Publications Details
Reduction of Defects at or near ALD-Al2O3/GaN Interfaces for Improved Electrical Performance of GaN Power Devices
Glaser, Caleb E.; Rummel, Brian D.; Klesko, Joseph P.; Wygant, Melissa L.; Dickens, Peter T.; Binder, Andrew T.; Kaplar, Robert J.; Feezell, Daniel; Steinfeldt, Jeffrey A.
Abstract not provided.