Total Ionizing Dose Effect Study on Radiation-Hard Power MOSFET Device Kerber, Pranita; Leeson, Kenneth M.; Gao, Xujiao; Musson, Lawrence C.; Campbell, Philip; Mclain, Michael; Paskaleva, Biliana S.; Mar, Alan Abstract not provided. More Details TYPE Conference Poster YEAR 2020 OSTI
Heavy Ion Displacement Damage Effects in 14nm-Process FinFETs Esposito, Madeline G.; Manuel, Jack; Bielejec, Edward S.; Dickerson, Jeramy; Kerber, Pranita; King, Michael P.; Talin, Albert A.; Ashby, David S.; Mclain, Michael; Marinella, Matthew Abstract not provided. More Details TYPE Conference Poster YEAR 2020 OSTI