Understanding the age of semiconductor parts being built into devices and systems is of interest for manufacturing quality control. Power spectrum analysis (PSA) is a fast, non-destructive, sensitive method for examining semiconductor parts. This talk will cover the use of multivariate analysis on both PSA data and conventional current-voltage data generated prior to PSA analysis to create algorithms that can be automated to screen semiconductor parts for aging.
Power spectrum analysis (PSA) is a fast, non-destructive, sensitive method for examining commercial off-the-shelf ( COTS ) electronic components. These features make PSA attractive for both component screening and surveillance in support of component reliability efforts. Current analysis methods limit the utility of PSA due to the need to manually examine the results of analysis to identify anomalous parts. This study demonstrates the development and application of a workflow to automate the screening of COTS electronic components. Further, this study demonstrates the use of multivariate algorithms to assess aging of Zener diodes. These workflows can be readily extended to other components, combining the benefits of PSA and multivariate analysis to screen and evaluate COTS electronic components.
