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Shocking a transparent semiconducting oxide to 15 Mbar: Z experiments and EOS modeling

Foulk, James W.; Crockett, Scott; Sjostrom, T.; Townsend, Joshua P.; Weck, Philippe F.; Banasek, Jacob T.; Bliss, David E.; Hanshaw, Heath L.; Cochrane, Kyle; Farfan, Bernardo G.; Alexander, Charles S.; Knudson, Marcus D.; Seagle, Christopher T.

Abstract not provided.