A molecular-scale interpretation of interfacial processes is often downplayed in the analysis of traditional water treatment methods. However, such an approach is critical for the development of enhanced performance in traditional desalination and water treatments. Water confined between surfaces, within channels, or in pores is ubiquitous in technology and nature. Its physical and chemical properties in such environments are unpredictably different from bulk water. As a result, advances in water desalination and purification methods may be accomplished through an improved analysis of water behavior in these challenging environments using state-of-the-art microscopy, spectroscopy, experimental, and computational methods.
This report describes activities conducted in FY07 to mature the MEMS passive shock sensor. The first chapter of the report provides motivation and background on activities that are described in detail in later chapters. The second chapter discusses concepts that are important for integrating the MEMS passive shock sensor into a system. Following these two introductory chapters, the report details modeling and design efforts, packaging, failure analysis and testing and validation. At the end of FY07, the MEMS passive shock sensor was at TRL 4.
Low solid interfacial energy and fractally rough surface topography confer to Lotus plants superhydrophobic (SH) properties like high contact angles, rolling and bouncing of liquid droplets, and self-cleaning of particle contaminants. This project exploits the porous fractal structure of a novel, synthetic SH surface for aerosol collection, its self-cleaning properties for particle concentration, and its slippery nature 3 to enhance the performance of fluidic and MEMS devices. We propose to understand fundamentally the conditions needed to cause liquid droplets to roll rather than flow/slide on a surface and how this %22rolling transition%22 influences the boundary condition describing fluid flow in a pipe or micro-channel. Rolling of droplets is important for aerosol collection strategies because it allows trapped particles to be concentrated and transported in liquid droplets with no need for a pre-defined/micromachined fluidic architecture. The fluid/solid boundary condition is important because it governs flow resistance and rheology and establishes the fluid velocity profile. Although many research groups are exploring SH surfaces, our team is the first to unambiguously determine their effects on fluid flow and rheology. SH surfaces could impact all future SNL designs of collectors, fluidic devices, MEMS, and NEMS. Interfaced with inertial focusing aerosol collectors, SH surfaces would allow size-specific particle populations to be collected, concentrated, and transported to a fluidic interface without loss. In microfluidic systems, we expect to reduce the energy/power required to pump fluids and actuate MEMS. Plug-like (rather than parabolic) velocity profiles can greatly improve resolution of chip-based separations and enable unprecedented control of concentration profiles and residence times in fluidic-based micro-reactors. Patterned SH/hydrophilic channels could induce mixing in microchannels and enable development of microflow control elements. Acknowledgements This work was funded by Sandia National Laboratory's Laboratory Directed Research & Development program (LDRD). Some coating processes were conducted in the cleanroom facility located at the University of New Mexico's Center for High Technology Materials (CHTM). SEM images were performed at UNM's Center for Micro-Engineering on equipment funded by a NSF New Mexico EPSCoR grant. 4
A gecko's extraordinary ability to suspend itself from walls and ceilings of varied surface roughness has interested humans for hundreds of years. Many theories and possible explanations describing this phenomenon have been proposed including sticky secretions, microsuckers, and electrostatic forces; however, today it is widely accepted that van der Waals forces play the most important role in this type of dry adhesion. Inarguably, the vital feature that allows a gecko's suspension is the presence of billions 3 of tiny hairs on the pad of its foot called spatula. These features are small enough to reach within van der Waals distances of any surface (spatula radius %7E100 nm); thus, the combined effect of billions of van der Waals interactions is more than sufficient to hold a gecko's weight to surfaces such as smooth ceilings or wet glass. Two lithographic approaches were used to make hierarchal structures with dimensions similar to the gecko foot dimensions noted above. One approach combined photo-lithography with soft lithography (micro-molding). In this fabrication scheme the fiber feature size, defined by the alumina micromold was 0.2 um in diameter and 60 um in height. The second approach followed more conventional photolithography-based patterning. Patterned features with dimensions %7E0.3 mm in diameter by 0.5 mm tall were produced. We used interfacial force microscopy employing a parabolic diamond tip with a diameter of 200 nm to measure the surface adhesion of these structures. The measured adhesive forces ranged from 0.3 uN - 0.6 uN, yielding an average bonding stress between 50 N/cm2 to 100 N/cm2. By comparison the reported literature value for the average stress of a Tokay gecko foot is 10 N/cm2. Acknowledgements This work was funded by Sandia National Laboratory's Laboratory Directed Research & Development program (LDRD). All coating processes were conducted in the cleanroom facility located at the University of New Mexico's Center for High Technology Materials (CHTM). SEM images were performed at UNM's Center for Micro-Engineering on equipment funded by a NSF New Mexico EPSCoR grant. 4
