Publications Details

Single Event Upset and Total Ionizing Dose Response of 12LP FinFET Digital Circuits

Spear, Matthew; Wallace, Trace; Wilson, Donald E.; Solano, Jose; Irumva, Gedeon; Esqueda, Ivan S.; Barnaby, Hugh J.; Clark, Lawrence; Brunhaver, John; Turowski, Marek; Mikkola, Esko; Hughart, David R.; Young, Joshua M.; Manuel, Jack; Agarwal, Sapan; Vaandrager, Bastiaan L.; Vizkelethy, Gyorgy; King, Michael P.; Marinella, Matthew

Abstract not provided.