Publications Details

Total ionizing dose and single event effects on 12-nm bulk FinFETs

Wilson, Donald; Spear, Matthew; Wallace, Trace; Irumva, Gedon; Neuendank, Jermoe; Sanchez, Ivan; Barnaby, Hugh; Privat, A.; Turowski, Marek; Mikkola, Esko; Hughart, David R.; Manuel, Jack E.; Vizkelethy, Gyorgy V.; King, Michael P.; Marinella, Matthew

Abstract not provided.