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Inference and uncertainty propagation of atomistically informed continuum constitutive laws, part 2: Generalized continuum models based on Gaussian processes

International Journal for Uncertainty Quantification

Salloum, Maher S.; Templeton, Jeremy A.

Constitutive models in nanoscience and engineering often poorly represent the physics due to significant deviations in model form from their macroscale counterparts. In Part 1 of this study, this problem was explored by considering a continuum scale heat conduction constitutive law inferred directly from molecular dynamics (MD) simulations. In contrast, this work uses Bayesian inference based on the MD data to construct a Gaussian process emulator of the heat flux as a function of temperature and temperature gradient. No assumption of Fourier-like behavior is made, requiring alternative approaches to assess the well-posedness and accuracy of the emulator. Validation is provided by comparing continuum scale predictions using the emulator model against a larger all-MD simulation representing the true solution. The results show that a Gaussian process emulator of the heat conduction constitutive law produces an empirically unbiased prediction of the continuum scale temperature field for a variety of time scales, which was not observed when Fourier’s law is assumed to hold. Finally, uncertainty is propagated in the continuum model and quantified in the temperature field so the impact of errors in the model on continuum quantities can be determined.

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Theoretical and experimental studies of electrified interfaces relevant to energy storage

Hayden, Carl C.; Templeton, Jeremy A.; Jones, Reese E.; Kliewer, Christopher J.; Sasaki, Darryl Y.; Reyes, Karla R.

Advances in technology for electrochemical energy storage require increased understanding of electrolyte/electrode interfaces, including the electric double layer structure, and processes involved in charging of the interface, and the incorporation of this understanding into quantitative models. Simplified models such as Helmholtz's electric double-layer (EDL) concept don't account for the molecular nature of ion distributions, solvents, and electrode surfaces and therefore cannot be used in predictive, high-fidelity simulations for device design. This report presents theoretical results from models that explicitly include the molecular nature of the electrical double layer and predict critical electrochemical quantities such as interfacial capacitance. It also describes development of experimental tools for probing molecular properties of electrochemical interfaces through optical spectroscopy. These optical experimental methods are designed to test our new theoretical models that provide descriptions of the electric double layer in unprecedented detail.

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Polarization as a field variable from molecular dynamics simulations

Journal of Chemical Physics

Mandadapu, Kranthi K.; Templeton, Jeremy A.; Lee, Jonathan L.

A theoretical and computational framework for systematically calculating the macroscopic polarization density as a field variable from molecular dynamics simulations is presented. This is done by extending the celebrated Irving and Kirkwood [J. Chem. Phys. 18, 817 (1950)10.1063/1.1747782] procedure, which expresses macroscopic stresses and heat fluxes in terms of the atomic variables, to the case of electrostatics. The resultant macroscopic polarization density contains molecular dipole, quadrupole, and higher-order moments, and can be calculated to a desired accuracy depending on the degree of the coarse-graining function used to connect the molecular and continuum scales. The theoretical and computational framework is verified by recovering the dielectric constant of bulk water. Finally, the theory is applied to calculate the spatial variation of the polarization vector in the electrical double layer of a 1:1 electrolyte solution. Here, an intermediate asymptotic length scale is revealed in a specific region, which validates the application of mean field Poisson-Boltzmann theory to describe this region. Also, using the existence of this asymptotic length scale, the lengths of the diffuse and condensed/Stern layers are identified accurately, demonstrating that this framework may be used to characterize electrical double layers over a wide range of concentrations of solutions and surface charges. © 2013 AIP Publishing LLC.

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Computational solution verification applied to a thermal model of a ruggedized instrumentation package

WIT Transactions on Modelling and Simulation

Scott, S.N.; Templeton, Jeremy A.; Ruthruff, Joseph R.; Hough, Patricia D.; Peterson, Jerrod P.

This paper details a methodology for quantification of errors and uncertainties of a finite element heat transfer model applied to a Ruggedized Instrumentation Package (RIP). The proposed verification process includes solution verification, which examines the errors associated with the code's solution techniques. The model was subjected to mesh resolution and numerical parameters sensitivity studies to determine reasonable parameter values and to understand how they change the overall model response and performance criteria. To facilitate quantification of the uncertainty associated with the mesh, automatic meshing and mesh refining/coarsening algorithms were created and implemented on the complex geometry of the RIP. Similarly, highly automated software to vary model inputs was also developed for the purpose of assessing the solution's sensitivity to numerical parameters. The model was subjected to mesh resolution and numerical parameters sensitivity studies. This process not only tests the robustness of the numerical parameters, but also allows for the optimization of robustness and numerical error with computation time. Agglomeration of these studies provides a bound for the uncertainty due to numerical error for the model. An emphasis is placed on the automation of solution verification to allow a rigorous look at uncertainty to be performed even within a tight design and development schedule. © 2013 WIT Press.

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Computational solution verification applied to a thermal model of a ruggedized instrumentation package

WIT Transactions on Modelling and Simulation

Scott, Sarah N.; Templeton, Jeremy A.; Ruthruff, Joseph R.; Hough, Patricia D.; Peterson, Jerrod P.

This paper details a methodology for quantification of errors and uncertainties of a finite element heat transfer model applied to a Ruggedized Instrumentation Package (RIP). The proposed verification process includes solution verification, which examines the errors associated with the code's solution techniques. The model was subjected to mesh resolution and numerical parameters sensitivity studies to determine reasonable parameter values and to understand how they change the overall model response and performance criteria. To facilitate quantification of the uncertainty associated with the mesh, automatic meshing and mesh refining/coarsening algorithms were created and implemented on the complex geometry of the RIP. Similarly, highly automated software to vary model inputs was also developed for the purpose of assessing the solution's sensitivity to numerical parameters. The model was subjected to mesh resolution and numerical parameters sensitivity studies. This process not only tests the robustness of the numerical parameters, but also allows for the optimization of robustness and numerical error with computation time. Agglomeration of these studies provides a bound for the uncertainty due to numerical error for the model. An emphasis is placed on the automation of solution verification to allow a rigorous look at uncertainty to be performed even within a tight design and development schedule. © 2013 WIT Press.

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Results 51–75 of 96
Results 51–75 of 96