Publications Details

Displacement Damage and Ionization Effects in TaOx and TiO2 Memristors

Hughart, David R.; Marshall, Michael; Mclain, Michael; Marinella, Matthew; Lohn, Andrew J.; Mickel, Patrick R.; Dodd, Paul E.; Shaneyfelt, Marty R.; Silva, Antoinette I.; Bielejec, Edward S.

Abstract not provided.