Risk-informed Metrics for Cybersecurity Yang, Lynn I.; Nachtigal, Noel M.; Derosa, Sean; Gordon, Susanna P.; Hingorani, Sheryl L.; Imbro, Dennis R.; Teclemariam, Nerayo P.; Todd, Margaret; Tucker, Mark D.; Wyss, Gregory D.; Ewing, Eric; Kane, Samuel S. Abstract not provided. More Details TYPE Presentation YEAR 2017 OSTI
Ephemeral Biometrics Choe, Yung R.; Choi, Sung N.; Bierma, Michael; Todd, Margaret; Bigg, Jeffrey; Narayanan, Shrinithi; Gandhi, Vansh Abstract not provided. More Details TYPE Presentation YEAR 2014 OSTI