Publications Details

Total ionizing dose and single event effects on 12-nm bulk FinFETs

Wilson, Donald E.; Spear, Matthew; Wallace, Trace; Irumva, Gedon; Neuendank, Jermoe; Sanchez, Ivan; Barnaby, Hugh; Privat, A.; Turowski, Marek; Mikkola, Esko; Hughart, David R.; Manuel, Jack; Vizkelethy, Gyorgy; King, Michael P.; Marinella, Matthew

Abstract not provided.