Interfacial force microscopy (IFM) is used to measure the electrical contact properties of electroplated gold thin films of the type used in microelectromechanical system relays. Force and current levels consistent with those present in metal-metal contact switches are examined in an atmospheric-pressure, dry-nitrogen ambient at room temperature, and the nature of a nonmetallic contamination layer which limits contact resistance and lifetime is explicitly examined mechanically, electrically and chemically. The electrical and mechanical properties of the contamination layer on the gold substrate are observed by IFM both before and after being exposed to ozone for an extended period of time. The contamination film is characterized by x-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry, and found to consist mostly of hydrocarbons; the film remains relatively stable in both composition and thickness following ozonation. However, some subtle chemical changes in the contamination layer induced by the ozonation process are found to profoundly affect the electrical properties of the gold-gold contact, reducing the resistance by more than 3 orders of magnitude and considerably reducing variability in the contact resistance between contact events. These results clearly demonstrate the critical role both positive and negative of the latent contamination present on the contact surfaces.
The authors use force-probe microscopy to study the friction force and the adhesive interaction for molecular monolayer self-assembled on both Au probe tips and substrate surfaces. By systematically varying the chemical nature of the end groups on these monolayers the authors have, for the first time, delineated the mechanical and chemical origins of molecular-level friction. They use chemically inert {double_bond}CH{sub 3} groups on both interracial surfaces to establish the purely mechanical component of the friction and contrast the results with the findings for chemically active {double_bond}COOH end-groups. In addition, by using odd or even numbers of methylene groups in the alkyl backbones of the molecules they are able to determine the levels of inter-film and intra-film hydrogen bonding.
Interfacial Force Microscopy (IFM) is a scanning probe technique that employs a force-feedback sensor concept. This article discusses a few examples of IFM applications to polymer surfaces. Through these examples, the ability of IFM to obtain quantitative information on interfacial forces on a controllable manner is demonstrated.
Using interracial force microscopy (IFM), the tribological properties of self-assembled monolayer (SAM) on Si surfaces produced by a new chemical strategy are investigated and compared to those of classical SAM systems, which include alkanethiols on Au and alkylsilanes on SiO{sub x}. The new SAM films are prepared by depositing n-alkyl chains with OH-terminations onto Cl-terminated Si substrates. The chemical nature of the actual lubricating molecules, n-dodecyl, is kept constant in all three thin film systems for direct comparison and similarities and differences in tribological properties are observed. The adhesion strength is virtually identical for all three systems; however, frictional properties differ due to differences in film packing. Differences in the chemical bonds that attach the lubricant molecules to the substrate are also discussed as they influence variations in film wear and durability. It is demonstrated that the new SAM films are capable of controlling the friction and adhesion of Si surfaces as well as the classical SAMs in addition to providing a greater potential to be more reproducible and more durable.
The interfacial force microscope (IFM) was used to indent and image defect free Au(111) surfaces, providing atomic-scale observations of the onset of pileup and the excursion of material above the initial surface plane. Images and load-displacement measurements demonstrate that elastic accommodation of an indenter is followed by two stages of plasticity. The initial stage is identified by slight deviations of the load-displacement relationship from the predicted elastic response. Images acquired after indentations showing only this first stage indicate that these slight load relaxation events result in residual indentations 0.5 to 4 nm deep with no evidence of pileup or surface orientation dependence. The second stage of plasticity is marked by a series of dramatic load relaxation events and residual indentations tens of nanometers deep. Images acquired following this second stage document 0.25 nm pileup terraces which reflect the crystallography of the surface as well as the indenter geometry. Attempts to plastically displace the indenter 4-10 nanometers deep into the Au(111) surface were unsuccessful, demonstrating that the transition from stage I to stage H plasticity is associated with overcoming some sort of barrier. Stage I is consistent with previously reported models of dislocation nucleation. The dramatic load relaxations of stage II plasticity, and the pileup of material above the surface, require cross-slip and appear to reflect a dynamic process leading to dislocation intersection with the surface. The IFM measurements reported here offer new insights into the mechanisms underlying the very early stages of plasticity and the formation of pileup.
