Layout Dependence of Total Ionizing Dose Effects on 12-nm Bulk FinFET Digital Structures Wallace, Trace; Spear, M.; Privat, A.; Neuendank, J.; Irumva, G.; Wilson, Donald E.; Esqueda, I.S.; Barnaby, H.J.; Turowski, M.; Mikkola, E.; Gutierrez, Amos; Hughart, David R.; Marinella, Matthew; Vonniederhausern, R.; Holloway, S.; Beltran, D. Abstract not provided. More Details TYPE Conference Presentation YEAR 2022 DOIOSTI
Single Event Upset and Total Ionizing Dose Response of 12LP FinFET Digital Circuits Spear, Matthew; Wallace, Trace; Wilson, Donald E.; Solano, Jose; Irumva, Gedeon; Esqueda, Ivan S.; Barnaby, Hugh J.; Clark, Lawrence; Brunhaver, John; Turowski, Marek; Mikkola, Esko; Hughart, David R.; Young, Joshua M.; Manuel, Jack; Agarwal, Sapan; Vaandrager, Bastiaan L.; Vizkelethy, Gyorgy; Gutierrez, Amos; Trippe, James; King, Michael P.; Bielejec, Edward S.; Marinella, Matthew Abstract not provided. More Details TYPE Conference Poster YEAR 2022 DOIOSTI