Search results
Jump to search filters
Nagayama, Taisuke; Bailey, James E.; Rochau, G.A.; Hansen, Stephanie B.; Loisel, Guillaume P.
Bailey, James E.
Review of Scientific Instruments
Gomez, Matthew R.; Rochau, G.A.; Bailey, James E.; Dunham, G.S.; Kernaghan, Matthew D.; Gard, P.; Robertson, G.K.; Owen, A.C.; Argo, Jeffrey W.; Nielsen, D.S.; Lake, Patrick
The pinned optically aligned diagnostic dock (PODD) is a multi-configuration diagnostic platform designed to measure x-ray emission on the Z facility. The PODD houses two plasma emission acquisition (PEA) systems, which are aligned with a set of precision machined pins. The PEA systems are modular, allowing a single diagnostic housing to support several different diagnostics. The PEA configurations fielded to date include both time-resolved and time-integrated, 1D spatially resolving, elliptical crystal spectrometers, and time-integrated, 1D spatially resolving, convex crystal spectrometers. Additional proposed configurations include time-resolved, monochromatic mirrored pinhole imagers and arrays of filtered x-ray diodes, diamond photo-conducting diode detectors, and bolometers. The versatility of the PODD system will allow the diagnostic configuration of the Z facility to be changed without significantly adding to the turn-around time of the machine. Additionally, the PODD has been designed to allow instrument setup to be completed entirely off-line, leaving only a refined alignment process to be performed just prior to a shot, which is a significant improvement over the instrument the PODD replaces. Example data collected with the PODD are presented. © 2012 American Institute of Physics.
Cuneo, Michael E.; Jones, Michael; Edens, Aaron; Lopez, Mike R.; Mcbride, Ryan; Rochau, G.A.; Jones, Brent M.; Ampleford, David J.; Sinars, Daniel; Bailey, James E.; Stygar, William A.; Savage, Mark E.
Ampleford, David J.; Hansen, Stephanie B.; Jennings, Christopher A.; Jones, Brent M.; Rochau, G.A.; Bailey, James E.; Laspe, Amy R.; Savage, Mark E.; Cuneo, Michael E.
Ao, Tommy; Bailey, James E.; Hansen, Stephanie B.; Desjarlais, Michael P.; Geissel, Matthias; Smith, Ian C.; Sinars, Daniel; Lemke, Raymond W.
Bailey, James E.; Ao, Tommy; Harding, Eric H.; Hansen, Stephanie B.; Desjarlais, Michael P.; Lemke, Raymond W.; Rochau, G.A.; Reneker, Joseph; Romero, Dustin H.
Loisel, Guillaume P.; Rochau, Gary E.; Bailey, James E.; Hansen, Stephanie B.; Ball, Christopher R.; Dunham, G.S.; Nagayama, Taisuke
Bailey, James E.
Z-Pinch Plasmas: 5th Special Issue of the iEEE Transactions on Plasma Science
Coverdale, Christine A.; Bailey, James E.; Rochau, G.A.; Jones, Brent M.; Savage, Mark E.
Ao, Tommy; Harding, Eric H.; Bailey, James E.; Sinars, Daniel; Hansen, Stephanie B.; Desjarlais, Michael P.; Lemke, Raymond W.; Geissel, Matthias; Smith, Ian C.
Gomez, Matthew R.; Lake, Patrick; Rochau, G.A.; Bailey, James E.; Dunham, G.S.; Kernaghan, Matthew D.; Robertson, G.K.; Owen, Albert C.; Argo, Jeffrey W.; Nielsen, D.S.
Rochau, G.A.; Bailey, James E.; Ao, Tommy; Harding, Eric H.
Ao, Tommy; Bailey, James E.; Hansen, Stephanie B.; Desjarlais, Michael P.; Sinars, Daniel; Smith, Ian C.
Proposed for publication in 5th Special Issue of the IEEE Transactions on Plasma Science Z-Pinch Plasmas.
Cuneo, Michael E.; Mazarakis, Michael G.; Lamppa, Derek C.; Kaye, Ronald J.; Nakhleh, Charles; Bailey, James E.; Hansen, Stephanie B.; Mcbride, Ryan; Herrmann, Mark H.; Lopez, Andrew J.; Peterson, K.J.; Ampleford, David J.; Jones, Michael; Savage, Mark E.; Jennings, Christopher A.; Martin, Matthew R.; Slutz, Stephen A.; Lemke, Raymond W.; Christenson, Peggy J.; Sweeney, Mary A.; Jones, Brent M.; Yu, Edmund; Mcpherson, Leroy A.; Harding, Eric H.; Knapp, P.F.; Gomez, Matthew R.; Awe, Thomas J.; Stygar, William A.; Leeper, Ramon J.; Ruiz, Carlos L.; Chandler, Gordon A.; Mckenney, John; Owen, Albert C.; Mckee, G.R.; Matzen, M.K.; Leifeste, Gordon T.; Atherton, B.; Vesey, Roger A.; Smith, Ian C.; Geissel, Matthias; Rambo, Patrick K.; Sinars, Daniel; Sefkow, Adam B.; Rovang, Dean C.; Rochau, G.A.
Bailey, James E.
Bailey, James E.; Loisel, Guillaume P.; Rochau, G.A.; Dunham, G.S.; Ball, Christopher R.
Ao, Tommy; Harding, Eric H.; Bailey, James E.; Sinars, Daniel; Desjarlais, Michael P.; Hansen, Stephanie B.; Lemke, Raymond W.; Smith, Ian C.
Bailey, James E.
Cuneo, Michael E.; Jones, Michael; Edens, Aaron; Lopez, Mike R.; Mcbride, Ryan; Rochau, G.A.; Jones, Brent M.; Ampleford, David J.; Sinars, Daniel; Bailey, James E.; Stygar, William A.; Savage, Mark E.
Ao, Tommy; Bailey, James E.; Hansen, Stephanie B.; Desjarlais, Michael P.; Mix, L.P.; Smith, Ian C.; Sinars, Daniel
Bailey, James E.
Cuneo, Michael E.; Savage, Mark E.; Jones, Michael; Edens, Aaron; Lopez, Mike R.; Gomez, Matthew R.; Mcbride, Ryan; Rochau, G.A.; Jones, Brent M.; Ampleford, David J.; Sinars, Daniel; Bailey, James E.; Stygar, William A.
Cuneo, Michael E.; Jones, Michael; Edens, Aaron; Lopez, Mike R.; Mcbride, Ryan; Rochau, G.A.; Jones, Brent M.; Ampleford, David J.; Sinars, Daniel; Bailey, James E.; Stygar, William A.; Savage, Mark E.
Ao, Tommy; Wenger, D.F.; Bailey, James E.; Desjarlais, Michael P.; Hansen, Stephanie B.; Knudson, Marcus D.; Lemke, Raymond W.; Mix, L.P.; Sinars, Daniel; Smith, Ian C.
Results 126–150 of 230