Publications Details

Automated Algorithms for Screening Electronic Parts for Aging using Power Spectra Analysis (PSA) Data

Multari, Rosalie A.; Dejong, Stephanie; Carnali, Abigail E.; Christiansen, Joel T.; Carilli, Kelsey M.

Understanding the age of semiconductor parts being built into devices and systems is of interest for manufacturing quality control. Power spectrum analysis (PSA) is a fast, non-destructive, sensitive method for examining semiconductor parts. This talk will cover the use of multivariate analysis on both PSA data and conventional current-voltage data generated prior to PSA analysis to create algorithms that can be automated to screen semiconductor parts for aging.