Publications Details

Characterization of Novel Nanoscale Device Architectures using Current Mapping AFM

Howell, Stephen W.; Marinella, Matthew; Siegal, Michael P.; Friedman, Caitlin A.R.; Decker, Seth; Hughart, David R.; Yelton, W.G.; Foulk, James W.; Davids, Paul; Bogart, Gregory R.; Dirk, Shawn M.

Abstract not provided.