Publications Details

Multiscale Modeling of Single Event-Induced Faults in FinFET-based Processors

Cannon, Matthew J.; Rodrigues, Arun; Black, Dolores A.; Black, Jeffrey D.; Bustamante, Luis; Feinberg, Benjamin; Clark, Larry; Brunhaver, John; Barnaby, Hugh; Agarwal, Sapan; Marinella, Matthew

Abstract not provided.