Resolution Limits of Frequency Domain Thermoreflectance for Interconnect Damage in Heterogeneously Integrated Microsystems Hodges, Wyatt; Jarzembski, Amun; Herkenhoff, Brenden K.; Treweek, Benjamin; Mcdonald, Anthony; Jordan, Matthew; Walsh, Timothy; Pickrell, Gregory W. Abstract not provided. More Details TYPE Conference Presenation YEAR 2023 DOIOSTI
Determination of FDTR Lateral Resolution for Heterogeneously Integrated Micro Electronics Herkenhoff, Brenden K.; Hodges, Wyatt; Treweek, Benjamin; Jarzembski, Amun; Walsh, Timothy; Pickrell, Gregory W. Abstract not provided. More Details TYPE Conference Presenation YEAR 2022 DOIOSTI
Pushing the Spatial and Temporal Limits of Thermoreflectance Measurements Hodges, Wyatt; Jarzembski, Amun; Herkenhoff, Brenden K.; Treweek, Benjamin; Mcdonald, Anthony; Jordan, Matthew; Wilke, Rudeger; Walsh, Timothy; Clem, Paul; Pickrell, Gregory W. Abstract not provided. More Details TYPE Conference Presenation YEAR 2022 DOIOSTI
Determination of FDTR Lateral Resolution for Heterogeneously Integrated Micro Electronics Herkenhoff, Brenden K.; Hodges, Wyatt; Treweek, Benjamin; Jarzembski, Amun; Walsh, Timothy; Pickrell, Gregory W. Abstract not provided. More Details TYPE Conference Presenation YEAR 2022 DOIOSTI