Correlating percent in-package hydrogen to hydrogen concentration in oxide after ionizing radiation exposure Apsangi, P.; Roark, S.; Privat, A.; Hjalmarson, Harold P.; Barnaby, H.J.; Muthuseenu, K.; Holbert, K.E. Abstract not provided. More Details TYPE Conference Presenation YEAR 2022 DOIOSTI
Evidence of Interface trap build-up irradiated 14nm Bulk FinFET Technologies Privat, Aymeric; Barnaby, Hugh J.; Spear, Matthew; Esposito, Madeline G.; Manuel, Jack E.; Clark, Lawrence T.; Brunhaver, John S.; Duvnjak, Alan; Jokai, R.; Holbert, K.E.; McLain, Michael L.; Marinella, Matthew J.; King, Michael P. Abstract not provided. More Details TYPE Conference Paper YEAR 2020 OSTI
Evidence of Interface Trap Build-up Irradiated 14nm Bulk FinFET Technologies Privat, A.; Barnaby, H.; Spear, M.; Esposito, Madeline G.; Manuel, Jack E.; Clark, Lawrence T.; Brunhaver, J.; Duvnjak, A.; Jokai, R.; Holbert, K.E.; McLain, Michael L.; Marinella, Matthew J.; King, Michael P. Abstract not provided. More Details TYPE Conference Presenation YEAR 2020 DOIOSTI