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Sharma, Peter A.; Blea, Mia A.; Mckenzie, Bonnie; Edney, Cynthia; Medlin, Douglas L.; Nishimoto, Ryan K.; Ihlefeld, Jon F.
Sinclair, Michael B.; Peters, David; Brener, Igal; Clem, Paul; Ihlefeld, Jon F.; Basilio, Lorena I.; Warne, Larry K.; Wendt, Joel R.; Stevens, Jeffrey; Miller, Shannon M.
Brennecka, Geoff; Ihlefeld, Jon F.; George, Matthew C.
Rasberry, Roger D.; Arrington, Christian L.; Clem, Paul; Ihlefeld, Jon F.; Brumbach, Michael T.; Peters, David; Sinclair, Michael B.; Dirk, Shawn M.
Basilio, Lorena I.; Brener, Igal; Burckel, David B.; Shaner, Eric A.; Wendt, Joel R.; Luk, Ting S.; Ellis, A.R.; Bender, Daniel A.; Clem, Paul; Rasberry, Roger D.; Langston, William L.; Ihlefeld, Jon F.; Dirk, Shawn M.; Warne, Larry K.; Peters, David; El-Kady, Ihab F.; Reinke, Charles M.; Loui, Hung; Williams, Jeffery T.; Sinclair, Michael B.; Mccormick, Frederick B.
Journal of the Electrochemical Society
Small, Leo; Cook, Adam; Apblett, Christopher A.; Ihlefeld, Jon F.; Brennecka, Geoff; Duquette, David
An electrochemical probe station (EPS) for automated electrochemical testing of electronic-grade thin films is presented. Similar in design to a scanning droplet cell, this modular system features a flexible probe tip capable of contacting both metallic and oxide surfaces. Using the highly sensitive Pt-H 2SO 4 system, it is demonstrated that the EPS obtains results equivalent to those of a traditional electrochemical cell. Further, electrical testing of thin film PbZr 0.52Ti 0.48O 3 shows that this system may be used to ascertain fundamental electrical properties of dielectric films. © 2012 The Electrochemical Society.
Ihlefeld, Jon F.
Ihlefeld, Jon F.
Brener, Igal; Clem, Paul; Ihlefeld, Jon F.; Basilio, Lorena I.; Warne, Larry K.; Wendt, Joel R.; Stevens, Jeffrey; Miller, Shannon M.; Peters, David
Duda, John C.; Hattar, Khalid M.; Piekos, Edward S.; Medlin, Douglas L.; Ihlefeld, Jon F.
Journal of Materials Research
Rodriguez, Marko A.; Garino, Terry J.; Edney, Cynthia; Ihlefeld, Jon F.; Lu, Ping
Meyer, Kelsey M.; Brown-Shaklee, Harlan J.; Shahin, David S.; Ihlefeld, Jon F.; Brennecka, Geoff
Brennecka, Geoff; Ihlefeld, Jon F.; Apblett, Christopher A.; Small, Leo J.
Ihlefeld, Jon F.; Brennecka, Geoff; Meyer, Kelsey M.
Advanced Materials
Ihlefeld, Jon F.; Clem, Paul; Doyle, B.L.; Kotula, Paul G.; Fenton, Kyle R.; Apblett, Christopher A.
By utilizing an equilibrium processing strategy that enables co-firing of oxides and base metals, a means to integrate the lithium-stable fast lithium-ion conductor lanthanum lithium tantalate directly with a thin copper foil current collector appropriate for a solid-state battery is presented. This resulting thin-film electrolyte possesses a room temperature lithium-ion conductivity of 1.5 × 10 -5 S cm -1, which has the potential to increase the power of a solid-state battery over current state of the art. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Ihlefeld, Jon F.; Brown-Shaklee, Harlan J.; Hopkins, Patrick E.
Ihlefeld, Jon F.; Brennecka, Geoff; Kotula, Paul G.
Brener, Igal; Sinclair, Michael B.; Clem, Paul; Ihlefeld, Jon F.; Stevens, Jeffrey; Wendt, Joel R.; Peters, David; Warne, Larry K.; Basilio, Lorena I.
Sinclair, Michael B.; Brener, Igal; Peters, David; Stevens, Jeffrey; Wendt, Joel R.; Basilio, Lorena I.; Warne, Larry K.; Clem, Paul; Ihlefeld, Jon F.
Ihlefeld, Jon F.; Atcitty, Stanley
Meyer, Kelsey M.; Kotula, Paul G.; Brennecka, Geoff; Ihlefeld, Jon F.
Brennecka, Geoff; Ihlefeld, Jon F.
Apblett, Christopher A.; Ihlefeld, Jon F.
Ihlefeld, Jon F.; Kotula, Paul G.; Brennecka, Geoff; Meyer, Kelsey M.
Brennecka, Geoff; Meyer, Kelsey M.; Shahin, David S.; Brown-Shaklee, Harlan J.; Ihlefeld, Jon F.
Results 151–175 of 204