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Evidence of Interface Trap Build-up Irradiated 14nm Bulk FinFET Technologies

Privat, A.; Barnaby, H.; Spear, M.; Esposito, Madeline G.; Manuel, Jack E.; Clark, Lawrence T.; Brunhaver, J.; Duvnjak, A.; Jokai, R.; Holbert, K.E.; McLain, Michael L.; Marinella, Matthew J.; King, Michael P.

Abstract not provided.