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Publications / Conference Presenation

Progress in micron-scale field emission models based on nanoscale surface characterization for use in PIC-DSMC vacuum arc simulations

Moore, Christopher H.; Jindal, Ashish K.; Bussmann, Ezra B.; Ohta, Taisuke O.; Berg, Morgann B.; Thomas, Cherrelle T.; Clem, Paul G.; Hopkins, Matthew M.

Abstract not provided.