Publications

Results 176–200 of 228

Search results

Jump to search filters

Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors

Review of Scientific Instruments

Dunham, Greg; Bailey, James E.; Rochau, G.A.; Lake, Patrick W.; Nielsen-Weber, L.B.

Plasma spectroscopy requires determination of spectral line intensities and widths. At Sandia National Laboratories Z facility we use elliptical crystal spectrometers equipped with gated microchannel plate detectors to record time and space resolved spectra. We collect a large volume of data typically consisting of five to six snapshots in time and five to ten spectral lines with 30 spatial elements per frame, totaling to more than 900 measurements per experiment. This large volume of data requires efficiency in processing. We have addressed this challenge by using a line fitting routine to automatically fit each spectrum using assumed line profiles and taking into account photoelectron statistics to efficiently extract line intensities and widths with uncertainties. We verified that the random data noise obeys Poisson statistics. Rescale factors for converting film exposure to effective counts required for understanding the photoelectron statistics are presented. An example of the application of these results to the analysis of spectra recorded in Z experiments is presented. © 2007 American Institute of Physics.

More Details

Twin-elliptical-crystal time- and space-resolved soft x-ray spectrometer

Review of Scientific Instruments

Lake, Patrick W.; Bailey, James E.; Rochau, G.A.; Gard, P.; Petmecky, D.; Bump, M.; Joseph, N.R.; Moore, T.C.; Nielsen-Weber, L.B.

Elliptical crystal spectrometers equipped with time-gated microchannel plate (MCP) detectors provide time-, space-, and spectrally resolved data. A common problem is that the number of time resolution elements is limited by the number of MCP frames. The number of frames that fit on a given MCP is limited by the image size and the alignment tolerance. At the Z facility these problems have been addressed with twin-elliptical-crystal spectrometers. Using two crystals and detectors doubles the number of frames available. This enables measurements with ∼350 ps time resolution while still recording data from an ∼4 ns wide time window. Alternatively, the twin crystal design allows simultaneous measurements with different crystals to investigate different spectral regimes. © 2006 American Institute of Physics.

More Details

Measurement and analysis of x-ray absorption in Al and MgF2 plasmas heated by Z-pinch radiation

Proposed for publication in Physical Review E.

Bailey, James E.

High-power Z pinches on Sandia National Laboratories Z facility can be used in a variety of experiments to radiatively heat samples placed some distance away from the Z-pinch plasma. In such experiments, the heating radiation spectrum is influenced by both the Z-pinch emission and the re-emission of radiation from the high-Z surfaces that make up the Z-pinch diode. To test the understanding of the amplitude and spectral distribution of the heating radiation, thin foils containing both Al and MgF{sub 2} were heated by a 100-130 TW Z pinch. The heating of these samples was studied through the ionization distribution in each material as measured by x-ray absorption spectra. The resulting plasma conditions are inferred from a least-squares comparison between the measured spectra and calculations of the Al and Mg 1s {yields} 2p absorption over a large range of temperatures and densities. These plasma conditions are then compared to radiation-hydrodynamics simulations of the sample dynamics and are found to agree within 1{sigma} to the best-fit conditions. This agreement indicates that both the driving radiation spectrum and the heating of the Al and MgF{sub 2} samples is understood within the accuracy of the spectroscopic method.

More Details
Results 176–200 of 228
Results 176–200 of 228