Publications

Publications / Conference Poster

Prediction and Validation of Residual Stress and Distortion Across Processes and Length Scales

Johnson, Kyle J.; Reu, Phillip L.; Farias, Paul A.; Moser, Daniel M.; Jared, Bradley H.; Whetten, Shaun R.; Chen, Mark J.; Aquino, Wilkins A.; Walsh, Timothy W.; Bishop, Joseph E.

Abstract not provided.