Publications Details

X-ray Conversion Efficiencies for Diffraction Experiments on Z

Geissel, Matthias; Ao, Tommy; Fulford, Karin W.; Looker, Quinn M.; Rambo, Patrick K.; Seagle, Christopher T.; Shores, Jonathon; Speas, Robert J.; Yang, Chi; Porter, John L.

We have used a deep-depletion CCD camera in single-hit mode to measure X-ray conversion efficiencies with Z-Beamlet and Z-Petawatt. Z-Petawatt is superior to Z-Beamlet for X-rays harder than 10 keV. For diffraction samples with Z > 42, we likely require X-rays with 15 keV or higher photon energy (Z-Petawatt). We are developing a robust, reproducible setup for X-ray polycapillaries as a part for X-ray diffraction experiments (XRD).