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Single Event Upset and Total Ionizing Dose Response of 12LP FinFET Digital Circuits

Spear, Matthew; Wallace, Trace; Wilson, Donald; Solano, Jose; Irumva, Gedeon; Esqueda, Ivan S.; Barnaby, Hugh J.; Clark, Lawrence T.; Brunhaver, John; Turowski, Marek; Mikkola, Esko; Hughart, David R.; Young, Joshua M.; Manuel, Jack E.; Agarwal, Sapan A.; Vaandrager, Bastiaan L.; Vizkelethy, Gyorgy V.; King, Michael P.; Marinella, Matthew J.

Abstract not provided.