, Brian; Seals, Kathryn; Sethares, L. Abstract not provided. More Details TYPE Conference Presentation YEAR 2020 DOIOSTI