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Surface Dynamics in p-InAs and n-GaAs Probed with Scanning Ultrafast Electron Microscopy (SUEM)

Perez, Christopher P.; Ellis, Scott; Laros, James H.; Fuller, Elliot J.; Michael, Joseph R.; Chandler, D.W.; Asheghi, Mehdi; Goodson, Kenneth E.; Talin, A.A.; Kumar, Suhas K.

Abstract not provided.