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Radiation-Induced Resistance Changes in TaOx and TiO2 Memristors

Hughart, David R.; Lohn, Andrew J.; Mickel, Patrick R.; Dodd, Paul E.; Shaneyfelt, Marty R.; Bielejec, Edward S.; Vizkelethy, Gyorgy; Mclain, Michael; Marinella, Matthew

Abstract not provided.