Publications Details

Identifying process-structure-property correlations related to the development of stress in metal thin films by high-throughput characterization and simulation-based methods

Kalaswad, Matias; Shrivastava, Ankit; Desai, Saaketh D.; Custer, Joyce O.; Khan, Ryan M.; Addamane, Sadhvikas J.; Monti, Joseph M.; Fowler, James E.; Rodriguez, Mark A.; Delrio, F.W.; Kotula, Paul G.; D'Elia, Marta; Najm, Habib N.; Dingreville, Remi; Boyce, Brad L.; Adams, David P.

Abstract not provided.