Using an interfacial force microscope, the measured elastic response of 100-nm-thick Au films was found to be strongly correlated with the films' stress state and thermal history. Large, reversible variations (2×) of indentation modulus were recorded as a function of applied stress. Low-temperature annealing caused permanent changes in the films' measured elastic properties. The measured elastic response was also found to vary in close proximity to grain boundaries in thin films and near surface steps on single-crystal surfaces. These results demonstrate a complex interdependence of stress state, defect structure, and elastic properties in thin metallic films.
A dependence of elastic response on the stress-state of a thin film has been demonstrated using the interfacial force microscope (IFM). Indentation response was measured as a function of the applied biaxial stress-state for 100 nm thick Au films. An increase in measured elastic modulus with applied compressive stress, and a decrease with applied tensile stress was observed. Measurements of elastic modulus before and after applying stress were identical indicating that the observed change in response is not due to a permanent change in film properties.
The research focuses on the measurement of the nanomechanical properties associated with the interphase region of a polymer matrix fiber composite with a nanometer resolution in chemically characterized model composites. The Interfacial Force Microscope (IFM) is employed to measure, with nanometer resolution, the mechanical properties of the interphase region of epoxy/glass fiber composites. The chemistry of the interphase is altered by the adsorption on to the fiber surface a coupling agent, 3-aminopropyltrimethoxy silane ({gamma}-APS) which is known to covalently bond to the glass fiber surface and the epoxy resin. Recent work utilizing FT-IR fiber optic evanescent wave spectroscopy provides a method for the characterization of the interphase chemistry. This technique has been used to investigate the interphase chemistry of epoxy/amine curing agent/amine-terminated organosilane coupling agent/silica optical fiber model composites. This body of work has shown that a substantial fraction of the amine of the organosilane-coupling agent does not participate in a reaction with the epoxy resin. This evidence suggests an interphase that will have mechanical properties significantly different than the bulk epoxy/amine matrix. Previous research has shown that drastic changes occur in the coupling agent chemistry, interphase chemistry, and composite mechanical properties as the amount of adsorbed coupling agent is varied over the industrially relevant range used in this work. A commercially available epoxy resin, EPON 828, and aliphatic amine-curing agent, EPI-CURE 3283, make up the polymer matrix in this study. The reinforcement is silica optical or E-glass fibers.
Interfacial adhesion is of extraordinary technological importance and has long been of intense scientific interest. However, the study of the adhesive bond and its failure is made difficult by the complexity of the interfacial interaction and the problems involved with establishing carefully characterized and controlled interfacial surfaces and that of quantitatively evaluating the bonding after its formation. In the present work, we outline the results of studies using Interfacial Force Microscopy (IFM) to study the adhesive bond formation and failure between (1) differing end-group combinations on self-assembling monolayer (SAM) films covering Au surfaces and (2) between clean surfaces of a W probe and a Au single-crystal sample. The IFM is a scanning probe technique distinguished by its use of a mechanically stable, zero-compliance force sensor. This sensor permits the study of the interfacial force as a function of separation without the mechanical instability giving rise to the {open_quotes}jump-to-contact{close_quotes} seen in all presently used displacement-based sensors, such as the surface forces apparatus and the atomic force microscope. Thus, information can be obtained concerning the details of the adhesive bond formation and failure over the entire range of the interfacial interaction. We demonstrate that such measurements yield valuable quantitative information concerning the individual bond strengths between chemically distinct SAM end groups and show that the clean metal-surface interaction is dominated by surface roughness and plastic deformation.
