Publications Details

Evidence of Interface Trap Build-up Irradiated 14nm Bulk FinFET Technologies

Privat, A.; Barnaby, H.; Spear, M.; Esposito, Madeline G.; Manuel, Jack; Clark, Lawrence; Brunhaver, J.; Duvnjak, A.; Jokai, R.; Holbert, Keith E.; Mclain, Michael; Marinella, Matthew; King, Michael P.

Abstract not provided.