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Evidence of Interface trap build-up irradiated 14nm Bulk FinFET Technologies

Privat, Aymeric; Barnaby, Hugh J.; Spear, Matthew; Esposito, Madeline G.; Manuel, Jack; Clark, Lawrence; Brunhaver, John S.; Duvnjak, Alan; Jokai, R.; Holbert, Keith E.; Mclain, Michael; Marinella, Matthew; King, Michael P.

Abstract not provided.