The capabilities of Interfacial Force Microscopy (IFM) are illustrated utilizing the following examples: the bonding interaction between chemically distinct end groups on self-assembling molecules adsorbed on the sample and and probe tip; and a study of the effect of morphological defects on the nanomechanical properties of gold single crystal surfaces.
The scanning force microscopies (notably the Atomic Force Microscope--AFM), because of their applicability to nearly all materials, are presently the most widely used of the scanning-probe techniques. However, the AFM uses a deflection sensor to measure sample/probe forces which suffers from an inherent mechanical instability that occurs when the rate of change of the force with respect to the interfacial separation becomes equal to the spring constant of the deflecting member. This instability dramatically limits the breadth of applicability of AFM-type techniques to materials problems. In the course of implementing a DOE sponsored basic research program in interfacial adhesion, a self-balancing force sensor concept has been developed and incorporated into an Interfacial Force Microscopy (IFM) system by Sandia scientists. This sensor eliminates the instability problem and greatly enhances the applicability of the scanning force-probe technique to a broader range of materials and materials parameters. The impact of this Sandia development was recognized in 1993 by a Department of Energy award for potential impact on DOE programs and by an R and D 100 award for one of the most important new products of 1994. However, in its present stage of development, the IFM is strictly a research-level tool and a CRADA was initiated in order to bring this sensor technology into wide-spread availability by making it accessible in the form of a commercial instrument. The present report described the goals, approach and results of this CRADA effort.
Stress in thin films plays a critical role in many technologically important areas. The role is a beneficial one in strained layer superlattices where semiconductor electrical and optical properties can be tailored with film stress. On the negative side, residual stress in thin-film interconnects in microelectronics can lead to cracking and delamination. In spite of their importance, however, surface and thin-film stresses are difficult to measure and control, especially on a local level. In recent studies, we used the Interfacial Force Microscope (IFM) in a nanoindenter mode to survey the nanomechanical properties of Au films grown on various substrates. Quantitative tabulations of the indentation modulus and the maximum shear stress at the plastic threshold showed consistent values over individual samples but a wide variation from substrate to substrate. These values were compared with film properties such as surface roughness, average grain size and interfacial adhesion and no correlation was found. However, in a subsequent analysis of the results, we found consistencies which support the integrity of the data and point to the fact that the results are sensitive to some property of the various film/substrate combinations. In recent measurements on two of the original substrate materials we found a direct correlation between the nanomechanical values and the residual stress in the films, as measured globally by a wafer warping technique. In the present paper, we review these earlier results and show recent measurements dealing with stresses externally applied to the films which supports our earlier conclusion concerning the role of stress on our measurements. In addition, we present very recent results concerning morphological effects on nanomechanical properties which add additional support to the suggestion that near-threshold indentation holds promise of being able to measure stress on a very local level.
In recent studies, we used the Interfacial Force Microscope in a nanoindenter mode to survey the nanomechanical properties of Au films grown on various substrates. Quantitative tabulations of the indentation modulus and the maximum shear stress at the plastic threshold showed consistent values over individual samples but a wide variation from substrate to substrate. These values were compared with film properties such as the surface roughness, average grain size and interfacial adhesion and no correlation was found. However, in a subsequent analysis of the results, we found consistencies which support the integrity of the data and point to the fact that the results are sensitive to some property of the various film/substrate combinations. In the present paper, we discuss these consistencies and show recent measurements which strongly suggest that the property that is being probed is the residual stress in the films caused by their interaction with the substrate surfaces.
This report summarizes research on the aging of Class I components in environments representative of nuclear power plants. It discusses Class IE equipment used in nuclear power plants, typical environments encountered by Class IE components, and aging techniques used to qualify this equipment. General discussions of radiation chemistry of polymers and accelerated aging techniques are also included. Based on the inadequacies of present aging techniques for Class IE equipment, a proposal for an experimental program on electrical cables is presented. One of the main purposes of the proposed work is to obtain relevant data in two areas of particular concern--the effect of radiation dose rate on polymer degradation, and the importance of synergism for combined thermal and radiation environments. A new model that allows combined environment accelerated aging to be carried out is introduced, and it is shown how the experimental data to be generated can be used to test this model.
